{"id":"https://openalex.org/W3142343696","doi":"https://doi.org/10.1109/esscirc.2007.4430257","title":"Single-grain Si thin-film transistors for analog and RF circuit applications","display_name":"Single-grain Si thin-film transistors for analog and RF circuit applications","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W3142343696","doi":"https://doi.org/10.1109/esscirc.2007.4430257","mag":"3142343696"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2007.4430257","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430257","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108949176","display_name":"N. Saputra","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"N. Saputra","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111957683","display_name":"Mina Danesh","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"M. Danesh","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043531338","display_name":"Alessandro Baiano","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A. Baiano","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073553085","display_name":"Ryoichi Ishihara","orcid":"https://orcid.org/0000-0002-2114-4236"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"R. Ishihara","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108859315","display_name":"J.R. Long","orcid":"https://orcid.org/0009-0002-9654-3853"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"J. R. Long","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056240759","display_name":"J.W. Metselaar","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"J.W. Metselaar","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016137226","display_name":"C.I.M. Beenakker","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"C.I.M. Beenakker","raw_affiliation_strings":["Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009288063","display_name":"Nobuo Karaki","orcid":null},"institutions":[{"id":"https://openalex.org/I4210160285","display_name":"Epson Information Technology College","ror":"https://ror.org/0555yfc83","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210160285"]},{"id":"https://openalex.org/I4210139203","display_name":"Seiko Holdings (Japan)","ror":"https://ror.org/042n1zz26","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210139203"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Karaki","raw_affiliation_strings":["Frontier Device Research Center, Seiko-Epson Corporation, Nagano, Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Device Research Center, Seiko-Epson Corporation, Nagano, Japan","institution_ids":["https://openalex.org/I4210160285","https://openalex.org/I4210139203"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055538996","display_name":"Yasushi Hiroshima","orcid":"https://orcid.org/0000-0002-1216-5086"},"institutions":[{"id":"https://openalex.org/I4210160285","display_name":"Epson Information Technology College","ror":"https://ror.org/0555yfc83","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210160285"]},{"id":"https://openalex.org/I4210139203","display_name":"Seiko Holdings (Japan)","ror":"https://ror.org/042n1zz26","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210139203"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Hiroshima","raw_affiliation_strings":["Frontier Device Research Center, Seiko-Epson Corporation, Nagano, Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Device Research Center, Seiko-Epson Corporation, Nagano, Japan","institution_ids":["https://openalex.org/I4210160285","https://openalex.org/I4210139203"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102024223","display_name":"Satoshi Inoue","orcid":"https://orcid.org/0000-0003-1820-2703"},"institutions":[{"id":"https://openalex.org/I4210139203","display_name":"Seiko Holdings (Japan)","ror":"https://ror.org/042n1zz26","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210139203"]},{"id":"https://openalex.org/I4210160285","display_name":"Epson Information Technology College","ror":"https://ror.org/0555yfc83","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210160285"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"S. Inoue","raw_affiliation_strings":["Frontier Device Research Center, Seiko-Epson Corporation, Nagano, Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Device Research Center, Seiko-Epson Corporation, Nagano, Japan","institution_ids":["https://openalex.org/I4210160285","https://openalex.org/I4210139203"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5108949176"],"corresponding_institution_ids":["https://openalex.org/I98358874"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.42221183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"e87 c","issue":null,"first_page":"107","last_page":"110"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11272","display_name":"Nanowire Synthesis and Applications","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6191810369491577},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.5987995862960815},{"id":"https://openalex.org/keywords/cascode","display_name":"Cascode","score":0.5807278156280518},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5510207414627075},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.5323385000228882},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5294938683509827},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5254023671150208},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.47521907091140747},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4274919629096985},{"id":"https://openalex.org/keywords/power-supply-rejection-ratio","display_name":"Power supply rejection ratio","score":0.425453245639801},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3832990527153015},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.34787216782569885},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32299649715423584},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22295576333999634},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.08222177624702454}],"concepts":[{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6191810369491577},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5987995862960815},{"id":"https://openalex.org/C2775946640","wikidata":"https://www.wikidata.org/wiki/Q1735017","display_name":"Cascode","level":4,"score":0.5807278156280518},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5510207414627075},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.5323385000228882},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5294938683509827},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5254023671150208},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47521907091140747},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4274919629096985},{"id":"https://openalex.org/C15892472","wikidata":"https://www.wikidata.org/wiki/Q1482413","display_name":"Power supply rejection ratio","level":4,"score":0.425453245639801},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3832990527153015},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.34787216782569885},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32299649715423584},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22295576333999634},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.08222177624702454},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2007.4430257","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430257","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7400000095367432}],"awards":[],"funders":[{"id":"https://openalex.org/F4320309823","display_name":"Higher Education Research Promotion","ror":"https://ror.org/02wa0fq92"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1597620877","https://openalex.org/W1605817187","https://openalex.org/W2026934616","https://openalex.org/W2041573590","https://openalex.org/W2080240036","https://openalex.org/W2160425298","https://openalex.org/W4298400136"],"related_works":["https://openalex.org/W4386951392","https://openalex.org/W2360999909","https://openalex.org/W3031730253","https://openalex.org/W2117032336","https://openalex.org/W2071303151","https://openalex.org/W2099349139","https://openalex.org/W2367003539","https://openalex.org/W1974022164","https://openalex.org/W1971795881","https://openalex.org/W2079358085"],"abstract_inverted_index":{"Single-grain":[0],"(SG)":[1],"Si-TFTs":[2],"fabricated":[3],"inside":[4],"a":[5,31],"location-controlled":[6],"grain":[7],"have":[8],"SOI-like":[9],"performance.":[10],"To":[11],"validate":[12],"their":[13],"potential":[14],"for":[15],"circuit":[16,63,72],"application,":[17],"key":[18],"analog":[19],"and":[20,30,41],"RF":[21,62,69],"building":[22],"blocks":[23],"are":[24],"characterized.":[25],"An":[26,68],"operational":[27],"amplifier":[28,71],"(Opamp)":[29],"voltage":[32],"reference":[33],"(Vref)":[34],"demonstrate":[35],"DC":[36],"gain":[37],"of":[38,47],"50":[39,48],"dB":[40],"power":[42],"supply":[43],"rejection":[44],"ratio":[45],"(PSRR)":[46],"dB,":[49],"respectively.":[50],"With":[51],"f":[52],"<sub":[53],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[54],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">T</sub>":[55],"in":[56],"the":[57],"GHz":[58],"range,":[59],"SG-TFTs":[60],"enable":[61],"design":[64],"below":[65],"1":[66],"GHz.":[67],"cascode":[70],"is":[73],"demonstrated.":[74]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}