{"id":"https://openalex.org/W2112836515","doi":"https://doi.org/10.1109/esscirc.2011.6044955","title":"Circuit-aware device reliability criteria methodology","display_name":"Circuit-aware device reliability criteria methodology","publication_year":2011,"publication_date":"2011-09-01","ids":{"openalex":"https://openalex.org/W2112836515","doi":"https://doi.org/10.1109/esscirc.2011.6044955","mag":"2112836515"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2011.6044955","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2011.6044955","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Proceedings of the ESSCIRC (ESSCIRC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070965384","display_name":"Jason T. Ryan","orcid":"https://orcid.org/0000-0003-4501-0969"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. T. Ryan","raw_affiliation_strings":["Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007216982","display_name":"Lan Wei","orcid":"https://orcid.org/0000-0002-7430-8767"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. Wei","raw_affiliation_strings":["Microsystems Technology Laboratories, MIT, Cambridge, MA, USA","Microsystems Technol. Lab., MIT, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microsystems Technology Laboratories, MIT, Cambridge, MA, USA","institution_ids":[]},{"raw_affiliation_string":"Microsystems Technol. Lab., MIT, Cambridge, MA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079177496","display_name":"J. P. Campbell","orcid":"https://orcid.org/0000-0002-3406-1165"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. P. Campbell","raw_affiliation_strings":["Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078561472","display_name":"Richard G. Southwick","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. G. Southwick","raw_affiliation_strings":["Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023990409","display_name":"Kin P. Cheung","orcid":"https://orcid.org/0000-0003-2210-9907"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. P. Cheung","raw_affiliation_strings":["Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077991240","display_name":"A. S. Oates","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"A. S. Oates","raw_affiliation_strings":["TSMC Limited, Hsinchu, Taiwan","TSMC Ltd. Hsin-Chu, Taiwan 300-77, R.O.C"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TSMC Limited, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"TSMC Ltd. Hsin-Chu, Taiwan 300-77, R.O.C","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059975258","display_name":"H.\u2010S. Philip Wong","orcid":"https://orcid.org/0000-0002-0096-1472"},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.-S. P. Wong","raw_affiliation_strings":["Department of Electrical Engineering, Stanford University, Stanford, CA, USA","Department of Electrical Engineering, Stanford University Stanford, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Stanford University, Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]},{"raw_affiliation_string":"Department of Electrical Engineering, Stanford University Stanford, CA, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044786447","display_name":"John S. Suehle","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Suehle","raw_affiliation_strings":["Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Semiconductor Electronics Division, NIST, Gaithersburg, MD, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14486184,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7829934358596802},{"id":"https://openalex.org/keywords/simplicity","display_name":"Simplicity","score":0.7021015882492065},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7019343972206116},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6904985308647156},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.6352173089981079},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.4710127115249634},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4399900734424591},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4170437753200531},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4167725443840027},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20279231667518616},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2007083296775818}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7829934358596802},{"id":"https://openalex.org/C2776372474","wikidata":"https://www.wikidata.org/wiki/Q508291","display_name":"Simplicity","level":2,"score":0.7021015882492065},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7019343972206116},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6904985308647156},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.6352173089981079},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.4710127115249634},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4399900734424591},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4170437753200531},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4167725443840027},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20279231667518616},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2007083296775818},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2011.6044955","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2011.6044955","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 Proceedings of the ESSCIRC (ESSCIRC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1968007282","https://openalex.org/W1968564509","https://openalex.org/W2010419066","https://openalex.org/W2066647049","https://openalex.org/W2107547873","https://openalex.org/W2112214579","https://openalex.org/W2134788069","https://openalex.org/W2134861486","https://openalex.org/W2137085043","https://openalex.org/W6676725367"],"related_works":["https://openalex.org/W2368019753","https://openalex.org/W2333930193","https://openalex.org/W2737356002","https://openalex.org/W2246241526","https://openalex.org/W4210711561","https://openalex.org/W2389800961","https://openalex.org/W1995389502","https://openalex.org/W2040773997","https://openalex.org/W1975778413","https://openalex.org/W1975511343"],"abstract_inverted_index":{"Meeting":[0],"reliability":[1,20,50,77],"requirements":[2],"is":[3,60,87],"an":[4,96],"increasingly":[5],"more":[6],"difficult":[7],"challenge":[8],"with":[9],"each":[10],"generation":[11],"of":[12,26,34,42,56,75],"CMOS":[13],"technology.":[14],"The":[15,85,99],"disconnection":[16],"between":[17],"conventional":[18],"one-size-fits-all":[19],"specifications":[21],"and":[22,62],"the":[23,73],"wide":[24],"range":[25],"circuit":[27],"applications":[28],"might":[29],"be":[30],"a":[31,44,68,91,105],"huge":[32],"waste":[33],"resources.":[35],"By":[36],"taking":[37],"into":[38],"consideration":[39],"circuit-level":[40],"figures":[41],"merit,":[43],"novel":[45],"methodology":[46,66],"to":[47,94],"establish":[48],"device":[49],"criteria":[51],"that":[52],"reflects":[53],"real-world":[54],"operation":[55],"devices":[57],"in":[58],"circuits":[59],"proposed":[61],"demonstrated.":[63],"This":[64],"\u201ccircuit-aware\u201d":[65],"makes":[67,101],"real":[69],"step":[70],"toward":[71],"realizing":[72],"goal":[74],"application-aware":[76],"standards":[78],"which":[79],"do":[80],"not":[81],"require":[82],"additional":[83],"measurements.":[84],"beauty":[86],"its":[88],"simplicity":[89,100],"-":[90],"simple":[92],"transformation":[93],"solve":[95],"important":[97],"problem.":[98],"it":[102],"attractive":[103],"as":[104],"standard":[106],"methodology.":[107]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}