{"id":"https://openalex.org/W4308089794","doi":"https://doi.org/10.1109/esscirc55480.2022.9911379","title":"An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications","display_name":"An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4308089794","doi":"https://doi.org/10.1109/esscirc55480.2022.9911379"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc55480.2022.9911379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911379","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074818437","display_name":"Marcella Carissimi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"M. Carissimi","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002025362","display_name":"C. Auricchio","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Auricchio","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045595331","display_name":"E. Calvetti","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Calvetti","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063985187","display_name":"L. Capecchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Capecchi","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073265013","display_name":"Mattia Luigi Torres","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Torres","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051308125","display_name":"S. Zanchi","orcid":"https://orcid.org/0000-0002-9750-2255"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. Zanchi","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084229134","display_name":"Puneet Gupta","orcid":"https://orcid.org/0000-0002-6188-1134"},"institutions":[{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P. Gupta","raw_affiliation_strings":["STMicroelectronics,Greater Noida,India","STMicroelectronics, Greater Noida, India"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Greater Noida,India","institution_ids":["https://openalex.org/I4210094169"]},{"raw_affiliation_string":"STMicroelectronics, Greater Noida, India","institution_ids":["https://openalex.org/I4210094169"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065446466","display_name":"R. Zurla","orcid":"https://orcid.org/0000-0002-4315-1269"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. Zurla","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060646203","display_name":"A. Cabrini","orcid":"https://orcid.org/0000-0003-1862-2409"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Cabrini","raw_affiliation_strings":["University of Pavia,Pavia,Italy","University of Pavia, Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Pavia,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"University of Pavia, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013457678","display_name":"D. Gallinari","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Gallinari","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091119795","display_name":"F. Disegni","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Disegni","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060219430","display_name":"Massimo Borghi","orcid":"https://orcid.org/0000-0003-4137-0852"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Borghi","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108596904","display_name":"E. Palumbo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Palumbo","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072146941","display_name":"Andrea Redaelli","orcid":"https://orcid.org/0000-0002-9690-5052"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Redaelli","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091318325","display_name":"M. Pasotti","orcid":"https://orcid.org/0000-0003-4988-9982"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Pasotti","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,Italy","STMicroelectronics, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":15,"corresponding_author_ids":["https://openalex.org/A5074818437"],"corresponding_institution_ids":["https://openalex.org/I4210154781"],"apc_list":null,"apc_paid":null,"fwci":3.581,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.94614809,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10306","display_name":"Liquid Crystal Research Advancements","score":0.9866999983787537,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-change-memory","display_name":"Phase-change memory","score":0.7209917306900024},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6958182454109192},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6043856739997864},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5209518671035767},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5175973176956177},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.5051310658454895},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46314334869384766},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.4370356798171997},{"id":"https://openalex.org/keywords/temperature-cycling","display_name":"Temperature cycling","score":0.4360734224319458},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4360727071762085},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42699185013771057},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3858572840690613},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3635041117668152},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3581167161464691},{"id":"https://openalex.org/keywords/phase-change","display_name":"Phase change","score":0.3471812605857849},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3369542360305786},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24723589420318604},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.125833660364151},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0821542739868164}],"concepts":[{"id":"https://openalex.org/C64142963","wikidata":"https://www.wikidata.org/wiki/Q1153902","display_name":"Phase-change memory","level":3,"score":0.7209917306900024},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6958182454109192},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6043856739997864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5209518671035767},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5175973176956177},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.5051310658454895},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46314334869384766},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4370356798171997},{"id":"https://openalex.org/C177564732","wikidata":"https://www.wikidata.org/wiki/Q7698333","display_name":"Temperature cycling","level":3,"score":0.4360734224319458},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4360727071762085},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42699185013771057},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3858572840690613},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3635041117668152},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3581167161464691},{"id":"https://openalex.org/C133256868","wikidata":"https://www.wikidata.org/wiki/Q7180940","display_name":"Phase change","level":2,"score":0.3471812605857849},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3369542360305786},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24723589420318604},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.125833660364151},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0821542739868164},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc55480.2022.9911379","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911379","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2021608436","https://openalex.org/W2770724147","https://openalex.org/W2794194363","https://openalex.org/W2912017376","https://openalex.org/W2922523256","https://openalex.org/W2943713917","https://openalex.org/W2951269110","https://openalex.org/W2965200383","https://openalex.org/W2982156254"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2116394329","https://openalex.org/W3012473220","https://openalex.org/W2601440513","https://openalex.org/W2549730073","https://openalex.org/W1992148151","https://openalex.org/W2128406803","https://openalex.org/W2075934899","https://openalex.org/W3038595053","https://openalex.org/W2056527258"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,58,87,127],"temperature-robust":[4],"embedded":[5],"Phase-Change":[6],"Memory":[7],"(ePCM)":[8],"with":[9,49],"high":[10],"cycling":[11],"capability":[12],"able":[13],"to":[14,40,47,53,69,85,106,115],"meet":[15],"all":[16],"the":[17,22,28,50,71,91,118,133],"stringent":[18],"specifications":[19],"coming":[20],"from":[21],"automotive":[23],"environment":[24],"and,":[25],"more":[26],"specifically,":[27],"used":[29],"phase-change":[30],"material":[31],"(based":[32],"on":[33],"Ge-rich":[34],"GST":[35],"alloy)":[36],"has":[37,112],"been":[38,113],"tuned":[39],"fit":[41],"power":[42,121],"ICs":[43],"constraints.":[44],"In":[45],"order,":[46],"cope":[48],"\u221240":[51],"\u00b0C":[52,55],"175":[54],"operation":[56,102],"requirements,":[57],"temperature-compensated":[59],"write":[60],"algorithm":[61],"was":[62,103],"conceived":[63],"and":[64],"specific":[65],"circuits":[66],"were":[67],"added":[68],"render":[70],"statistical":[72],"distribution":[73],"of":[74,90],"programming":[75],"pulses":[76],"equal":[77],"at":[78],"any":[79],"temperature":[80,135],"as":[81],"it":[82],"is":[83],"required":[84],"obtain":[86],"uniform":[88],"ageing":[89],"cells":[92],"thus":[93],"ensuring":[94],"an":[95,107],"higher":[96],"reliability":[97],"after":[98],"100k":[99],"cycling.":[100],"Programming":[101],"optimized":[104],"thanks":[105],"improved":[108],"program":[109],"load":[110],"that":[111],"designed":[114],"compensate":[116],"for":[117],"expected":[119],"large":[120],"supply":[122],"variations.":[123],"Experimental":[124],"characterization":[125],"demonstrated":[126],"16":[128],"ns":[129],"access":[130],"time":[131],"over":[132],"whole":[134],"range.":[136]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}