{"id":"https://openalex.org/W1993223480","doi":"https://doi.org/10.1109/esscirc.2010.5619836","title":"A 160×120-pixels range camera with on-pixel correlated double sampling and nonuniformity correction in 29.1µm pitch","display_name":"A 160×120-pixels range camera with on-pixel correlated double sampling and nonuniformity correction in 29.1µm pitch","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W1993223480","doi":"https://doi.org/10.1109/esscirc.2010.5619836","mag":"1993223480"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2010.5619836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2010.5619836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Proceedings of ESSCIRC","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088173332","display_name":"Matteo Perenzoni","orcid":"https://orcid.org/0000-0001-8777-1593"},"institutions":[{"id":"https://openalex.org/I2277624104","display_name":"Fondazione Bruno Kessler","ror":"https://ror.org/01j33xk10","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2277624104"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Perenzoni","raw_affiliation_strings":["Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]},{"raw_affiliation_string":"Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076468405","display_name":"Nicola Massari","orcid":"https://orcid.org/0000-0002-1863-4859"},"institutions":[{"id":"https://openalex.org/I2277624104","display_name":"Fondazione Bruno Kessler","ror":"https://ror.org/01j33xk10","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2277624104"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Nicola Massari","raw_affiliation_strings":["Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]},{"raw_affiliation_string":"Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111557995","display_name":"David Stoppa","orcid":null},"institutions":[{"id":"https://openalex.org/I2277624104","display_name":"Fondazione Bruno Kessler","ror":"https://ror.org/01j33xk10","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2277624104"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"David Stoppa","raw_affiliation_strings":["Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]},{"raw_affiliation_string":"Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010169715","display_name":"Lucio Pancheri","orcid":"https://orcid.org/0000-0002-3954-7308"},"institutions":[{"id":"https://openalex.org/I2277624104","display_name":"Fondazione Bruno Kessler","ror":"https://ror.org/01j33xk10","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2277624104"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Lucio Pancheri","raw_affiliation_strings":["Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]},{"raw_affiliation_string":"Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046358655","display_name":"Mattia Malfatti","orcid":null},"institutions":[{"id":"https://openalex.org/I2277624104","display_name":"Fondazione Bruno Kessler","ror":"https://ror.org/01j33xk10","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2277624104"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mattia Malfatti","raw_affiliation_strings":["Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]},{"raw_affiliation_string":"Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051603243","display_name":"L. Gonzo","orcid":null},"institutions":[{"id":"https://openalex.org/I2277624104","display_name":"Fondazione Bruno Kessler","ror":"https://ror.org/01j33xk10","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2277624104"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Lorenzo Gonzo","raw_affiliation_strings":["Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Materials and Microsystems, Fondazione Bruno Kessler (FBK), Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]},{"raw_affiliation_string":"Center for Materials and Microsystems, Fondazione Bruno Kessler Via Sommarive 18, I-38100, Trento, Italy","institution_ids":["https://openalex.org/I2277624104"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I2277624104"],"apc_list":null,"apc_paid":null,"fwci":2.7408,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.9134,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"294","last_page":"297"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.8487460613250732},{"id":"https://openalex.org/keywords/dot-pitch","display_name":"Dot pitch","score":0.7054932117462158},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6379303932189941},{"id":"https://openalex.org/keywords/fixed-pattern-noise","display_name":"Fixed-pattern noise","score":0.5757720470428467},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.564053475856781},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.5577260255813599},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5351719856262207},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.533595860004425},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.5117630958557129},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4982116222381592},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.4854050576686859},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.4345337152481079},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.42742565274238586},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3892452120780945},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.36390426754951477},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.33216506242752075},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2861559987068176},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2514920234680176},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1880318820476532},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1640317738056183},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1509677767753601},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10427340865135193},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09676915407180786},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.08813437819480896}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.8487460613250732},{"id":"https://openalex.org/C179813606","wikidata":"https://www.wikidata.org/wiki/Q2032861","display_name":"Dot pitch","level":3,"score":0.7054932117462158},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6379303932189941},{"id":"https://openalex.org/C2778368474","wikidata":"https://www.wikidata.org/wiki/Q5456322","display_name":"Fixed-pattern noise","level":3,"score":0.5757720470428467},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.564053475856781},{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.5577260255813599},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5351719856262207},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.533595860004425},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.5117630958557129},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4982116222381592},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.4854050576686859},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.4345337152481079},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.42742565274238586},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3892452120780945},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36390426754951477},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33216506242752075},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2861559987068176},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2514920234680176},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1880318820476532},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1640317738056183},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1509677767753601},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10427340865135193},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09676915407180786},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.08813437819480896},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/esscirc.2010.5619836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2010.5619836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Proceedings of ESSCIRC","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unitn.it:11572/33388","is_oa":false,"landing_page_url":"http://hdl.handle.net/11572/33388","pdf_url":null,"source":{"id":"https://openalex.org/S4306401913","display_name":"Institutional Research Information System (Universit\u00e0 degli Studi di Trento)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I193223587","host_organization_name":"University of Trento","host_organization_lineage":["https://openalex.org/I193223587"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8299999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1975328031","https://openalex.org/W2038643807","https://openalex.org/W2069791976","https://openalex.org/W2074214351"],"related_works":["https://openalex.org/W2331709517","https://openalex.org/W1990138130","https://openalex.org/W2359446242","https://openalex.org/W2105407355","https://openalex.org/W2136432653","https://openalex.org/W810815649","https://openalex.org/W2022493676","https://openalex.org/W2017656356","https://openalex.org/W1981955947","https://openalex.org/W1993223480"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,21,52],"design":[4],"and":[5,38,110],"test":[6],"of":[7,23,59,103,108,112],"a":[8,13,44,56,66,73,87,101,106],"CMOS":[9,92],"integrated":[10],"circuit":[11],"implementing":[12],"160\u00d7120-pixels":[14],"3D":[15,74],"camera.":[16],"The":[17,61,81,97],"on-pixel":[18],"processing":[19],"allows":[20,48],"use":[22],"Indirect":[24],"Time-Of-Flight":[25],"technique":[26],"for":[27],"distance":[28],"measurement":[29],"with":[30,94,105,123],"reset":[31],"noise":[32,41],"removal":[33],"through":[34],"Correlated":[35],"Double":[36],"Sampling":[37],"embedded":[39],"fixed-pattern":[40],"reduction,":[42],"while":[43],"fast":[45,67],"readout":[46],"operation":[47],"to":[49,71,77,118],"stream":[50],"out":[51],"pixels":[53],"values":[54],"at":[55,130],"maximum":[57],"rate":[58],"10MSample/s.":[60],"imager":[62],"can":[63],"operate":[64],"as":[65],"2D":[68],"camera":[69,75],"up":[70,76,117],"458fps,":[72],"80fps":[78],"or":[79],"both.":[80],"chip":[82],"has":[83,100],"been":[84,121],"fabricated":[85],"using":[86],"standard":[88],"0.18\u03bcm":[89],"1P4M":[90],"1.8V":[91],"technology":[93],"MIM":[95],"capacitors.":[96],"resulting":[98],"pixel":[99],"pitch":[102],"29.1\u03bcm":[104],"fill-factor":[107],"34%":[109],"consists":[111],"66":[113],"transistors.":[114],"Distance":[115],"measurements":[116],"4.5m":[119],"have":[120],"performed":[122],"pulsed":[124],"laser":[125],"light,":[126],"achieving":[127],"2.5cm":[128],"precision":[129],"2m":[131],"in":[132],"real-time.":[133]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}