{"id":"https://openalex.org/W2165783150","doi":"https://doi.org/10.1109/esscirc.2007.4430294","title":"A fully integrated low EMI noise power supply technique for CMOS digital IC’s in automotive applications","display_name":"A fully integrated low EMI noise power supply technique for CMOS digital IC’s in automotive applications","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W2165783150","doi":"https://doi.org/10.1109/esscirc.2007.4430294","mag":"2165783150"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2007.4430294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430294","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102107326","display_name":"Junfeng Zhou","orcid":"https://orcid.org/0009-0005-7575-8734"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Junfeng Zhou","raw_affiliation_strings":["ESAT-MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076274517","display_name":"Wim Dehaene","orcid":"https://orcid.org/0000-0002-6792-7965"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dehaene","raw_affiliation_strings":["ESAT-MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, Katholieke Universiteit Leuven, Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"46","issue":null,"first_page":"264","last_page":"267"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.8419663906097412},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.6958648562431335},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6381387710571289},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5788283348083496},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5604074597358704},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5476258993148804},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5144522190093994},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4904572665691376},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.4662201702594757},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.457892507314682},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.4470238983631134},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.44630545377731323},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4306217432022095},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.43040287494659424},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36244720220565796},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.22816893458366394},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.20893517136573792},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1324460208415985}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.8419663906097412},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.6958648562431335},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6381387710571289},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5788283348083496},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5604074597358704},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5476258993148804},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5144522190093994},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4904572665691376},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4662201702594757},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.457892507314682},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.4470238983631134},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44630545377731323},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4306217432022095},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.43040287494659424},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36244720220565796},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.22816893458366394},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.20893517136573792},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1324460208415985},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2007.4430294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430294","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[{"id":"https://openalex.org/F4320327336","display_name":"Vlaamse regering","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1568895036","https://openalex.org/W1915742337","https://openalex.org/W2005287774","https://openalex.org/W2062526381","https://openalex.org/W2116136781","https://openalex.org/W2131917361"],"related_works":["https://openalex.org/W4253668092","https://openalex.org/W1606288604","https://openalex.org/W2535925839","https://openalex.org/W2110040930","https://openalex.org/W2095620981","https://openalex.org/W2132459794","https://openalex.org/W2321891808","https://openalex.org/W2123020187","https://openalex.org/W2116557256","https://openalex.org/W2772412684"],"abstract_inverted_index":{"A":[0],"circuit":[1,29,59],"design":[2],"technique":[3],"is":[4,7],"presented":[5],"which":[6],"able":[8],"to":[9],"suppress":[10,31],"large":[11],"EMI":[12],"(Electromagnetic":[13],"Inteference)":[14],"radiated":[15],"by":[16],"the":[17,27,57,63],"power":[18,64],"supply":[19,65],"lines.":[20],"Implemented":[21],"in":[22],"AMIS":[23],"0.35-\u00b5m":[24],"I3T80":[25],"Process,":[26],"proposed":[28],"can":[30],"maximum":[32],"35-dB":[33],"di/dt":[34],"noise":[35],"at":[36],"high":[37],"frequency":[38],"with":[39],"only":[40],"30-\u00b5A":[41],"quiescent":[42],"current":[43],"and":[44],"100":[45],"pF":[46],"output":[47],"capacitance":[48],"fully":[49],"integrated":[50],"on":[51],"chip.":[52],"Measurement":[53],"results":[54],"show":[55],"that":[56],"developed":[58],"techniques":[60],"significantly":[61],"improve":[62],"integrity.":[66]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}