{"id":"https://openalex.org/W2137150229","doi":"https://doi.org/10.1109/esscirc.2008.4681796","title":"A fully integrated interface circuit for 1.5&amp;#x00B0;C accuracy temperature control and 130-dB dynamic-range read-out of MOX gas sensors","display_name":"A fully integrated interface circuit for 1.5&amp;#x00B0;C accuracy temperature control and 130-dB dynamic-range read-out of MOX gas sensors","publication_year":2008,"publication_date":"2008-09-01","ids":{"openalex":"https://openalex.org/W2137150229","doi":"https://doi.org/10.1109/esscirc.2008.4681796","mag":"2137150229"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2008.4681796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2008.4681796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2008 - 34th European Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029464276","display_name":"Andrea Lombardi","orcid":"https://orcid.org/0000-0002-0383-9579"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"A. Lombardi","raw_affiliation_strings":["Department of Electrical Engineering, University of PAVIA, Pavia, Italy","Dept. of Electr. Eng., Univ. of Pavia, Pavia"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of PAVIA, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Pavia, Pavia","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033904438","display_name":"M. Grassi","orcid":"https://orcid.org/0000-0003-1369-5369"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Grassi","raw_affiliation_strings":["Department of Electrical Engineering, University of PAVIA, Pavia, Italy","Dept. of Electr. Eng., Univ. of Pavia, Pavia"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of PAVIA, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Pavia, Pavia","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015951727","display_name":"Luca Bruno","orcid":"https://orcid.org/0000-0003-2710-1154"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Bruno","raw_affiliation_strings":["Department of Electrical Engineering, University of PAVIA, Pavia, Italy","Dept. of Electr. Eng., Univ. of Pavia, Pavia"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of PAVIA, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Pavia, Pavia","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012770413","display_name":"P. Malcovati","orcid":"https://orcid.org/0000-0001-6514-9672"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Malcovati","raw_affiliation_strings":["Department of Electrical Engineering, University of PAVIA, Pavia, Italy","Dept. of Electr. Eng., Univ. of Pavia, Pavia"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of PAVIA, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Pavia, Pavia","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038780136","display_name":"A. Bas\u00e7hirotto","orcid":"https://orcid.org/0000-0002-8844-5754"},"institutions":[{"id":"https://openalex.org/I66752286","display_name":"University of Milano-Bicocca","ror":"https://ror.org/01ynf4891","country_code":"IT","type":"education","lineage":["https://openalex.org/I66752286"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Baschirotto","raw_affiliation_strings":["Department of Physics, University of MILANO-BICOCCA, Milano, Italy","Dept. of Phys., Univ. of Milano-Bicocca, Milan"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of MILANO-BICOCCA, Milano, Italy","institution_ids":["https://openalex.org/I66752286"]},{"raw_affiliation_string":"Dept. of Phys., Univ. of Milano-Bicocca, Milan","institution_ids":["https://openalex.org/I66752286"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5029464276"],"corresponding_institution_ids":["https://openalex.org/I25217355"],"apc_list":null,"apc_paid":null,"fwci":0.9068,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.77248501,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"78","last_page":"81"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.6895261406898499},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6550654172897339},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5941994786262512},{"id":"https://openalex.org/keywords/wide-dynamic-range","display_name":"Wide dynamic range","score":0.5712999701499939},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5525158643722534},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46402719616889954},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.46148744225502014},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45988380908966064},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.44033554196357727},{"id":"https://openalex.org/keywords/high-dynamic-range","display_name":"High dynamic range","score":0.4388570785522461},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4377307891845703},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.4312620759010315},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4297621548175812},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.355293333530426},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.343524307012558},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.31963324546813965},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2132417857646942},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2063198685646057},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20290863513946533}],"concepts":[{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.6895261406898499},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6550654172897339},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5941994786262512},{"id":"https://openalex.org/C2776179129","wikidata":"https://www.wikidata.org/wiki/Q7998640","display_name":"Wide dynamic range","level":2,"score":0.5712999701499939},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5525158643722534},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46402719616889954},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.46148744225502014},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45988380908966064},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.44033554196357727},{"id":"https://openalex.org/C2780056265","wikidata":"https://www.wikidata.org/wiki/Q106239881","display_name":"High dynamic range","level":3,"score":0.4388570785522461},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4377307891845703},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.4312620759010315},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4297621548175812},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.355293333530426},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.343524307012558},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.31963324546813965},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2132417857646942},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2063198685646057},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20290863513946533},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/esscirc.2008.4681796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2008.4681796","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2008 - 34th European Solid-State Circuits Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:boa.unimib.it:10281/36613","is_oa":false,"landing_page_url":"http://hdl.handle.net/10281/36613","pdf_url":null,"source":{"id":"https://openalex.org/S4306401259","display_name":"BOA (University of Milano-Bicocca)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66752286","host_organization_name":"University of Milano-Bicocca","host_organization_lineage":["https://openalex.org/I66752286"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1497012103","https://openalex.org/W1976604202","https://openalex.org/W2113325567"],"related_works":["https://openalex.org/W2371190228","https://openalex.org/W2041213051","https://openalex.org/W2152030049","https://openalex.org/W2466475649","https://openalex.org/W2884377208","https://openalex.org/W3160342880","https://openalex.org/W3117066249","https://openalex.org/W1974564912","https://openalex.org/W2000742556","https://openalex.org/W2043206197"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,10,16,25,45,56,68,77,106,143],"complete":[4],"gas-sensing":[5],"chip.":[6],"It":[7],"consists":[8],"of":[9,24,41,47,60,74,79,130],"high-efficiency":[11],"temperature":[12,40],"control":[13],"loop":[14],"with":[15,55,97],"switching":[17,125],"power":[18,126,136],"stage":[19],"and":[20,23,91,123],"digital":[21],"set-point":[22],"wide-dynamic-range":[26],"interface":[27],"circuit":[28,64,122,140],"able":[29],"to":[30,95],"operate":[31],"without":[32,66],"calibration.":[33],"Measurements":[34],"results":[35],"show":[36],"that":[37],"the":[38,42,112,119,124,131,135,138],"controlled":[39],"sensor":[43,71],"over":[44,76],"range":[46,78],"250degC":[48],"exhibits":[49],"an":[50],"accuracy":[51],"better":[52],"than":[53],"1.5degC":[54],"maximum":[57],"peak-to-peak":[58],"ripple":[59],"1.0degC.":[61],"The":[62,86,101],"read-out":[63,121,139],"achieves,":[65],"calibration,":[67],"precision":[69,120],"in":[70,105],"resistance":[72],"measurement":[73],"2.65%":[75],"5.3":[80],"decades":[81],"(Dynamic":[82],"Range,":[83],"DR=138":[84],"dB).":[85],"overall":[87],"system":[88],"is":[89],"flexible":[90],"can":[92],"be":[93],"interfaced":[94],"sensors":[96],"different":[98],"fabrication":[99],"parameters.":[100],"prototype":[102],"chip,":[103],"designed":[104],"0.35-mum":[107],"CMOS":[108],"technology,":[109],"includes":[110],"on":[111],"same":[113],"10-mm":[114],"<sup":[115],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[117],"die":[118],"stage.":[127],"In":[128],"spite":[129],"interferences":[132],"produced":[133],"by":[134],"stage,":[137],"maintains":[141],"always":[142],"DR":[144],"performance":[145],"above":[146],"130":[147],"dB.":[148]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}