{"id":"https://openalex.org/W2103508010","doi":"https://doi.org/10.1109/esscirc.2007.4430251","title":"Smart sensor design: The art of compensation and cancellation","display_name":"Smart sensor design: The art of compensation and cancellation","publication_year":2007,"publication_date":"2007-09-01","ids":{"openalex":"https://openalex.org/W2103508010","doi":"https://doi.org/10.1109/esscirc.2007.4430251","mag":"2103508010"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2007.4430251","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430251","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029302924","display_name":"Kofi A. A. Makinwa","orcid":"https://orcid.org/0000-0002-2992-5467"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Kofi A.A. Makinwa","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","Delft Univ. of Technol., Delft#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Technol., Delft#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019433498","display_name":"Michiel A. P. Pertijs","orcid":"https://orcid.org/0000-0002-9891-4374"},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Michiel A.P. Pertijs","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","Delft Univ. of Technol., Delft#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Technol., Delft#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103536950","display_name":"Jeroen C. v.d. Meer","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Jeroen C. v.d. Meer","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","Delft Univ. of Technol., Delft#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Technol., Delft#TAB#","institution_ids":["https://openalex.org/I98358874"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091851429","display_name":"Johan H. Huijsing","orcid":null},"institutions":[{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Johan H. Huijsing","raw_affiliation_strings":["Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","Delft Univ. of Technol., Delft#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Instrumentation Laboratory, Delft University of Technnology, Delft, Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Delft Univ. of Technol., Delft#TAB#","institution_ids":["https://openalex.org/I98358874"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.233,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.91817415,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"76","last_page":"82"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6068520545959473},{"id":"https://openalex.org/keywords/intelligent-sensor","display_name":"Intelligent sensor","score":0.5476242303848267},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5312039256095886},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5096538066864014},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.46696168184280396},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.45761531591415405},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45238471031188965},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4467129707336426},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.42981240153312683},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4289338290691376},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.42002055048942566},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.18837660551071167},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1283746063709259},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09558358788490295}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6068520545959473},{"id":"https://openalex.org/C176563091","wikidata":"https://www.wikidata.org/wiki/Q669238","display_name":"Intelligent sensor","level":3,"score":0.5476242303848267},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5312039256095886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5096538066864014},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.46696168184280396},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.45761531591415405},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45238471031188965},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4467129707336426},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.42981240153312683},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4289338290691376},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.42002055048942566},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.18837660551071167},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1283746063709259},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09558358788490295},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2007.4430251","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2007.4430251","pdf_url":null,"source":{"id":"https://openalex.org/S4210191203","display_name":"Proceedings of ESSCIRC","issn_l":"1930-8833","issn":["1930-8833","2643-1319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2007 - 33rd European Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334893","display_name":"Stichting voor de Technische Wetenschappen","ror":"https://ror.org/057tq3593"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W48359723","https://openalex.org/W199595187","https://openalex.org/W649290676","https://openalex.org/W1501023598","https://openalex.org/W1521821956","https://openalex.org/W1529801014","https://openalex.org/W1571554264","https://openalex.org/W1592605254","https://openalex.org/W1700994606","https://openalex.org/W1732904346","https://openalex.org/W1970337270","https://openalex.org/W1983009518","https://openalex.org/W2055944305","https://openalex.org/W2082981272","https://openalex.org/W2085266412","https://openalex.org/W2101556294","https://openalex.org/W2107271589","https://openalex.org/W2107683251","https://openalex.org/W2110191162","https://openalex.org/W2112611349","https://openalex.org/W2121624218","https://openalex.org/W2135517713","https://openalex.org/W2149128480","https://openalex.org/W2162419995","https://openalex.org/W2162875321","https://openalex.org/W2179320093","https://openalex.org/W2620576027","https://openalex.org/W4237500539","https://openalex.org/W4247586331","https://openalex.org/W6629750240"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2538983634","https://openalex.org/W2495953643","https://openalex.org/W2171986175","https://openalex.org/W2800677388","https://openalex.org/W2089791793"],"abstract_inverted_index":{"Smart":[0],"sensors":[1,6,69,124],"are":[2,11,70,94],"systems":[3],"in":[4,20,50,115],"which":[5],"and":[7,63,103,118,132],"dedicated":[8],"interface":[9,34],"electronics":[10,35],"integrated":[12],"on":[13],"the":[14,21,26,109,116,126],"same":[15,22],"chip,":[16],"or":[17,85],"at":[18],"least":[19],"package.":[23],"Due":[24],"to":[25,74,82],"low-level":[27],"analog":[28],"output":[29],"of":[30,91,111,120,128],"typical":[31],"sensors,":[32],"designing":[33],"that":[36],"\"does":[37],"no":[38],"harm,\"":[39],"i.e.":[40],"does":[41],"not":[42],"impair":[43],"sensor":[44],"performance,":[45],"is":[46,58],"quite":[47,71],"challenging,":[48],"especially":[49],"today's":[51],"mainstream":[52],"CMOS":[53,123],"technology,":[54],"whose":[55],"inherent":[56],"precision":[57],"limited":[59],"by":[60],"I/f":[61],"noise":[62],"component":[64],"mismatch.":[65],"However,":[66],"since":[67],"most":[68],"slow":[72],"compared":[73],"transistors,":[75],"dynamic":[76,98,113],"techniques":[77,93,114],"can":[78],"often":[79],"be":[80],"used":[81],"trade":[83],"speed":[84],"bandwidth":[86],"for":[87,125],"higher":[88],"precision.":[89],"Examples":[90],"such":[92,112],"auto":[95],"zeroing,":[96],"chopping,":[97],"element":[99],"matching,":[100],"switched-capacitor":[101],"filtering":[102],"sigma-delta":[104],"modulation.":[105],"This":[106],"paper":[107],"describes":[108],"use":[110],"design":[117],"realization":[119],"state-of-the-art":[121],"smart":[122],"measurement":[127],"temperature,":[129],"wind":[130],"velocity":[131],"magnetic":[133],"field.":[134]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}