{"id":"https://openalex.org/W4254141596","doi":"https://doi.org/10.1109/esscirc.2007.4430260","title":"Impact of stress on various circuit characteristics in 65nm PDSOI technology","display_name":"Impact of stress on various circuit characteristics in 65nm PDSOI technology","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W4254141596","doi":"https://doi.org/10.1109/esscirc.2007.4430260"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2007.4430260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430260","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058901460","display_name":"Sushant Suryagandh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sushant Suryagandh","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100751969","display_name":"Mayank Gupta","orcid":"https://orcid.org/0000-0002-8288-3665"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mayank Gupta","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101698318","display_name":"Zhiyuan Wu","orcid":"https://orcid.org/0000-0003-4746-2168"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhi-Yuan Wu","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039784086","display_name":"Srinath Krishnan","orcid":"https://orcid.org/0000-0002-6852-1924"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srinath Krishnan","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110451388","display_name":"M.M. Pelella","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mario Pelella","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049097923","display_name":"Jung-Suk Goo","orcid":"https://orcid.org/0000-0002-8170-2308"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jung-Suk Goo","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069578595","display_name":"Ciby Thuruthiyil","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ciby Thuruthiyil","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100879201","display_name":"Judy X. An","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Judy X. An","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006239143","display_name":"Brian Q. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brian Q. Chen","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024614534","display_name":"Niraj Subba","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Niraj Subba","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011000423","display_name":"Luis Zamudio","orcid":"https://orcid.org/0000-0003-0206-9493"},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Luis Zamudio","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039368125","display_name":"James Yonemura","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Yonemura","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003608153","display_name":"Ali B. Icel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210137977","display_name":"Advanced Micro Devices (United States)","ror":"https://ror.org/04kd6c783","country_code":"US","type":"company","lineage":["https://openalex.org/I4210137977"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ali B. Icel","raw_affiliation_strings":["Advanced Micro Devices, Inc., Sunnyvale, CA, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices, Inc., Sunnyvale, CA, USA","institution_ids":["https://openalex.org/I4210137977"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5058901460"],"corresponding_institution_ids":["https://openalex.org/I4210137977"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.45959603,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"233 236","issue":null,"first_page":"119","last_page":"122"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6268296241760254},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6172875761985779},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6011059284210205},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5265821814537048},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5024657249450684},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4824148416519165},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43132007122039795},{"id":"https://openalex.org/keywords/hysteresis","display_name":"Hysteresis","score":0.4310145974159241},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2678270637989044},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24804702401161194}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6268296241760254},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6172875761985779},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6011059284210205},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5265821814537048},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5024657249450684},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4824148416519165},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43132007122039795},{"id":"https://openalex.org/C123299182","wikidata":"https://www.wikidata.org/wiki/Q190837","display_name":"Hysteresis","level":2,"score":0.4310145974159241},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2678270637989044},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24804702401161194},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2007.4430260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430260","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307757","display_name":"Advanced Micro Devices","ror":"https://ror.org/04kd6c783"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2109334605","https://openalex.org/W2116557312","https://openalex.org/W2120974130","https://openalex.org/W2121003539"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2038858740","https://openalex.org/W2389800961","https://openalex.org/W1995389502"],"abstract_inverted_index":{"Logic":[0],"performance":[1,101],"is":[2,85],"improved":[3],"by":[4],"creating":[5],"more":[6],"stress":[7,17,42,65,95],"in":[8,11,22,30,73],"the":[9,39,44,62,75,88,100],"channel":[10],"advanced":[12],"CMOS":[13],"technologies.":[14],"Impact":[15],"of":[16,41,64,77,90,102],"on":[18,38,48,66],"different":[19],"circuit":[20,50],"blocks":[21,82],"a":[23,35],"microprocessor":[24],"chip":[25],"has":[26],"not":[27],"been":[28],"studied":[29],"detail.":[31],"This":[32],"paper":[33],"presents":[34],"comprehensive":[36],"study":[37],"effects":[40],"and":[43,55,80],"corresponding":[45],"process":[46,91],"steps":[47,92],"various":[49,103],"characteristics.":[51],"Analog":[52],"behavior,":[53],"hysteresis":[54],"noise":[56],"properties":[57],"are":[58],"investigated":[59],"to":[60],"understand":[61],"effect":[63],"them.":[67],"These":[68],"characteristics":[69],"play":[70],"important":[71],"roles":[72],"determining":[74],"performances":[76],"analog/phy,":[78],"I/O":[79],"PLL":[81],"respectively.":[83],"It":[84],"shown":[86],"that":[87],"type":[89],"used":[93],"for":[94],"optimization":[96],"can":[97],"significantly":[98],"alter":[99],"circuits.":[104]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}