{"id":"https://openalex.org/W4308089884","doi":"https://doi.org/10.1109/esscirc55480.2022.9911363","title":"GeSn-on-Si Avalanche Photodiodes for Short-Wave Infrared Detection","display_name":"GeSn-on-Si Avalanche Photodiodes for Short-Wave Infrared Detection","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4308089884","doi":"https://doi.org/10.1109/esscirc55480.2022.9911363"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc55480.2022.9911363","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911363","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078048833","display_name":"Maurice Wanitzek","orcid":"https://orcid.org/0000-0002-9706-5227"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Maurice Wanitzek","raw_affiliation_strings":["Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035421149","display_name":"Michael Oehme","orcid":"https://orcid.org/0000-0002-1637-1338"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Michael Oehme","raw_affiliation_strings":["Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056645793","display_name":"Christian Spieth","orcid":"https://orcid.org/0009-0002-4923-1339"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Spieth","raw_affiliation_strings":["Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007604744","display_name":"Daniel Schwarz","orcid":"https://orcid.org/0000-0003-2702-4697"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Daniel Schwarz","raw_affiliation_strings":["Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010588778","display_name":"Lukas Seidel","orcid":"https://orcid.org/0000-0002-9147-7300"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Lukas Seidel","raw_affiliation_strings":["Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart,Stuttgart,Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Semiconductor Engineering, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080290215","display_name":"J\u00f6rg Schulze","orcid":"https://orcid.org/0000-0003-3621-7888"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Schulze","raw_affiliation_strings":["Friedrich-Alexander-University, Erlangen-Nuremberg,Chair of Electron Devices,Erlangen,Germany","Chair of Electron Devices, Friedrich-Alexander-University, Erlangen-Nuremberg, Erlangen, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Friedrich-Alexander-University, Erlangen-Nuremberg,Chair of Electron Devices,Erlangen,Germany","institution_ids":["https://openalex.org/I181369854"]},{"raw_affiliation_string":"Chair of Electron Devices, Friedrich-Alexander-University, Erlangen-Nuremberg, Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.9137,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.86498221,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"169","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10767","display_name":"Advanced Photonic Communication Systems","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.8078228831291199},{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.5563390851020813},{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.5425889492034912},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5226554870605469},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5107243061065674},{"id":"https://openalex.org/keywords/absorption","display_name":"Absorption (acoustics)","score":0.4922150671482086},{"id":"https://openalex.org/keywords/molecular-beam-epitaxy","display_name":"Molecular beam epitaxy","score":0.4817045331001282},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4710421860218048},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.46492648124694824},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.4265121817588806},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3682097792625427},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.3393380641937256},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33218517899513245},{"id":"https://openalex.org/keywords/epitaxy","display_name":"Epitaxy","score":0.32957544922828674},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2930424213409424},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.23487162590026855},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.20187869668006897},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.17309102416038513},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.13695937395095825}],"concepts":[{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.8078228831291199},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.5563390851020813},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.5425889492034912},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5226554870605469},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5107243061065674},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.4922150671482086},{"id":"https://openalex.org/C3792809","wikidata":"https://www.wikidata.org/wiki/Q898542","display_name":"Molecular beam epitaxy","level":4,"score":0.4817045331001282},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4710421860218048},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.46492648124694824},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.4265121817588806},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3682097792625427},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.3393380641937256},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33218517899513245},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.32957544922828674},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2930424213409424},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.23487162590026855},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.20187869668006897},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17309102416038513},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.13695937395095825},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc55480.2022.9911363","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911363","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321114","display_name":"Bundesministerium f\u00fcr Bildung und Forschung","ror":"https://ror.org/04pz7b180"},{"id":"https://openalex.org/F4320323031","display_name":"\u00d6sterreichische Forschungsf\u00f6rderungsgesellschaft","ror":"https://ror.org/028jc0449"},{"id":"https://openalex.org/F4320328501","display_name":"Business Finland","ror":"https://ror.org/05bgf9v38"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1486585911","https://openalex.org/W1613229453","https://openalex.org/W1969260924","https://openalex.org/W1984034460","https://openalex.org/W2055730933","https://openalex.org/W2092688076","https://openalex.org/W2321937004","https://openalex.org/W2903742197","https://openalex.org/W2919203897","https://openalex.org/W3095747343","https://openalex.org/W3175907972","https://openalex.org/W6642427631"],"related_works":["https://openalex.org/W4367676917","https://openalex.org/W2371692126","https://openalex.org/W2592416155","https://openalex.org/W2330272753","https://openalex.org/W3150347925","https://openalex.org/W2978010793","https://openalex.org/W2335509959","https://openalex.org/W2085640266","https://openalex.org/W2781769039","https://openalex.org/W4387019742"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"report":[4],"the":[5,65,69],"growth,":[6],"fabrication,":[7],"and":[8,60],"characterization":[9],"of":[10,18,40,74],"GeSn-on-Si":[11],"Avalanche":[12],"Photodiodes":[13],"with":[14],"a":[15,36,55,72],"Sn":[16,27,66],"concentration":[17],"up":[19],"to":[20],"2.2%.":[21],"The":[22],"Ge":[23],"<inf":[24,28],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[25,29],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1-x</inf>":[26],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">x</inf>":[30],"absorption":[31,70],"layer":[32],"was":[33],"grown":[34],"at":[35],"very":[37],"low":[38,50],"temperature":[39],"200\u00b0C":[41],"by":[42,54,64],"using":[43],"molecular":[44],"beam":[45],"epitaxy.":[46],"We":[47],"show":[48],"record":[49],"dark":[51],"currents":[52],"limited":[53],"perimeter":[56],"leakage":[57],"path,":[58],"only":[59],"therefore":[61],"not":[62],"influenced":[63],"concentration,":[67],"while":[68],"for":[71],"wavelength":[73],"1,550":[75],"nm":[76],"increases":[77],"significantly.":[78]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}
