{"id":"https://openalex.org/W4308089764","doi":"https://doi.org/10.1109/esscirc55480.2022.9911331","title":"A 183F<sup>2</sup> Gate Leakage-Based Physically Unclonable Function With Area Efficient Current Tilting-Based Masking Scheme","display_name":"A 183F<sup>2</sup> Gate Leakage-Based Physically Unclonable Function With Area Efficient Current Tilting-Based Masking Scheme","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4308089764","doi":"https://doi.org/10.1109/esscirc55480.2022.9911331"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc55480.2022.9911331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911331","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066370358","display_name":"Beomsoo Park","orcid":"https://orcid.org/0000-0002-1842-0324"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]},{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I4210111675","display_name":"Market Matters","ror":"https://ror.org/021yan307","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210111675"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Beomsoo Park","raw_affiliation_strings":["Univesity of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA","Department of Electrical and Computer Engineering, Univesity of Florida, Gainesville, FL, USA","Qualcomm Inc., San Diego, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univesity of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Univesity of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"Qualcomm Inc., San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596","https://openalex.org/I4210111675"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071432833","display_name":"Nima Maghari","orcid":"https://orcid.org/0000-0002-9168-5142"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nima Maghari","raw_affiliation_strings":["Univesity of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA","Department of Electrical and Computer Engineering, Univesity of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univesity of Florida,Department of Electrical and Computer Engineering,Gainesville,FL,USA","institution_ids":["https://openalex.org/I33213144"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Univesity of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6401,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58634538,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"517","last_page":"520"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6323919296264648},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.5885581970214844},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.5318859219551086},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.494870126247406},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.483277827501297},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.48156026005744934},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4427717924118042},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40171828866004944},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3809202015399933},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.32897916436195374},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2930092215538025},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2675524055957794},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.1783437728881836}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6323919296264648},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.5885581970214844},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.5318859219551086},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.494870126247406},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.483277827501297},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.48156026005744934},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4427717924118042},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40171828866004944},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3809202015399933},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.32897916436195374},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2930092215538025},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2675524055957794},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.1783437728881836},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc55480.2022.9911331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911331","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1984863066","https://openalex.org/W2890844360","https://openalex.org/W2977427408","https://openalex.org/W2999571526","https://openalex.org/W3015792011","https://openalex.org/W3033257916","https://openalex.org/W3133994200","https://openalex.org/W6775827921"],"related_works":["https://openalex.org/W4386278306","https://openalex.org/W2594513438","https://openalex.org/W2010558539","https://openalex.org/W2580259249","https://openalex.org/W3096667951","https://openalex.org/W3038784943","https://openalex.org/W4288068867","https://openalex.org/W102880045","https://openalex.org/W4205934107","https://openalex.org/W3116259561"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,57,84,103,131],"gate":[4,77],"leakage-based":[5],"physically":[6],"unclonable":[7],"function":[8],"(PUF)":[9],"with":[10,56,129],"an":[11],"area":[12,82],"efficient":[13],"current":[14],"tilting-based":[15],"masking":[16,28,142],"scheme":[17,29],"to":[18,50,124,147],"enhance":[19],"the":[20,33,36,39,46,52,60,90,99,138,149],"overall":[21,53],"bit":[22],"error":[23],"rate":[24],"(BER).":[25],"The":[26,80,120],"implemented":[27],"only":[30],"requires":[31],"checking":[32],"validity":[34],"of":[35,108,116,137,144,151,159],"PUF":[37,62,86,101,139],"at":[38,113,126],"nominal":[40,114,127],"condition":[41,115,128],"and":[42,64,72,106,110,118,156,161],"is":[43,93,122],"embedded":[44],"within":[45],"readout":[47],"circuit":[48],"enabling":[49],"minimize":[51],"area.":[54],"Designed":[55],"65nm":[58],"process,":[59],"unit":[61,85],"size":[63],"core":[65],"energy":[66],"are":[67],"183F":[68],"<sup":[69],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[70],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[71],"0.014fJ/bit":[73],"as":[74],"it":[75],"leverages":[76],"leakage":[78],"current.":[79],"total":[81],"per":[83],"cell":[87],"considering":[88],"all":[89],"peripheral":[91],"circuits":[92],"927F2.":[94],"Experimental":[95],"results":[96],"show":[97],"that":[98,134],"prototype":[100],"achieves":[102],"native":[104],"instability":[105],"BER":[107,121,150],"6.89%":[109],"O.77%,":[111],"respectively,":[112],"1.2V":[117],"27\u00b0C.":[119],"improved":[123],"0%":[125,152],"even":[130],"small":[132],"tilt":[133],"masks":[135],"17.3%":[136],"bits.":[140],"A":[141],"ratio":[143],"41.8%":[145],"allows":[146],"maintain":[148],"across":[153],"supply":[154],"voltage":[155],"temperature":[157],"range":[158],"0.9V~l.5V":[160],"0~100\u00b0C,":[162],"respectively.":[163]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}