{"id":"https://openalex.org/W2769467480","doi":"https://doi.org/10.1109/esscirc.2017.8094515","title":"A 1.02nW PMOS-only, trim-free current reference with 282ppm/\u00b0C from \u221240\u00b0C to 120\u00b0C and 1.6% within-wafer inaccuracy","display_name":"A 1.02nW PMOS-only, trim-free current reference with 282ppm/\u00b0C from \u221240\u00b0C to 120\u00b0C and 1.6% within-wafer inaccuracy","publication_year":2017,"publication_date":"2017-09-01","ids":{"openalex":"https://openalex.org/W2769467480","doi":"https://doi.org/10.1109/esscirc.2017.8094515","mag":"2769467480"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2017.8094515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2017.8094515","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007468197","display_name":"Qing Dong","orcid":"https://orcid.org/0000-0002-1380-269X"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Qing Dong","raw_affiliation_strings":["Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075063817","display_name":"Inhee Lee","orcid":"https://orcid.org/0000-0001-5723-9678"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Inhee Lee","raw_affiliation_strings":["Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076619099","display_name":"Kaiyuan Yang","orcid":"https://orcid.org/0000-0001-7220-9389"},"institutions":[{"id":"https://openalex.org/I74775410","display_name":"Rice University","ror":"https://ror.org/008zs3103","country_code":"US","type":"education","lineage":["https://openalex.org/I74775410"]},{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kaiyuan Yang","raw_affiliation_strings":["Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","Dept. of Electrical and Computer Engineering, Rice University, Houston, TX, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"Dept. of Electrical and Computer Engineering, Rice University, Houston, TX, USA","institution_ids":["https://openalex.org/I74775410"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026311377","display_name":"David Blaauw","orcid":"https://orcid.org/0000-0001-6744-7075"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Blaauw","raw_affiliation_strings":["Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000767141","display_name":"Dennis Sylvester","orcid":"https://orcid.org/0000-0003-2598-0458"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dennis Sylvester","raw_affiliation_strings":["Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5007468197"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":1.2746,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.78943227,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"19","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.9593838453292847},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.8866094350814819},{"id":"https://openalex.org/keywords/trim","display_name":"Trim","score":0.7198206186294556},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5748211145401001},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5639734864234924},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5171922445297241},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5035502314567566},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49709466099739075},{"id":"https://openalex.org/keywords/wafer-scale-integration","display_name":"Wafer-scale integration","score":0.4881623387336731},{"id":"https://openalex.org/keywords/temperature-coefficient","display_name":"Temperature coefficient","score":0.47954556345939636},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45842304825782776},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.45320940017700195},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40448862314224243},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2729097008705139},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20132040977478027},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.1315232515335083}],"concepts":[{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.9593838453292847},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.8866094350814819},{"id":"https://openalex.org/C88611116","wikidata":"https://www.wikidata.org/wiki/Q957004","display_name":"Trim","level":2,"score":0.7198206186294556},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5748211145401001},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5639734864234924},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5171922445297241},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5035502314567566},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49709466099739075},{"id":"https://openalex.org/C2778638305","wikidata":"https://www.wikidata.org/wiki/Q7406100","display_name":"Wafer-scale integration","level":3,"score":0.4881623387336731},{"id":"https://openalex.org/C16643434","wikidata":"https://www.wikidata.org/wiki/Q898642","display_name":"Temperature coefficient","level":2,"score":0.47954556345939636},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45842304825782776},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.45320940017700195},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40448862314224243},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2729097008705139},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20132040977478027},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1315232515335083},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2017.8094515","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2017.8094515","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.800000011920929,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2014617689","https://openalex.org/W2017499943","https://openalex.org/W2094846461","https://openalex.org/W2094860990","https://openalex.org/W2123617179","https://openalex.org/W2527089532","https://openalex.org/W2575765302"],"related_works":["https://openalex.org/W4205838487","https://openalex.org/W4320062971","https://openalex.org/W4206542901","https://openalex.org/W2095795001","https://openalex.org/W392191687","https://openalex.org/W2003063789","https://openalex.org/W2085719533","https://openalex.org/W2542196105","https://openalex.org/W2745127909","https://openalex.org/W1517746399"],"abstract_inverted_index":{"A":[0],"1.02nW":[1],"current":[2],"reference":[3,60],"is":[4,50,73],"designed":[5],"with":[6],"only":[7],"PMOS":[8],"transistors,":[9],"thereby":[10],"providing":[11],"inherently":[12],"low":[13],"process":[14],"variation":[15],"and":[16,39,71],"enabling":[17],"trim-free":[18],"operation.":[19],"Thirty-two":[20],"measured":[21,46],"chips":[22],"from":[23,52],"5":[24],"corner":[25],"wafers":[26],"in":[27],"180nm":[28],"CMOS":[29],"technology":[30],"show":[31],"an":[32],"untrimmed":[33,63],"within-wafer":[34],"spread":[35,42],"(\u03c3/\u03bc)":[36],"of":[37,43,68],"1.6%":[38],"across-corner":[40],"wafer-to-wafer":[41],"\u00b14.7%.":[44],"The":[45],"average":[47],"temperature":[48,72],"coefficient":[49],"282ppm/\u00b0C":[51],"-40\u00b0C":[53],"to":[54,66],"120\u00b0C":[55],"while":[56],"generating":[57],"a":[58],"35nA":[59],"current.":[61],"Total":[62],"uncertainty":[64],"due":[65],"variations":[67],"process,":[69],"voltage,":[70],"about":[74],"8.8%.":[75]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}