{"id":"https://openalex.org/W1601793939","doi":"https://doi.org/10.1109/esscirc.2003.1257215","title":"Minimizing inductive noise in system-on-a-chip with multiple power gating structures","display_name":"Minimizing inductive noise in system-on-a-chip with multiple power gating structures","publication_year":2004,"publication_date":"2004-07-20","ids":{"openalex":"https://openalex.org/W1601793939","doi":"https://doi.org/10.1109/esscirc.2003.1257215","mag":"1601793939"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2003.1257215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2003.1257215","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080332152","display_name":"Suhwan Kim","orcid":"https://orcid.org/0000-0001-9107-2963"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suhwan Kim","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J.Watson Research Center, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J.Watson Research Center, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029986931","display_name":"Stephen Kosonocky","orcid":"https://orcid.org/0009-0007-1656-8070"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.V. Kosonocky","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J.Watson Research Center, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J.Watson Research Center, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060017483","display_name":"D.R. Knebel","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.R. Knebel","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J.Watson Research Center, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J.Watson Research Center, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044532211","display_name":"Kevin Stawiasz","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Stawiasz","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J.Watson Research Center, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J.Watson Research Center, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002401242","display_name":"David F. Heidel","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Heidel","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J.Watson Research Center, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J.Watson Research Center, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089456569","display_name":"M. Immediato","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Immediato","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","IBM Thomas J.Watson Research Center, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM Thomas J.Watson Research Center, USA#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"635","last_page":"638"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-gating","display_name":"Power gating","score":0.9364054799079895},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6155837774276733},{"id":"https://openalex.org/keywords/gating","display_name":"Gating","score":0.5985523462295532},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5511226654052734},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5188911557197571},{"id":"https://openalex.org/keywords/power-domains","display_name":"Power domains","score":0.5037278532981873},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.49139657616615295},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4556972086429596},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.4319344460964203},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4187161922454834},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32809579372406006},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.3013656735420227},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13578444719314575},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12447381019592285},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06116807460784912}],"concepts":[{"id":"https://openalex.org/C2780700455","wikidata":"https://www.wikidata.org/wiki/Q7236515","display_name":"Power gating","level":4,"score":0.9364054799079895},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6155837774276733},{"id":"https://openalex.org/C194544171","wikidata":"https://www.wikidata.org/wiki/Q21105679","display_name":"Gating","level":2,"score":0.5985523462295532},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5511226654052734},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5188911557197571},{"id":"https://openalex.org/C16021271","wikidata":"https://www.wikidata.org/wiki/Q17152552","display_name":"Power domains","level":3,"score":0.5037278532981873},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49139657616615295},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4556972086429596},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.4319344460964203},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4187161922454834},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32809579372406006},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.3013656735420227},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13578444719314575},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12447381019592285},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06116807460784912},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C42407357","wikidata":"https://www.wikidata.org/wiki/Q521","display_name":"Physiology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2003.1257215","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2003.1257215","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1997896265","https://openalex.org/W2017370932","https://openalex.org/W2076469371","https://openalex.org/W2103123230","https://openalex.org/W2114621701","https://openalex.org/W2131121971","https://openalex.org/W2132406466","https://openalex.org/W2143171378","https://openalex.org/W2157080063","https://openalex.org/W4236166192","https://openalex.org/W6683155022"],"related_works":["https://openalex.org/W2259094912","https://openalex.org/W2149069958","https://openalex.org/W4247771894","https://openalex.org/W2008637670","https://openalex.org/W1987649265","https://openalex.org/W576646735","https://openalex.org/W2020434689","https://openalex.org/W2371329481","https://openalex.org/W2138778793","https://openalex.org/W1995006535"],"abstract_inverted_index":{"A":[0],"multiple":[1],"power":[2,8,13,23,31,54,87],"domain":[3,9],"strategy":[4],"in":[5,25,57,77],"which":[6,58],"each":[7],"has":[10],"an":[11,17,29],"independent":[12],"gating":[14,32,55],"structure":[15,33,56],"is":[16,40,61],"effective":[18],"means":[19],"for":[20],"reducing":[21],"leakage":[22],"consumption":[24],"a":[26,52],"system-on-a-chip.":[27],"During":[28],"individual":[30],"power-mode":[34],"transition,":[35],"however,":[36],"serious":[37],"inductive":[38,59],"noise":[39,60,90],"introduced":[41],"that":[42],"may":[43],"affect":[44],"normal":[45],"operation":[46],"of":[47,84],"neighboring":[48],"circuits.":[49],"We":[50],"present":[51],"novel":[53],"reduced":[62],"through":[63],"gradual":[64],"turn-on":[65],"and":[66],"turn-off":[67],"its":[68],"sleep":[69],"transistor.":[70],"Experimental":[71],"simulation":[72],"results":[73],"with":[74],"PowerSpice":[75],"fixtured":[76],"different":[78],"package":[79],"models":[80],"demonstrate":[81],"the":[82,85],"effectiveness":[83],"proposed":[86],"gate":[88],"switching":[89],"reduction":[91],"technique.":[92]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":9}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}