{"id":"https://openalex.org/W2137432370","doi":"https://doi.org/10.1109/esscirc.2012.6341319","title":"A 500 fW/bit 14 fJ/bit-access 4kb standard-cell based sub-V<sub>T</sub> memory in 65nm CMOS","display_name":"A 500 fW/bit 14 fJ/bit-access 4kb standard-cell based sub-V<sub>T</sub> memory in 65nm CMOS","publication_year":2012,"publication_date":"2012-09-01","ids":{"openalex":"https://openalex.org/W2137432370","doi":"https://doi.org/10.1109/esscirc.2012.6341319","mag":"2137432370"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2012.6341319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2012.6341319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Proceedings of the ESSCIRC (ESSCIRC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://infoscience.epfl.ch/record/178152","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026324911","display_name":"Pascal Meinerzhagen","orcid":"https://orcid.org/0000-0002-5444-5772"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Pascal Meinerzhagen","raw_affiliation_strings":["Institute of Electrical Engineering, EPFL, Lausanne, VD, Switzerland","Institute of Electrical Engineering, EPFL, Lausanne, VD, 1015 Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, EPFL, Lausanne, VD, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Institute of Electrical Engineering, EPFL, Lausanne, VD, 1015 Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019912356","display_name":"Oskar Andersson","orcid":"https://orcid.org/0000-0003-1663-5599"},"institutions":[{"id":"https://openalex.org/I187531555","display_name":"Lund University","ror":"https://ror.org/012a77v79","country_code":"SE","type":"education","lineage":["https://openalex.org/I187531555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Oskar Andersson","raw_affiliation_strings":["Department of Electrical and Information Technology, Lund University, Lund, Sweden","Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund, Sweden","institution_ids":["https://openalex.org/I187531555"]},{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden","institution_ids":["https://openalex.org/I187531555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101764729","display_name":"Babak Mohammadi","orcid":"https://orcid.org/0000-0003-3710-6119"},"institutions":[{"id":"https://openalex.org/I187531555","display_name":"Lund University","ror":"https://ror.org/012a77v79","country_code":"SE","type":"education","lineage":["https://openalex.org/I187531555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Babak Mohammadi","raw_affiliation_strings":["Department of Electrical and Information Technology, Lund University, Lund, Sweden","Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund, Sweden","institution_ids":["https://openalex.org/I187531555"]},{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden","institution_ids":["https://openalex.org/I187531555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088829611","display_name":"Yasser Sherazi","orcid":null},"institutions":[{"id":"https://openalex.org/I187531555","display_name":"Lund University","ror":"https://ror.org/012a77v79","country_code":"SE","type":"education","lineage":["https://openalex.org/I187531555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Yasser Sherazi","raw_affiliation_strings":["Department of Electrical and Information Technology, Lund University, Lund, Sweden","Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund, Sweden","institution_ids":["https://openalex.org/I187531555"]},{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden","institution_ids":["https://openalex.org/I187531555"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059133771","display_name":"Andreas Burg","orcid":"https://orcid.org/0000-0002-7270-5558"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Andreas Burg","raw_affiliation_strings":["Institute of Electrical Engineering, EPFL, Lausanne, VD, Switzerland","Institute of Electrical Engineering, EPFL, Lausanne, VD, 1015 Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, EPFL, Lausanne, VD, Switzerland","institution_ids":["https://openalex.org/I5124864"]},{"raw_affiliation_string":"Institute of Electrical Engineering, EPFL, Lausanne, VD, 1015 Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104061156","display_name":"Joachim Rodrigues","orcid":null},"institutions":[{"id":"https://openalex.org/I187531555","display_name":"Lund University","ror":"https://ror.org/012a77v79","country_code":"SE","type":"education","lineage":["https://openalex.org/I187531555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Joachim Neves Rodrigues","raw_affiliation_strings":["Department of Electrical and Information Technology, Lund University, Lund, Sweden","Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund, Sweden","institution_ids":["https://openalex.org/I187531555"]},{"raw_affiliation_string":"Department of Electrical and Information Technology, Lund University, Lund 