{"id":"https://openalex.org/W3210461213","doi":"https://doi.org/10.1109/esscirc53450.2021.9567752","title":"A readout circuit for tunnel magnetoresistive sensors employing an ultra-low-noise current source","display_name":"A readout circuit for tunnel magnetoresistive sensors employing an ultra-low-noise current source","publication_year":2021,"publication_date":"2021-09-13","ids":{"openalex":"https://openalex.org/W3210461213","doi":"https://doi.org/10.1109/esscirc53450.2021.9567752","mag":"3210461213"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc53450.2021.9567752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc53450.2021.9567752","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://eprints.gla.ac.uk/view/author/33887.html>","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036246948","display_name":"Ayman Mohamed","orcid":"https://orcid.org/0000-0003-3838-5340"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I4210113675","display_name":"Center for Integrated Quantum Science and Technology","ror":"https://ror.org/01z25am55","country_code":"DE","type":"facility","lineage":["https://openalex.org/I100066346","https://openalex.org/I149899117","https://openalex.org/I196349391","https://openalex.org/I4210088365","https://openalex.org/I4210113675"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Ayman Khattab","raw_affiliation_strings":["Institute of Smart Sensors, University of Stuttgart,Stuttgart,Germany,D-70569","Institute of Smart Sensors, University of Stuttgart, Stuttgart, Germany","Center for Integrated Quantum Science and Technology (IQST), Stuttgart and Ulm, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Smart Sensors, University of Stuttgart,Stuttgart,Germany,D-70569","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Institute of Smart Sensors, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Center for Integrated Quantum Science and Technology (IQST), Stuttgart and Ulm, Germany","institution_ids":["https://openalex.org/I4210113675"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100700922","display_name":"Hadi Heidari","orcid":"https://orcid.org/0000-0001-8412-8164"},"institutions":[{"id":"https://openalex.org/I7882870","display_name":"University of Glasgow","ror":"https://ror.org/00vtgdb53","country_code":"GB","type":"education","lineage":["https://openalex.org/I7882870"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Hadi Heidari","raw_affiliation_strings":["Microelectronics Lab (meLAB), School of Engineering, University of Glasgow,Glasgow,UK","Microelectronics Lab (meLAB), School of Engineering, University of Glasgow, Glasgow, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Lab (meLAB), School of Engineering, University of Glasgow,Glasgow,UK","institution_ids":["https://openalex.org/I7882870"]},{"raw_affiliation_string":"Microelectronics Lab (meLAB), School of Engineering, University of Glasgow, Glasgow, UK","institution_ids":["https://openalex.org/I7882870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052708751","display_name":"Jens Anders","orcid":"https://orcid.org/0000-0002-2498-0352"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},{"id":"https://openalex.org/I4210113675","display_name":"Center for Integrated Quantum Science and Technology","ror":"https://ror.org/01z25am55","country_code":"DE","type":"facility","lineage":["https://openalex.org/I100066346","https://openalex.org/I149899117","https://openalex.org/I196349391","https://openalex.org/I4210088365","https://openalex.org/I4210113675"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jens Anders","raw_affiliation_strings":["Institute of Smart Sensors, University of Stuttgart,Stuttgart,Germany,D-70569","Center for Integrated Quantum Science and Technology (IQST), Stuttgart and Ulm, Germany","Institute of Smart Sensors, University of Stuttgart, Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Smart Sensors, University of Stuttgart,Stuttgart,Germany,D-70569","institution_ids":["https://openalex.org/I100066346"]},{"raw_affiliation_string":"Center for Integrated Quantum Science and Technology (IQST), Stuttgart and Ulm, Germany","institution_ids":["https://openalex.org/I4210113675"]},{"raw_affiliation_string":"Institute of Smart Sensors, University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036246948"],"corresponding_institution_ids":["https://openalex.org/I100066346","https://openalex.org/I4210113675"],"apc_list":null,"apc_paid":null,"fwci":0.5084,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.65091478,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"331","last_page":"334"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.702134907245636},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.6430718898773193},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6350148916244507},{"id":"https://openalex.org/keywords/microsystem","display_name":"Microsystem","score":0.5213671922683716},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5203725695610046},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.48816829919815063},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45757102966308594},{"id":"https://openalex.org/keywords/noise-floor","display_name":"Noise