{"id":"https://openalex.org/W2131231281","doi":"https://doi.org/10.1109/esscir.2005.1541667","title":"Correlating PIN-photodetector with novel difference-integrator concept for rangefinding applications","display_name":"Correlating PIN-photodetector with novel difference-integrator concept for rangefinding applications","publication_year":2005,"publication_date":"2005-12-10","ids":{"openalex":"https://openalex.org/W2131231281","doi":"https://doi.org/10.1109/esscir.2005.1541667","mag":"2131231281"},"language":"en","primary_location":{"id":"doi:10.1109/esscir.2005.1541667","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscir.2005.1541667","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089225557","display_name":"Alexander Nemecek","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"A. Nemecek","raw_affiliation_strings":["Institute of Electrical Measurements and Circuit Design, University of Technology, Vienna, Vienna, Austria","Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol., Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Measurements and Circuit Design, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol., Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001547668","display_name":"K. Oberhauser","orcid":null},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"K. Oberhauser","raw_affiliation_strings":["Institute of Electrical Measurements and Circuit Design, University of Technology, Vienna, Vienna, Austria","Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol., Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Measurements and Circuit Design, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol., Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048460512","display_name":"Horst Zimmermann","orcid":"https://orcid.org/0000-0003-3221-0769"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"H. Zimmermann","raw_affiliation_strings":["Institute of Electrical Measurements and Circuit Design, University of Technology, Vienna, Vienna, Austria","Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol., Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electrical Measurements and Circuit Design, University of Technology, Vienna, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Inst. of Electr. Measurements & Circuit Design, Vienna Univ. of Technol., Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"491","last_page":"494"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.8232917785644531},{"id":"https://openalex.org/keywords/photodetector","display_name":"Photodetector","score":0.7929224967956543},{"id":"https://openalex.org/keywords/responsivity","display_name":"Responsivity","score":0.7563021779060364},{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.6054154634475708},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5464200377464294},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5117630958557129},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5080642700195312},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5026059150695801},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.4861716628074646},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.46816182136535645},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4665761888027191},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3748781085014343},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35954466462135315},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3047957420349121},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.25719642639160156},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2277495265007019},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17214885354042053},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14863502979278564}],"concepts":[{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.8232917785644531},{"id":"https://openalex.org/C23125352","wikidata":"https://www.wikidata.org/wiki/Q210765","display_name":"Photodetector","level":2,"score":0.7929224967956543},{"id":"https://openalex.org/C178889773","wikidata":"https://www.wikidata.org/wiki/Q7316011","display_name":"Responsivity","level":3,"score":0.7563021779060364},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.6054154634475708},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5464200377464294},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5117630958557129},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5080642700195312},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5026059150695801},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.4861716628074646},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.46816182136535645},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4665761888027191},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3748781085014343},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35954466462135315},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3047957420349121},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.25719642639160156},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2277495265007019},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17214885354042053},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14863502979278564},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscir.2005.1541667","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscir.2005.1541667","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2039261288","https://openalex.org/W2104079597","https://openalex.org/W2156652954","https://openalex.org/W2536084150","https://openalex.org/W2562404196"],"related_works":["https://openalex.org/W1963751660","https://openalex.org/W2986835734","https://openalex.org/W4367834319","https://openalex.org/W2594066644","https://openalex.org/W2476130132","https://openalex.org/W1994956462","https://openalex.org/W3008624128","https://openalex.org/W3024370153","https://openalex.org/W2886771153","https://openalex.org/W2607235087"],"abstract_inverted_index":{"Exploiting":[0],"the":[1,57,66,111],"benefits":[2],"of":[3,32,38,56,68,72,113,127],"PIN":[4,23],"photodiodes,":[5],"a":[6,10,18,30,95,124],"correlating":[7],"detector":[8],"and":[9,70],"novel":[11],"difference":[12],"integrator":[13],"concept":[14],"were":[15,52],"realized":[16,93],"in":[17,65,94,123],"single-chip":[19],"range-finder":[20],"solution.":[21],"The":[22,82,90],"photodetector":[24],"performing":[25],"already":[26],"internal":[27],"modulation":[28],"has":[29],"responsivity":[31],"R=0.30A/W":[33],"at":[34],"660nm.":[35],"A":[36],"bandwidth":[37],"f/sub":[39],"3dB/=250MHz":[40],"with":[41],"correlation":[42],"gates":[43],"on":[44,49],"thin":[45],"oxide,":[46],"respectively":[47],"500MHz":[48],"field":[50],"oxide":[51],"achieved.":[53],"Both":[54],"challenges":[55],"distance":[58],"measurement":[59,83],"-":[60,78],"high":[61],"sensitivity":[62],"for":[63,75],"signals":[64],"order":[67],"nW":[69],"accuracies":[71],"1.6%":[73],"(1.7%)":[74],"10m":[76],"(15m)":[77],"could":[79],"be":[80],"reached.":[81],"range":[84],"goes":[85],"from":[86],"20cm":[87],"to":[88],"15m.":[89],"chip":[91],"was":[92],"modified":[96],"0.6nm":[97],"BiCMOS":[98],"process.":[99],"Effective":[100],"pixel":[101],"size":[102],"is":[103],"/spl":[104,106,114,116,119,128],"sim/250":[105],"times/170/spl":[107],"mu/m/sup":[108,120],"2/":[109,121],"including":[110],"photoreceiver":[112],"sim/100":[115],"times/":[117],"100":[118],"resulting":[122],"fill":[125],"factor":[126],"sim/24%.":[129]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}