22100, Sweden","institution_ids":["https://openalex.org/I187531555"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"321","last_page":"324"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7863085865974426},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.575494110584259},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.5749229788780212},{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.5058109760284424},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5048090219497681},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.4954782724380493},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45439815521240234},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.38163653016090393},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3459530472755432},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.30885493755340576},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24094778299331665},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1967127025127411},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.15720757842063904},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15008306503295898}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7863085865974426},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.575494110584259},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.5749229788780212},{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.5058109760284424},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5048090219497681},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.4954782724380493},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45439815521240234},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.38163653016090393},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3459530472755432},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.30885493755340576},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24094778299331665},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1967127025127411},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.15720757842063904},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15008306503295898},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/esscirc.2012.6341319","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2012.6341319","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 Proceedings of the ESSCIRC (ESSCIRC)","raw_type":"proceedings-article"},{"id":"pmh:oai:infoscience.tind.io:178152","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/178152","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://infoscience.epfl.ch/record/178152","raw_type":"Text"},{"id":"pmh:oai:lup.lub.lu.se:d7e2cdbe-ef39-4217-89ea-c6c2fbce6edd","is_oa":false,"landing_page_url":"https://lup.lub.lu.se/record/2798080","pdf_url":null,"source":{"id":"https://openalex.org/S4306400536","display_name":"Lund University Publications (Lund University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I187531555","host_organization_name":"Lund University","host_organization_lineage":["https://openalex.org/I187531555"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:infoscience.tind.io:178152","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/178152","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://infoscience.epfl.ch/record/178152","raw_type":"Text"},"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1998597557","https://openalex.org/W2089826026","https://openalex.org/W2098931949","https://openalex.org/W2131833150","https://openalex.org/W2137956450","https://openalex.org/W2144289559","https://openalex.org/W2149521191","https://openalex.org/W2158622216","https://openalex.org/W3151434794","https://openalex.org/W6672799415","https://openalex.org/W6679872097","https://openalex.org/W6680537189"],"related_works":["https://openalex.org/W2155827627","https://openalex.org/W2321291171","https://openalex.org/W2924345281","https://openalex.org/W2099115487","https://openalex.org/W2004113442","https://openalex.org/W2020064877","https://openalex.org/W2282857298","https://openalex.org/W759823822","https://openalex.org/W2973068530","https://openalex.org/W2757604236"],"abstract_inverted_index":{"Ultra-low":[0],"power":[1,77,115],"(ULP)":[2],"biomedical":[3],"implants":[4],"and":[5,50,128],"sensor":[6],"nodes":[7],"typically":[8],"require":[9],"small":[10],"memories":[11,27,35],"of":[12,31,54,94,108,116,125,132,141],"a":[13,38,80,109,113,122,129],"few":[14],"kb,":[15],"while":[16],"previous":[17],"work":[18],"on":[19],"reliable":[20],"subthreshold":[21],"(sub-V":[22],"<sub":[23,45,57],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[24,46,58],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</sub>":[25,47,59],")":[26],"targets":[28],"several":[29],"hundreds":[30],"kb.":[32],"Standard-cell":[33],"based":[34],"(SCMs)":[36],"are":[37],"straightforward":[39],"approach":[40],"to":[41,144,152],"realize":[42],"robust":[43],"sub-V":[44,56],"storage":[48],"arrays":[49],"fill":[51],"the":[52,100,145],"gap":[53],"missing":[55],"memory":[60],"compilers.":[61],"This":[62],"paper":[63],"presents":[64],"an":[65],"ultra-low-leakage":[66],"4kb":[67,110],"SCM":[68,103,111],"manufactured":[69],"in":[70,148],"65nm":[71,149],"CMOS":[72,150],"technology.":[73],"To":[74],"minimize":[75],"leakage":[76,92,114],"during":[78],"standby,":[79],"single":[81],"custom-designed":[82],"standard-cell":[83],"(D-latch":[84],"with":[85],"3-state":[86],"output":[87],"buffer)":[88],"addressing":[89],"all":[90],"major":[91],"contributors":[93],"SCMs":[95],"is":[96],"seamlessly":[97],"integrated":[98],"into":[99],"fully":[101],"automated":[102],"compilation":[104],"flow.":[105],"Silicon":[106],"measurements":[107],"indicate":[112],"500fW":[117],"per":[118,135],"stored":[119],"bit":[120,137],"(at":[121,138],"data-retention":[123],"voltage":[124,140],"220":[126],"mV)":[127],"total":[130],"energy":[131],"14":[133],"fJ":[134],"accessed":[136],"energy-minimum":[139],"500mV),":[142],"corresponding":[143],"lowest":[146],"values":[147],"reported":[151],"date.":[153]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2016-06-24T00:00:00"}