{"id":"https://openalex.org/W2983701306","doi":"https://doi.org/10.1109/esscirc.2019.8902522","title":"A 30V 2A Real-Time Programmable Solid-State Circuit Breaker with Improved Detection-Speed and Enhanced Power-Efficiency","display_name":"A 30V 2A Real-Time Programmable Solid-State Circuit Breaker with Improved Detection-Speed and Enhanced Power-Efficiency","publication_year":2019,"publication_date":"2019-09-01","ids":{"openalex":"https://openalex.org/W2983701306","doi":"https://doi.org/10.1109/esscirc.2019.8902522","mag":"2983701306"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2019.8902522","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2019.8902522","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041987715","display_name":"Yong Qu","orcid":"https://orcid.org/0000-0001-9244-8133"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yong Qu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101786512","display_name":"Wei Shu","orcid":"https://orcid.org/0009-0008-7619-4610"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Wei Shu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101568655","display_name":"Kang Yang","orcid":"https://orcid.org/0000-0003-2175-5915"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yang Kang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023352317","display_name":"Joseph S. Chang","orcid":"https://orcid.org/0000-0003-0991-8339"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Joseph S. Chang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":0.4843,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.66565145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"157","last_page":"160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.9009522199630737},{"id":"https://openalex.org/keywords/overcurrent","display_name":"Overcurrent","score":0.8865070343017578},{"id":"https://openalex.org/keywords/inrush-current","display_name":"Inrush current","score":0.8300846815109253},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5859220623970032},{"id":"https://openalex.org/keywords/transient-recovery-voltage","display_name":"Transient recovery voltage","score":0.5835016965866089},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.5372886657714844},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5342022180557251},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4736669659614563},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.4655125141143799},{"id":"https://openalex.org/keywords/solid-state-relay","display_name":"Solid-state relay","score":0.4320516884326935},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42400622367858887},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3887569308280945},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3696267902851105},{"id":"https://openalex.org/keywords/constant-power-circuit","display_name":"Constant power circuit","score":0.28755345940589905},{"id":"https://openalex.org/keywords/power-factor","display_name":"Power factor","score":0.22282332181930542},{"id":"https://openalex.org/keywords/relay","display_name":"Relay","score":0.10081696510314941},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0979413390159607}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.9009522199630737},{"id":"https://openalex.org/C47949032","wikidata":"https://www.wikidata.org/wiki/Q663542","display_name":"Overcurrent","level":3,"score":0.8865070343017578},{"id":"https://openalex.org/C23340480","wikidata":"https://www.wikidata.org/wiki/Q358932","display_name":"Inrush current","level":4,"score":0.8300846815109253},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5859220623970032},{"id":"https://openalex.org/C72047438","wikidata":"https://www.wikidata.org/wiki/Q779785","display_name":"Transient recovery voltage","level":5,"score":0.5835016965866089},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.5372886657714844},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5342022180557251},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4736669659614563},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.4655125141143799},{"id":"https://openalex.org/C79997944","wikidata":"https://www.wikidata.org/wiki/Q260662","display_name":"Solid-state relay","level":4,"score":0.4320516884326935},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42400622367858887},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3887569308280945},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3696267902851105},{"id":"https://openalex.org/C29586797","wikidata":"https://www.wikidata.org/wiki/Q5163663","display_name":"Constant power circuit","level":4,"score":0.28755345940589905},{"id":"https://openalex.org/C64424096","wikidata":"https://www.wikidata.org/wiki/Q750454","display_name":"Power factor","level":3,"score":0.22282332181930542},{"id":"https://openalex.org/C2778156585","wikidata":"https://www.wikidata.org/wiki/Q174053","display_name":"Relay","level":3,"score":0.10081696510314941},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0979413390159607},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2019.8902522","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2019.8902522","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2547984584","https://openalex.org/W2774915612","https://openalex.org/W2790090739","https://openalex.org/W2792895092","https://openalex.org/W2802712890","https://openalex.org/W2809802063","https://openalex.org/W2887100103","https://openalex.org/W2897945433","https://openalex.org/W6755788968"],"related_works":["https://openalex.org/W2902577882","https://openalex.org/W2612464269","https://openalex.org/W3158157832","https://openalex.org/W2962853624","https://openalex.org/W3032802867","https://openalex.org/W4200375091","https://openalex.org/W4248823384","https://openalex.org/W2386425368","https://openalex.org/W2950245028","https://openalex.org/W2055033747"],"abstract_inverted_index":{"State-of-the-art":[0],"circuit":[1,40,81,118],"breakers":[2],"embodying":[3],"a":[4,36,44,85,90],"predetermined":[5],"fixed":[6],"current":[7,15,46,56,61,77,92,103,126],"limit":[8,47,57,93,127],"exhibit":[9],"difficulty":[10],"in":[11,84],"differentiating":[12],"large":[13],"inrush":[14],"during":[16,21],"startups":[17],"and":[18,25,68,106,138],"gentle":[19],"overcurrent":[20],"on-state":[22],"with":[23],"load,":[24],"thus":[26],"often":[27],"fail":[28],"to":[29],"provide":[30],"prompt":[31],"protection.":[32],"This":[33],"paper":[34],"presents":[35],"monolithically":[37],"integrated":[38],"solid-state":[39,117],"breaker":[41],"that":[42],"features":[43,89,123],"variable":[45],"by":[48,62,72],"means":[49],"of":[50,95,100,104,110],"employing":[51],"our":[52,63,73,120],"proposed":[53,64],"real-time":[54],"programmable":[55,91],"controller,":[58],"low":[59],"quiescent":[60,102,136],"Darlington-LDMOS-based":[65],"high-voltage":[66],"regulator,":[67],"fast":[69],"detection":[70],"speed":[71],"improved":[74],"on-chip":[75],"LDPMOS":[76],"sensor.":[78],"The":[79],"prototype":[80],"breaker,":[82],"realized":[83],"130nm":[86],"BCDLite":[87],"process,":[88],"range":[94],"0.2-2A,":[96],"maximum":[97],"input":[98,130],"voltage":[99,131],"30V,":[101],"30\u00b5A,":[105],"fault-current":[107],"response":[108,141],"time":[109],"0.2\u00b5s.":[111],"When":[112],"benchmarked":[113],"against":[114],"the":[115,124],"state-of-the-art":[116],"breakers,":[119],"design":[121],"simultaneously":[122],"widest":[125],"range,":[128],"highest":[129],"handling":[132],"capability,":[133],"~13\u00d7":[134],"lower":[135],"current,":[137],"~5\u00d7":[139],"shorter":[140],"time.":[142]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}