{"id":"https://openalex.org/W1505115718","doi":"https://doi.org/10.1109/esscirc.2003.1257188","title":"Phase frequency detectors for fast frequency acquisition in zero-dead-zone CPPLLs for mobile communication systems","display_name":"Phase frequency detectors for fast frequency acquisition in zero-dead-zone CPPLLs for mobile communication systems","publication_year":2004,"publication_date":"2004-07-20","ids":{"openalex":"https://openalex.org/W1505115718","doi":"https://doi.org/10.1109/esscirc.2003.1257188","mag":"1505115718"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2003.1257188","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2003.1257188","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016146037","display_name":"Kun-Seok Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kun-Seok Lee","raw_affiliation_strings":["RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036392653","display_name":"Byeong-Ha Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byeong-Ha Park","raw_affiliation_strings":["RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109851652","display_name":"Han-il Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Han-il Lee","raw_affiliation_strings":["RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029425118","display_name":"Min Jong Yoh","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Min Jong Yoh","raw_affiliation_strings":["RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RF P/J, System-lsi Division, Samsung Electronics Company Limited, Yongin si, Kyunggi, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Syst.-LSI Div., Samsung Electron., Kyounggi-Do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3735,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.87568833,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"525","last_page":"528"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-frequency-detector","display_name":"Phase frequency detector","score":0.8878905773162842},{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.7794159650802612},{"id":"https://openalex.org/keywords/frequency-synthesizer","display_name":"Frequency synthesizer","score":0.6991138458251953},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.6596406698226929},{"id":"https://openalex.org/keywords/dead-zone","display_name":"Dead zone","score":0.6373026371002197},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.5483341217041016},{"id":"https://openalex.org/keywords/phase-detector","display_name":"Phase detector","score":0.5363702774047852},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.533575713634491},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.510672390460968},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5089502334594727},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4709250330924988},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4681641757488251},{"id":"https://openalex.org/keywords/dead-time","display_name":"Dead time","score":0.4324139952659607},{"id":"https://openalex.org/keywords/automatic-frequency-control","display_name":"Automatic frequency control","score":0.4297822415828705},{"id":"https://openalex.org/keywords/local-oscillator","display_name":"Local oscillator","score":0.416472852230072},{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.3675863742828369},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.32061123847961426},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.2893701493740082},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2813341021537781},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25579833984375},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.0980091392993927}],"concepts":[{"id":"https://openalex.org/C2776158855","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase frequency detector","level":5,"score":0.8878905773162842},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.7794159650802612},{"id":"https://openalex.org/C182099602","wikidata":"https://www.wikidata.org/wiki/Q2660678","display_name":"Frequency synthesizer","level":4,"score":0.6991138458251953},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.6596406698226929},{"id":"https://openalex.org/C63840607","wikidata":"https://www.wikidata.org/wiki/Q1236263","display_name":"Dead zone","level":2,"score":0.6373026371002197},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.5483341217041016},{"id":"https://openalex.org/C110086884","wikidata":"https://www.wikidata.org/wiki/Q2085341","display_name":"Phase detector","level":3,"score":0.5363702774047852},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.533575713634491},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.510672390460968},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5089502334594727},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4709250330924988},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4681641757488251},{"id":"https://openalex.org/C159484563","wikidata":"https://www.wikidata.org/wiki/Q628723","display_name":"Dead time","level":2,"score":0.4324139952659607},{"id":"https://openalex.org/C25915539","wikidata":"https://www.wikidata.org/wiki/Q220786","display_name":"Automatic frequency control","level":2,"score":0.4297822415828705},{"id":"https://openalex.org/C203597036","wikidata":"https://www.wikidata.org/wiki/Q1238887","display_name":"Local oscillator","level":3,"score":0.416472852230072},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.3675863742828369},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.32061123847961426},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.2893701493740082},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2813341021537781},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25579833984375},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.0980091392993927},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2003.1257188","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2003.1257188","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC 2004 - 29th European Solid-State Circuits Conference (IEEE Cat. No.03EX705)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2108537242","https://openalex.org/W2116378667","https://openalex.org/W2126964272","https://openalex.org/W2490904451"],"related_works":["https://openalex.org/W3093724499","https://openalex.org/W2213169543","https://openalex.org/W2062737926","https://openalex.org/W4385624389","https://openalex.org/W3004553648","https://openalex.org/W2979324006","https://openalex.org/W2406632178","https://openalex.org/W1993254755","https://openalex.org/W4381745543","https://openalex.org/W2208087505"],"abstract_inverted_index":{"This":[0],"paper":[1],"introduces":[2],"a":[3,103,110],"new-type":[4],"phase-frequency-detector":[5],"(PFD)":[6],"for":[7,86],"charge":[8],"pump":[9],"phase-locked-loops":[10],"(CPPLLs).":[11],"As":[12],"the":[13,19,23,27,48,60,64,74,78,99],"PFD":[14,62,76,91],"is":[15,92],"configured":[16],"to":[17,38],"separate":[18],"reset":[20],"part":[21,25],"and":[22,44,94,98],"delay":[24,37],"independently,":[26],"input":[28],"signal":[29],"edge":[30],"data,":[31],"which":[32],"arrive":[33],"during":[34],"an":[35],"added":[36],"remove":[39],"dead-zone,":[40],"are":[41],"not":[42,46],"lost":[43],"do":[45],"output":[47],"wrong":[49],"information,":[50],"resulting":[51],"in":[52,77,109],"faster":[53],"locking":[54],"property.":[55],"The":[56,90],"experimental":[57],"results":[58],"of":[59,80],"proposed":[61],"show":[63],"reduced":[65],"frequency":[66,84,104],"acquisition":[67],"time":[68],"by":[69,96],"about":[70],"30%":[71],"compared":[72],"with":[73,102],"conventional":[75],"case":[79],"70MHz":[81],"voltage-controlled-oscillator":[82],"(VCO)":[83],"hopping":[85],"PCS":[87],"mobile":[88],"applications.":[89],"designed":[93],"simulated":[95],"SPECTRE":[97],"prototype,":[100],"together":[101],"synthesizer,":[105],"has":[106],"been":[107],"fabricated":[108],"0.5/spl":[111],"mu/m":[112],"BiCMOS":[113],"technology.":[114]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}