{"id":"https://openalex.org/W2770095744","doi":"https://doi.org/10.1109/esscirc.2017.8094539","title":"DDR4 transmitter with AC-boost equalization and wide-band voltage regulators for thin-oxide protection in 14-nm SOI CMOS technology","display_name":"DDR4 transmitter with AC-boost equalization and wide-band voltage regulators for thin-oxide protection in 14-nm SOI CMOS technology","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2770095744","doi":"https://doi.org/10.1109/esscirc.2017.8094539","mag":"2770095744"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2017.8094539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2017.8094539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085908094","display_name":"Marcel Kossel","orcid":"https://orcid.org/0000-0003-3053-2422"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Marcel Kossel","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028644477","display_name":"Christian Menolfi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Christian Menolfi","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014994900","display_name":"Pier Andrea Francese","orcid":"https://orcid.org/0000-0003-2944-9058"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Pier Andrea Francese","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055433194","display_name":"Lukas Kull","orcid":"https://orcid.org/0000-0001-9607-0430"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Lukas Kull","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088828887","display_name":"Thomas Morf","orcid":"https://orcid.org/0000-0002-2712-6653"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thomas Morf","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084903090","display_name":"Thomas Toifl","orcid":"https://orcid.org/0000-0002-6448-1961"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Thomas Toifl","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111996411","display_name":"Matthias Br\u00e4ndli","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Matthias Brandli","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013635152","display_name":"Alessandro Cevrero","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Alessandro Cevrero","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008093986","display_name":"Danny Luu","orcid":"https://orcid.org/0000-0003-2817-0354"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Danny Luu","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052709518","display_name":"\u0130lter \u00d6zkaya","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Ilter Ozkaya","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054845541","display_name":"Hazar Yueksel","orcid":"https://orcid.org/0000-0003-1782-3727"},"institutions":[{"id":"https://openalex.org/I4210126328","display_name":"IBM Research - Zurich","ror":"https://ror.org/02js37d36","country_code":"CH","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210126328"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Hazar Yueksel","raw_affiliation_strings":["IBM Research - Zurich, R\u00fcschlikon, Switzerland"],"affiliations":[{"raw_affiliation_string":"IBM Research - Zurich, R\u00fcschlikon, Switzerland","institution_ids":["https://openalex.org/I4210126328"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5085908094"],"corresponding_institution_ids":["https://openalex.org/I4210126328"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.15669961,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"115","last_page":"118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6157442331314087},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.5895792841911316},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5735510587692261},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4639660120010376},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.45417261123657227},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.42875513434410095},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.42652639746665955},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3522644639015198},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3516051769256592},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2664158046245575},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.24982094764709473}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6157442331314087},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.5895792841911316},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5735510587692261},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4639660120010376},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.45417261123657227},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.42875513434410095},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42652639746665955},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3522644639015198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3516051769256592},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2664158046245575},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.24982094764709473},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2017.8094539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2017.8094539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8500000238418579}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2069998272","https://openalex.org/W2145590995","https://openalex.org/W2552064079","https://openalex.org/W2592901572","https://openalex.org/W6681872546"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W4206445530","https://openalex.org/W2771786520","https://openalex.org/W2810180604","https://openalex.org/W2325281603","https://openalex.org/W2944964251","https://openalex.org/W2012754971","https://openalex.org/W44660823","https://openalex.org/W2034653092","https://openalex.org/W2101030291"],"abstract_inverted_index":{"A":[0,96],"DDR4":[1],"transmitter":[2],"(TX)":[3],"for":[4,32,78,181],"direct-attach":[5],"memory":[6,94],"on":[7],"a":[8,115,138,169,175],"processor":[9],"chip":[10],"is":[11,60,76,111,143],"presented":[12],"as":[13,15],"well":[14],"the":[16,19,28,33,37,43,65,103,108,122,127,133,152,161,182],"design":[17,75,142],"of":[18,36,126,160,178],"associated":[20],"low-dropout":[21],"linear":[22],"voltage":[23],"regulators":[24],"(LDO)":[25],"that":[26,57,113],"generate":[27],"split-mode":[29],"supply":[30],"voltages":[31],"thin-oxide":[34],"protection":[35],"TX":[38,48,162],"output":[39,135],"stages":[40],"operated":[41],"from":[42],"1.2":[44],"V":[45],"DDR4-supply.":[46],"The":[47,73,141],"uses":[49],"AC-boost":[50],"equalization.":[51,72],"Signal-integrity":[52],"(SI)":[53],"simulations":[54],"have":[55],"shown":[56],"pre-emphasis":[58],"equalization":[59],"better":[61],"suited":[62],"to":[63,120],"meet":[64],"DRAM":[66,172],"eye":[67],"mask":[68],"specification":[69],"than":[70],"de-emphasis":[71],"LDO":[74],"optimized":[77],"good":[79],"frequency":[80],"compensation":[81],"at":[82],"large":[83],"load":[84,173],"variations,":[85],"which":[86,129],"typically":[87],"occur":[88],"during":[89],"burst-mode":[90],"transmissions":[91],"in":[92,130,145],"DDR":[93],"links.":[95],"wide-band":[97],"low-output":[98,123],"impedance":[99,124],"buffer":[100],"located":[101],"between":[102],"LDO's":[104],"error":[105],"amplifier":[106],"and":[107,117,151,174],"power":[109],"transistor":[110],"proposed":[112],"implements":[114],"load-sensing":[116],"current-injection":[118],"scheme":[119],"extend":[121],"range":[125],"buffer,":[128],"turn":[131],"stabilizes":[132],"dominant":[134],"pole":[136],"over":[137],"wider":[139],"di/dt-range.":[140],"implemented":[144],"14-nm":[146],"silicon-on-insulator":[147],"(SOI)":[148],"CMOS":[149],"technology,":[150],"key":[153],"performance":[154],"measures":[155],"are":[156],"2.8":[157],"pJ/b":[158],"efficiency":[159],"when":[163],"driving":[164],"with":[165],"34":[166],"\u03a9":[167,171],"into":[168],"40":[170],"figure-of-merit":[176],"(FOM)":[177],"96":[179],"ps":[180],"LDO.":[183]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}