floor","score":0.4553717374801636},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4441993236541748},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.4399644732475281},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.428832471370697},{"id":"https://openalex.org/keywords/magnetoresistance","display_name":"Magnetoresistance","score":0.4274536669254303},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4074961841106415},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.3335059881210327},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32816118001937866},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31627607345581055},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.31483709812164307},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.19571056962013245},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.17869329452514648},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.15761137008666992},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.15031886100769043},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.09599128365516663},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.07710611820220947}],"concepts":[{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.702134907245636},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.6430718898773193},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6350148916244507},{"id":"https://openalex.org/C151054161","wikidata":"https://www.wikidata.org/wiki/Q379385","display_name":"Microsystem","level":2,"score":0.5213671922683716},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5203725695610046},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.48816829919815063},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45757102966308594},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.4553717374801636},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4441993236541748},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.4399644732475281},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.428832471370697},{"id":"https://openalex.org/C117958382","wikidata":"https://www.wikidata.org/wiki/Q58347","display_name":"Magnetoresistance","level":3,"score":0.4274536669254303},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4074961841106415},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.3335059881210327},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32816118001937866},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31627607345581055},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.31483709812164307},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.19571056962013245},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.17869329452514648},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.15761137008666992},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.15031886100769043},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.09599128365516663},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07710611820220947},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/esscirc53450.2021.9567752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc53450.2021.9567752","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},{"id":"pmh:oai:eprints.gla.ac.uk:243385","is_oa":true,"landing_page_url":"https://eprints.gla.ac.uk/view/author/33887.html>","pdf_url":null,"source":{"id":"https://openalex.org/S4210235606","display_name":"ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam)","issn_l":"2622-8912","issn":["2622-8912","2622-8920"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":{"id":"pmh:oai:eprints.gla.ac.uk:243385","is_oa":true,"landing_page_url":"https://eprints.gla.ac.uk/view/author/33887.html>","pdf_url":null,"source":{"id":"https://openalex.org/S4210235606","display_name":"ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam)","issn_l":"2622-8912","issn":["2622-8912","2622-8920"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},"sustainable_development_goals":[{"score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2451328749","display_name":null,"funder_award_id":"AN 984/12-1","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"},{"id":"https://openalex.org/G8139783462","display_name":null,"funder_award_id":"AN 984/12","funder_id":"https://openalex.org/F4320320879","funder_display_name":"Deutsche Forschungsgemeinschaft"}],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2115918673","https://openalex.org/W2129393153","https://openalex.org/W2754586052","https://openalex.org/W2787854852","https://openalex.org/W2982102943","https://openalex.org/W3017310408","https://openalex.org/W3120847607"],"related_works":["https://openalex.org/W3021392142","https://openalex.org/W4236509694","https://openalex.org/W1982697623","https://openalex.org/W2134436426","https://openalex.org/W286594222","https://openalex.org/W3150676548","https://openalex.org/W2036682954","https://openalex.org/W2009200961","https://openalex.org/W2614733969","https://openalex.org/W1524114789"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,10,17,28,40,50,62,100,117,130,149],"tunneling":[3],"magnetoresistive":[4],"(TMR)":[5],"sensing":[6],"microsystem":[7,72],"consisting":[8,140],"of":[9,46,121,133,141,155],"low":[11,42],"flicker":[12],"noise":[13,44,119,153],"TMR":[14,36,56,90,111,143],"sensor":[15,24,138],"and":[16,106,144],"custom":[18],"integrated":[19,108],"readout":[20,25,64,95,114,146],"frontend.":[21],"The":[22,55,71,94,113,136],"proposed":[23],"circuit":[26,147],"introduces":[27],"novel":[29],"ultra-low-noise":[30],"current":[31,43,78],"biasing":[32,53,127],"scheme":[33,65],"for":[34,49,83],"the":[35,68,84,89,110,126,142,145],"sensor,":[37],"which":[38],"achieves":[39],"very":[41],"floor":[45,120,154],"2.2":[47],"pA\u221aHz":[48],"1":[51],"mA":[52],"current.":[54],"output":[57],"voltage":[58],"is":[59,97],"processed":[60],"by":[61],"differential":[63],"to":[66],"improve":[67],"baseline-to-signal":[69],"ratio.":[70],"also":[73],"features":[74],"an":[75],"on-chip":[76],"10-bit":[77],"DAC":[79],"that":[80],"allows":[81],"compensating":[82],"large":[85],"process":[86],"variations":[87],"in":[88,99],"base":[91],"resistance":[92],"value.":[93],"chip":[96],"manufactured":[98],"180":[101],"nm":[102],"SOI":[103],"CMOS":[104],"technology":[105],"heterogeneously":[107],"with":[109,125],"sensor.":[112],"chain":[115],"provides":[116,148],"thermal":[118],"4nV/\u221aHz,":[122],"while,":[123],"together":[124],"scheme,":[128],"consuming":[129],"total":[131],"power":[132],"38":[134],"mW.":[135],"complete":[137],"system":[139],"state-of-the-art":[150],"magnetic":[151],"field":[152],"120":[156],"pT/\u221aHz.":[157]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}
