{"id":"https://openalex.org/W2770950730","doi":"https://doi.org/10.1109/esscirc.2017.8094574","title":"An ultra-low-power and mixed-mode event-driven face detection SoC for always-on mobile applications","display_name":"An ultra-low-power and mixed-mode event-driven face detection SoC for always-on mobile applications","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2770950730","doi":"https://doi.org/10.1109/esscirc.2017.8094574","mag":"2770950730"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2017.8094574","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2017.8094574","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017904278","display_name":"Changhyeon Kim","orcid":"https://orcid.org/0000-0001-6774-4539"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changhyeon Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067752227","display_name":"Kyeongryeol Bong","orcid":"https://orcid.org/0000-0001-9176-3668"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyeongryeol Bong","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004926900","display_name":"Injoon Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Injoon Hong","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101638097","display_name":"Kyuho Lee","orcid":"https://orcid.org/0000-0002-4047-1013"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyuho Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076373841","display_name":"Sungpill Choi","orcid":"https://orcid.org/0000-0002-8468-6374"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungpill Choi","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077896259","display_name":"Hoi\u2010Jun Yoo","orcid":"https://orcid.org/0000-0002-6661-4879"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hoi-Jun Yoo","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.9004,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.87126016,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/face-detection","display_name":"Face detection","score":0.6667930483818054},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6085159182548523},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6039400100708008},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5359358191490173},{"id":"https://openalex.org/keywords/face","display_name":"Face (sociological concept)","score":0.4952830374240875},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.46054714918136597},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.45893120765686035},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.456958532333374},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4428026080131531},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40740638971328735},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3783379793167114},{"id":"https://openalex.org/keywords/facial-recognition-system","display_name":"Facial recognition system","score":0.32914912700653076},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2938730716705322},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2903253436088562},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2539052665233612},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24329587817192078},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.18099713325500488},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.137467622756958}],"concepts":[{"id":"https://openalex.org/C4641261","wikidata":"https://www.wikidata.org/wiki/Q11681085","display_name":"Face detection","level":4,"score":0.6667930483818054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6085159182548523},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6039400100708008},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5359358191490173},{"id":"https://openalex.org/C2779304628","wikidata":"https://www.wikidata.org/wiki/Q3503480","display_name":"Face (sociological concept)","level":2,"score":0.4952830374240875},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.46054714918136597},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.45893120765686035},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.456958532333374},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4428026080131531},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40740638971328735},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3783379793167114},{"id":"https://openalex.org/C31510193","wikidata":"https://www.wikidata.org/wiki/Q1192553","display_name":"Facial recognition system","level":3,"score":0.32914912700653076},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2938730716705322},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2903253436088562},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2539052665233612},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24329587817192078},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.18099713325500488},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.137467622756958},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.0},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/esscirc.2017.8094574","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2017.8094574","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/37270","is_oa":false,"landing_page_url":"https://ieeexplore.ieee.org/document/8094574/","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"CONFERENCE"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1918935455","https://openalex.org/W2008802978","https://openalex.org/W2029743386","https://openalex.org/W2042633959","https://openalex.org/W2164598857","https://openalex.org/W2197399834","https://openalex.org/W2328619957","https://openalex.org/W2542104994","https://openalex.org/W2593882908","https://openalex.org/W4242296985"],"related_works":["https://openalex.org/W2336272890","https://openalex.org/W4308999381","https://openalex.org/W3183843611","https://openalex.org/W4312238398","https://openalex.org/W3211418293","https://openalex.org/W4308999963","https://openalex.org/W4312081214","https://openalex.org/W325114128","https://openalex.org/W1917800633","https://openalex.org/W2357284929"],"abstract_inverted_index":{"A":[0],"new":[1],"face":[2,10,35,40,46,56,71,110],"detection":[3,36,41,47,57,72],"SoC":[4,37],"integrating":[5],"CIS":[6,93],"array":[7],"with":[8,42,90,106],"low-power":[9],"detector":[11],"on":[12],"a":[13],"single":[14],"chip":[15,89],"in":[16,75,80],"analog-digital":[17],"mixed-mode":[18,34],"is":[19],"proposed":[20,32],"for":[21,92,96],"ultra-low-power":[22],"mobile":[23],"device":[24],"applications":[25],"such":[26],"as":[27],"always-on":[28],"user":[29],"authentication.":[30],"The":[31,54],"event-driven":[33],"performs":[38],"Viola-Jones":[39],"not":[43],"only":[44],"analog":[45,55],"circuits":[48,58],"but":[49],"also":[50],"digital":[51,70,97],"vision":[52,98],"processor.":[53],"enable":[59],"85%":[60],"of":[61],"workload":[62],"to":[63],"be":[64],"skipped":[65],"before":[66],"A/D":[67],"conversion":[68],"and":[69,94,102,109],"processing,":[73],"resulting":[74],"39%":[76],"power":[77],"reduction.":[78],"Implemented":[79],"65nm":[81],"CMOS":[82],"technology,":[83],"11.09":[84],"mm":[85],"<sup":[86],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[87],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[88],"2.5V":[91],"0.8V":[95],"processor":[99],"consumes":[100],"24\u03bcW":[101],"96\u03bcW":[103],"at":[104],"1fps":[105],"non-face":[107],"images":[108],"images,":[111],"respectively.":[112]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}