{"id":"https://openalex.org/W2991413068","doi":"https://doi.org/10.1109/esscirc.2019.8902913","title":"28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital, Analog, Automotive and others Applications","display_name":"28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital, Analog, Automotive and others Applications","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2991413068","doi":"https://doi.org/10.1109/esscirc.2019.8902913","mag":"2991413068"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2019.8902913","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2019.8902913","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085676268","display_name":"F. Arnaud","orcid":"https://orcid.org/0000-0002-8426-6695"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"F. ARNAUD","raw_affiliation_strings":["STMICROELECTRONICS, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMICROELECTRONICS, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051158092","display_name":"S. Haendler","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. HAENDLER","raw_affiliation_strings":["STMICROELECTRONICS, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMICROELECTRONICS, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003876121","display_name":"Sylvain Clerc","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. CLERC","raw_affiliation_strings":["STMICROELECTRONICS, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMICROELECTRONICS, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082225805","display_name":"R. Ranica","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"R. RANICA","raw_affiliation_strings":["STMICROELECTRONICS, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMICROELECTRONICS, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038824240","display_name":"A. Gandolfo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. GANDOLFO","raw_affiliation_strings":["STMICROELECTRONICS, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMICROELECTRONICS, Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108646101","display_name":"O. Weber","orcid":null},"institutions":[{"id":"https://openalex.org/I4210150049","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","ror":"https://ror.org/04mf0wv34","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},{"id":"https://openalex.org/I2738703131","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","ror":"https://ror.org/00jjx8s55","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"O. WEBER","raw_affiliation_strings":["CEA-LETI, Crolles, France"],"affiliations":[{"raw_affiliation_string":"CEA-LETI, Crolles, France","institution_ids":["https://openalex.org/I4210150049","https://openalex.org/I2738703131"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5085676268"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.48471833,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"7","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5452436208724976},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5171594023704529},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49838972091674805},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.49487942457199097},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.48859530687332153},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4873998761177063},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.46616843342781067},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.43288755416870117},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.42691367864608765},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4129377007484436},{"id":"https://openalex.org/keywords/ultra-low-power","display_name":"Ultra low power","score":0.41257244348526},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.37656426429748535},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3662910461425781},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30093657970428467},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.18113714456558228},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.1689530909061432},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.1585485339164734},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.13031291961669922}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5452436208724976},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5171594023704529},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49838972091674805},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.49487942457199097},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.48859530687332153},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4873998761177063},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.46616843342781067},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.43288755416870117},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.42691367864608765},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4129377007484436},{"id":"https://openalex.org/C3017773396","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Ultra low power","level":4,"score":0.41257244348526},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.37656426429748535},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3662910461425781},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30093657970428467},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.18113714456558228},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.1689530909061432},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.1585485339164734},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13031291961669922},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2019.8902913","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2019.8902913","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2021433466","https://openalex.org/W2525141714","https://openalex.org/W2912017376","https://openalex.org/W3148472667"],"related_works":["https://openalex.org/W2912017376","https://openalex.org/W3133079566","https://openalex.org/W2294956199","https://openalex.org/W2021433466","https://openalex.org/W2912767510","https://openalex.org/W2965200383","https://openalex.org/W2163652266","https://openalex.org/W2156683391","https://openalex.org/W2605939216","https://openalex.org/W1963417602","https://openalex.org/W2788715615","https://openalex.org/W2955757131","https://openalex.org/W2287036717","https://openalex.org/W2083343565","https://openalex.org/W2801648437","https://openalex.org/W2064283838","https://openalex.org/W2158609250","https://openalex.org/W2809533574","https://openalex.org/W1589877905","https://openalex.org/W2793483810"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,20,108],"general":[4],"overview":[5],"of":[6,57,91],"Fully":[7],"Depleted":[8],"Silicon":[9],"On":[10],"Insulator":[11],"(FDSOI)":[12],"technology":[13],"advantages":[14],"leveraging":[15],"body":[16,65],"bias":[17,66],"capability":[18],"as":[19],"key":[21],"enabler":[22],"for":[23,34,104],"digital,":[24],"analog":[25,58],"and":[26,73,100],"memories":[27,79],"performance":[28],"enhancement.":[29],"2x":[30],"total":[31],"power":[32],"contraction":[33],"digital":[35],"designs":[36],"has":[37,60,81],"been":[38,61,82],"demonstrating":[39],"without":[40],"any":[41],"frequency":[42],"degradation":[43],"thanks":[44],"to":[45],"Forward":[46],"Body":[47],"Biasing":[48],"(FBB),":[49],"combined":[50],"with":[51,64],"70%":[52],"transistor":[53],"variability":[54],"reduction.":[55],"Power":[56],"blocks":[59],"strongly":[62],"reduced":[63],"technique":[67],"while":[68],"keeping":[69],"trans-conductance":[70],"efficiency":[71],"increasing":[72],"output":[74],"voltage":[75],"gain.":[76],"Finally,":[77],"excellent":[78],"performances":[80],"achieved":[83],"by":[84],"applying":[85],"FBB/RBB":[86],"solution,":[87],"dropping":[88],"the":[89],"leakage":[90],"unselected":[92],"word-line":[93],"in":[94],"Phase":[95],"Change":[96],"Memory":[97],"(PCM)":[98],"array":[99],"improving":[101],"Vmin":[102],"operation":[103],"static":[105],"RAM":[106],"across":[107],"wide":[109],"temperature":[110],"range.":[111]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}