{"id":"https://openalex.org/W1979593992","doi":"https://doi.org/10.1109/esscirc.2010.5619823","title":"Large full-well capacity stitched CMOS image sensor for high temperature applications","display_name":"Large full-well capacity stitched CMOS image sensor for high temperature applications","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W1979593992","doi":"https://doi.org/10.1109/esscirc.2010.5619823","mag":"1979593992"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2010.5619823","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2010.5619823","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Proceedings of ESSCIRC","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088135979","display_name":"Daniel Durini","orcid":"https://orcid.org/0000-0002-5979-1391"},"institutions":[{"id":"https://openalex.org/I4210100127","display_name":"Fraunhofer Institute for Microelectronic Circuits and Systems","ror":"https://ror.org/01243c877","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210100127","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer-Gesellschaft","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Daniel Durini","raw_affiliation_strings":["Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","institution_ids":["https://openalex.org/I4210100127"]},{"raw_affiliation_string":"[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]","institution_ids":["https://openalex.org/I4923324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088142165","display_name":"Frank Matheis","orcid":null},"institutions":[{"id":"https://openalex.org/I4210100127","display_name":"Fraunhofer Institute for Microelectronic Circuits and Systems","ror":"https://ror.org/01243c877","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210100127","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer-Gesellschaft","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Frank Matheis","raw_affiliation_strings":["Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","institution_ids":["https://openalex.org/I4210100127"]},{"raw_affiliation_string":"[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]","institution_ids":["https://openalex.org/I4923324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091162236","display_name":"Christian Nitta","orcid":null},"institutions":[{"id":"https://openalex.org/I4210100127","display_name":"Fraunhofer Institute for Microelectronic Circuits and Systems","ror":"https://ror.org/01243c877","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210100127","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer-Gesellschaft","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christian Nitta","raw_affiliation_strings":["Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","institution_ids":["https://openalex.org/I4210100127"]},{"raw_affiliation_string":"[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]","institution_ids":["https://openalex.org/I4923324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008175199","display_name":"W. Brockherde","orcid":"https://orcid.org/0000-0002-1952-5646"},"institutions":[{"id":"https://openalex.org/I4210100127","display_name":"Fraunhofer Institute for Microelectronic Circuits and Systems","ror":"https://ror.org/01243c877","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210100127","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer-Gesellschaft","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Werner Brockherde","raw_affiliation_strings":["Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","institution_ids":["https://openalex.org/I4210100127"]},{"raw_affiliation_string":"[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]","institution_ids":["https://openalex.org/I4923324"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042676691","display_name":"B.J. Hosticka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210100127","display_name":"Fraunhofer Institute for Microelectronic Circuits and Systems","ror":"https://ror.org/01243c877","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210100127","https://openalex.org/I4923324"]},{"id":"https://openalex.org/I4923324","display_name":"Fraunhofer-Gesellschaft","ror":"https://ror.org/05hkkdn48","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bedrich J. Hosticka","raw_affiliation_strings":["Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany","institution_ids":["https://openalex.org/I4210100127"]},{"raw_affiliation_string":"[Fraunhofer Institute for Microelectronic Circuits and Systems IMS, Duisburg, Germany]","institution_ids":["https://openalex.org/I4923324"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"130","last_page":"133"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-stitching","display_name":"Image stitching","score":0.8877143859863281},{"id":"https://openalex.org/keywords/reticle","display_name":"Reticle","score":0.8869071006774902},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.7266478538513184},{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.7021360397338867},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6925244331359863},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6281991004943848},{"id":"https://openalex.org/keywords/cmos-sensor","display_name":"CMOS sensor","score":0.5092048048973083},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5033695101737976},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4916418194770813},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41997504234313965},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3671348989009857},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1746085286140442}],"concepts":[{"id":"https://openalex.org/C29081049","wikidata":"https://www.wikidata.org/wiki/Q1364242","display_name":"Image stitching","level":2,"score":0.8877143859863281},{"id":"https://openalex.org/C146617872","wikidata":"https://www.wikidata.org/wiki/Q1391868","display_name":"Reticle","level":3,"score":0.8869071006774902},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.7266478538513184},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.7021360397338867},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6925244331359863},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6281991004943848},{"id":"https://openalex.org/C155512908","wikidata":"https://www.wikidata.org/wiki/Q210745","display_name":"CMOS sensor","level":3,"score":0.5092048048973083},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5033695101737976},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4916418194770813},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41997504234313965},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3671348989009857},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1746085286140442},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/esscirc.2010.5619823","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2010.5619823","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 Proceedings of ESSCIRC","raw_type":"proceedings-article"},{"id":"pmh:oai:fraunhofer.de:N-146241","is_oa":false,"landing_page_url":"http://publica.fraunhofer.de/documents/N-146241.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer IMS","raw_type":"Conference Paper"},{"id":"pmh:oai:publica.fraunhofer.de:publica/367572","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/367572","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6600000262260437}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2038858740","https://openalex.org/W2119253189","https://openalex.org/W2139450399","https://openalex.org/W2165173643","https://openalex.org/W6660291459"],"related_works":["https://openalex.org/W1983441360","https://openalex.org/W2331008491","https://openalex.org/W2070094114","https://openalex.org/W2792670813","https://openalex.org/W2553467462","https://openalex.org/W4292774867","https://openalex.org/W2803119265","https://openalex.org/W1979129154","https://openalex.org/W2106574814","https://openalex.org/W2125775971"],"abstract_inverted_index":{"A":[0,21],"novel":[1],"CMOS":[2,48],"pixel":[3,25],"architecture":[4],"is":[5],"presented,":[6],"which":[7],"fulfills":[8],"the":[9,36],"need":[10],"for":[11],"acquisition":[12],"of":[13],"very":[14],"high":[15,19],"photon":[16],"fluxes":[17],"at":[18],"temperatures.":[20],"buried":[22],"photodiode":[23],"based":[24],"structure":[26],"was":[27],"analysed":[28],"in":[29,44],"detail,":[30],"and":[31],"then":[32],"applied":[33],"to":[34],"fabricate":[35],"256":[37,39],"\u00d7":[38],"large":[40],"area":[41],"imager":[42],"sensor":[43],"a":[45],"standard":[46],"0.5\u03bcm":[47],"process":[49],"using":[50],"mask":[51],"reticle":[52],"stitching.":[53]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}