{"id":"https://openalex.org/W2981602829","doi":"https://doi.org/10.1109/esscirc.2019.8902650","title":"A 5800-\u03bcm<sup>2</sup> Resistor-Based Temperature Sensor With a One-Point Trimmed Inaccuracy of \u00b11.2 \u00b0C (3\u03c3) From \u221250 \u00b0C to 105 \u00b0C in 65-nm CMOS","display_name":"A 5800-\u03bcm<sup>2</sup> Resistor-Based Temperature Sensor With a One-Point Trimmed Inaccuracy of \u00b11.2 \u00b0C (3\u03c3) From \u221250 \u00b0C to 105 \u00b0C in 65-nm CMOS","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2981602829","doi":"https://doi.org/10.1109/esscirc.2019.8902650","mag":"2981602829"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2019.8902650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2019.8902650","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102908277","display_name":"Yongtae Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongtae Lee","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067541342","display_name":"Woojun Choi","orcid":"https://orcid.org/0000-0001-7756-008X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woojun Choi","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112519233","display_name":"Tae-Woong Kim","orcid":"https://orcid.org/0000-0001-9999-6474"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taewoong Kim","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072706323","display_name":"Seungwoo Song","orcid":"https://orcid.org/0000-0003-3302-0553"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungwoo Song","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A. A. Makinwa","raw_affiliation_strings":["Microelectronics Department, Delft University of Technology, Delft, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microelectronics Department, Delft University of Technology, Delft, The Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088759343","display_name":"Youngcheol Chae","orcid":"https://orcid.org/0000-0002-1618-169X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngcheol Chae","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.0515,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.78768138,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"68","last_page":"71"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.8412257432937622},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6713541746139526},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5294791460037231},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.4858972430229187},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47328633069992065},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.43697255849838257},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.40406346321105957},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3470250070095062},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3408060669898987},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.19707855582237244},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17738446593284607},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.16584190726280212}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.8412257432937622},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6713541746139526},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5294791460037231},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.4858972430229187},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47328633069992065},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.43697255849838257},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.40406346321105957},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3470250070095062},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3408060669898987},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.19707855582237244},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17738446593284607},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.16584190726280212},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/esscirc.2019.8902650","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2019.8902650","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},{"id":"pmh:oai:tudelft.nl:uuid:56df012b-a1b5-4503-86b9-14e41cfd13ec","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:56df012b-a1b5-4503-86b9-14e41cfd13ec","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G118098278","display_name":null,"funder_award_id":"NRF-2016-Global Ph.D. Fellowship Program","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G1566247943","display_name":null,"funder_award_id":"2018R1A4A1025986","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G3195937662","display_name":null,"funder_award_id":"NRF-2016-Global Ph.D","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3971583960","display_name":null,"funder_award_id":"NRF-2016-Global","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G4244126222","display_name":null,"funder_award_id":"NRF-2016","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G6865890165","display_name":null,"funder_award_id":"2018R1A4A1025986","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1969794630","https://openalex.org/W2123054928","https://openalex.org/W2295397648","https://openalex.org/W2581188453","https://openalex.org/W2790039338","https://openalex.org/W2802661585","https://openalex.org/W2888389063","https://openalex.org/W2895608533","https://openalex.org/W2897048066","https://openalex.org/W2908025453"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3120961607","https://openalex.org/W3200817179","https://openalex.org/W3148568549","https://openalex.org/W1960166976","https://openalex.org/W1992708211","https://openalex.org/W2380067098","https://openalex.org/W1548152478","https://openalex.org/W3119249758","https://openalex.org/W1677674380"],"abstract_inverted_index":{"This":[0,76],"letter":[1],"describes":[2],"a":[3,31,37,63,73,100,107],"compact":[4,83],"resistor-based":[5,84],"temperature":[6,65],"sensor":[7],"intended":[8],"for":[9],"the":[10,81],"thermal":[11],"monitoring":[12],"of":[13,19,110],"microprocessors":[14],"and":[15,55,95],"DRAMs.":[16],"It":[17],"consists":[18],"an":[20],"RC":[21],"poly":[22],"phase":[23],"filter":[24],"(PPF)":[25],"that":[26],"is":[27,77],"read":[28],"out":[29],"by":[30],"frequency-locked":[32],"loop":[33],"(FLL)":[34],"based":[35],"on":[36],"dual":[38],"zero-crossing":[39],"(ZC)":[40],"detection":[41],"scheme.":[42],"The":[43],"sensor,":[44],"fabricated":[45],"in":[46,99],"65-nm":[47],"CMOS,":[48],"occupies":[49],"5800":[50],"\u03bcm":[51],"<sup":[52],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[53],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[54],"achieves":[56,96],"moderate":[57],"accuracy":[58],"[\u00b11.2":[59],"\u00b0C":[60,68],"(3\u03c3)]":[61],"over":[62],"wide":[64],"range":[66],"(\u221250":[67],"to":[69,89,106],"105":[70],"\u00b0C)":[71],"after":[72],"one-point":[74],"trim.":[75],"2\u00d7":[78],"better":[79],"than":[80],"previous":[82],"sensors.":[85],"Operating":[86],"from":[87],"0.85":[88],"1.3-V":[90],"supplies,":[91],"it":[92],"consumes":[93],"32.5-\u03bcA":[94],"2.8-mK":[97],"resolution":[98,108],"1-ms":[101],"conversion":[102],"time,":[103],"which":[104],"corresponds":[105],"FoM":[109],"0.26":[111],"pJ\u2022K2.":[112]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2019-11-01T00:00:00"}