{"id":"https://openalex.org/W4308089902","doi":"https://doi.org/10.1109/esscirc55480.2022.9911223","title":"Thermal switching of $\\text{TiO}_{2}$ -based RRAM for parameter extraction and neuromorphic engineering","display_name":"Thermal switching of $\\text{TiO}_{2}$ -based RRAM for parameter extraction and neuromorphic engineering","publication_year":2022,"publication_date":"2022-09-19","ids":{"openalex":"https://openalex.org/W4308089902","doi":"https://doi.org/10.1109/esscirc55480.2022.9911223"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc55480.2022.9911223","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911223","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048113496","display_name":"Alessandro Milozzi","orcid":"https://orcid.org/0000-0001-5207-1984"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Milozzi","raw_affiliation_strings":["Informazione e Bioingegneria (DEIB) - Politecnico di Milano,Dipartimento di Elettronica,Milan,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB) - Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria (DEIB) - Politecnico di Milano,Dipartimento di Elettronica,Milan,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB) - Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011211727","display_name":"Daniel Reiser","orcid":"https://orcid.org/0000-0003-0212-259X"},"institutions":[{"id":"https://openalex.org/I4210128143","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","ror":"https://ror.org/02hm5m482","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210128143","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Daniel Reiser","raw_affiliation_strings":["Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","Molecular Electronics, Technical University of Munich, Garching, Germany","Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","institution_ids":["https://openalex.org/I4210128143"]},{"raw_affiliation_string":"Molecular Electronics, Technical University of Munich, Garching, Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany","institution_ids":["https://openalex.org/I4210128143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073137038","display_name":"A. Drost","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128143","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","ror":"https://ror.org/02hm5m482","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210128143","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Andreas Drost","raw_affiliation_strings":["Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","institution_ids":["https://openalex.org/I4210128143"]},{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany","institution_ids":["https://openalex.org/I4210128143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019175443","display_name":"Thomas Neuner","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128143","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","ror":"https://ror.org/02hm5m482","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210128143","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Neuner","raw_affiliation_strings":["Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","Molecular Electronics, Technical University of Munich, Garching, Germany","Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","institution_ids":["https://openalex.org/I4210128143"]},{"raw_affiliation_string":"Molecular Electronics, Technical University of Munich, Garching, Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany","institution_ids":["https://openalex.org/I4210128143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024026014","display_name":"Marc Tornow","orcid":"https://orcid.org/0000-0002-1860-2769"},"institutions":[{"id":"https://openalex.org/I4210128143","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","ror":"https://ror.org/02hm5m482","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210128143","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marc Tornow","raw_affiliation_strings":["Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany","Molecular Electronics, Technical University of Munich, Garching, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies,Munich,Germany","institution_ids":["https://openalex.org/I4210128143"]},{"raw_affiliation_string":"Fraunhofer EMFT Research Institution for Microsystems and Solid State Technologies, Munich, Germany","institution_ids":["https://openalex.org/I4210128143"]},{"raw_affiliation_string":"Molecular Electronics, Technical University of Munich, Garching, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054173368","display_name":"Daniele Ielmini","orcid":"https://orcid.org/0000-0002-1853-1614"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniele Ielmini","raw_affiliation_strings":["Informazione e Bioingegneria (DEIB) - Politecnico di Milano,Dipartimento di Elettronica,Milan,Italy","Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB) - Politecnico di Milano, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Informazione e Bioingegneria (DEIB) - Politecnico di Milano,Dipartimento di Elettronica,Milan,Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB) - Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3189,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.42375869,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"133","last_page":"136"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.925011157989502},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.9230687618255615},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5523614287376404},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4350839853286743},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4053032398223877},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3283272981643677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2958054840564728},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2133299708366394},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17494988441467285},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15422353148460388}],"concepts":[{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.925011157989502},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.9230687618255615},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5523614287376404},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4350839853286743},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4053032398223877},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3283272981643677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2958054840564728},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2133299708366394},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17494988441467285},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15422353148460388}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/esscirc55480.2022.9911223","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc55480.2022.9911223","pdf_url":null,"source":{"id":"https://openalex.org/S4363608323","display_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},{"id":"pmh:oai:mediatum.ub.tum.de:node/1700832","is_oa":false,"landing_page_url":"https://mediatum.ub.tum.de/1700832","pdf_url":null,"source":{"id":"https://openalex.org/S4377196330","display_name":"mediaTUM  (Technical University of Munich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I62916508","host_organization_name":"Technical University of Munich","host_organization_lineage":["https://openalex.org/I62916508"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"ConferencePaper"},{"id":"pmh:oai:publica.fraunhofer.de:publica/430330","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/430330","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"},{"id":"pmh:oai:re.public.polimi.it:11311/1230757","is_oa":false,"landing_page_url":"https://hdl.handle.net/11311/1230757","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2294891029","display_name":null,"funder_award_id":"16FMD01K,16FMD02,16FMD03","funder_id":"https://openalex.org/F4320321114","funder_display_name":"Bundesministerium f\u00fcr Bildung und Forschung"}],"funders":[{"id":"https://openalex.org/F4320321114","display_name":"Bundesministerium f\u00fcr Bildung und Forschung","ror":"https://ror.org/04pz7b180"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W629699711","https://openalex.org/W1980284740","https://openalex.org/W2051133151","https://openalex.org/W2171679246","https://openalex.org/W2398563917","https://openalex.org/W2793167577","https://openalex.org/W2805362231","https://openalex.org/W2970401101","https://openalex.org/W4301129364"],"related_works":["https://openalex.org/W2790329865","https://openalex.org/W4296001819","https://openalex.org/W1714462329","https://openalex.org/W4200603977","https://openalex.org/W2891417865","https://openalex.org/W3196047262","https://openalex.org/W3013866331","https://openalex.org/W2277480487","https://openalex.org/W2951280857","https://openalex.org/W2605257365"],"abstract_inverted_index":{"Recently,":[0],"resistive":[1],"switching":[2,25,56,65,89],"random":[3],"access":[4],"memory":[5,13],"(RRAM)":[6],"has":[7],"gained":[8],"maturity":[9],"for":[10,40,46,76,93,101,106],"storage":[11],"class":[12],"and":[14,33,85],"in-memory":[15],"computing.":[16,48,108],"For":[17],"these":[18],"applications,":[19],"an":[20],"improved":[21],"control":[22],"of":[23,54],"the":[24,38,73],"phenomena":[26],"can":[27],"lead":[28],"to":[29],"higher":[30],"data":[31],"density":[32],"computing":[34],"accuracy,":[35],"thus":[36],"paving":[37],"way":[39],"RRAM-based":[41],"artificial":[42],"intelligence":[43],"(AI)":[44],"accelerators":[45],"edge":[47],"This":[49],"work":[50],"presents":[51],"a":[52,91],"study":[53],"thermally-induced":[55],"in":[57,79,96],"<tex":[58,80],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[59,81],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\text{TiO}_{2}$</tex>":[60,82],"-based":[61],"RRAM":[62],"devices.":[63],"Thermal":[64],"is":[66],"explained":[67],"by":[68,72],"defect":[69,77],"rediffusion":[70],"controlled":[71],"activation":[74],"energy":[75],"migration":[78],".":[83],"Experiments":[84],"simulations":[86],"support":[87],"thermal":[88],"as":[90,98,100],"tool":[92],"parameter":[94],"extraction":[95],"RRAM,":[97],"well":[99],"novel":[102],"neuromorphic":[103],"cognitive":[104],"functions":[105],"brain-inspired":[107]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2022-11-08T00:00:00"}