{"id":"https://openalex.org/W2141901300","doi":"https://doi.org/10.1109/emeit.2011.6023148","title":"ZnO-Bi<inf>2</inf>O<inf>3</inf>-based varistor ceramics prepared by direct high-energy ball milling of the dopants","display_name":"ZnO-Bi<inf>2</inf>O<inf>3</inf>-based varistor ceramics prepared by direct high-energy ball milling of the dopants","publication_year":2011,"publication_date":"2011-08-01","ids":{"openalex":"https://openalex.org/W2141901300","doi":"https://doi.org/10.1109/emeit.2011.6023148","mag":"2141901300"},"language":"en","primary_location":{"id":"doi:10.1109/emeit.2011.6023148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emeit.2011.6023148","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2011 International Conference on Electronic & Mechanical Engineering and Information Technology","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018013187","display_name":"Dong Xu","orcid":"https://orcid.org/0000-0003-1516-2603"},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dong Xu","raw_affiliation_strings":["Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, P.R. China","School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, P.R. China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China","institution_ids":["https://openalex.org/I115592961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100439502","display_name":"Biao Wang","orcid":"https://orcid.org/0000-0003-1089-1049"},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Biao Wang","raw_affiliation_strings":["School of Material Science and Engineering, Jiangsu University, Zhenjiang, P. R. China","School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, P. R. China","institution_ids":["https://openalex.org/I115592961"]},{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China","institution_ids":["https://openalex.org/I115592961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100892953","display_name":"Mingshuang Li","orcid":null},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingshuang Li","raw_affiliation_strings":["School of Material Science and Engineering, Jiangsu University, Zhenjiang, P. R. China","School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, P. R. China","institution_ids":["https://openalex.org/I115592961"]},{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China","institution_ids":["https://openalex.org/I115592961"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101831127","display_name":"Ye Xiao","orcid":"https://orcid.org/0000-0002-2711-7722"},"institutions":[{"id":"https://openalex.org/I115592961","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30","country_code":"CN","type":"education","lineage":["https://openalex.org/I115592961"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Ye","raw_affiliation_strings":["School of Material Science and Engineering, Jiangsu University, Zhenjiang, P. R. China","School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, P. R. China","institution_ids":["https://openalex.org/I115592961"]},{"raw_affiliation_string":"School of Material Science and Engineering, Jiangsu University, Zhenjiang, 212013, P. R. China","institution_ids":["https://openalex.org/I115592961"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29872927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"27","issue":null,"first_page":"713","last_page":"716"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dopant","display_name":"Dopant","score":0.746951699256897},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6912755370140076},{"id":"https://openalex.org/keywords/ceramic","display_name":"Ceramic","score":0.6816489696502686},{"id":"https://openalex.org/keywords/microstructure","display_name":"Microstructure","score":0.6323504447937012},{"id":"https://openalex.org/keywords/ball-mill","display_name":"Ball mill","score":0.5389412641525269},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.4888271689414978},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.45668211579322815},{"id":"https://openalex.org/keywords/varistor","display_name":"Varistor","score":0.4545324444770813},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.412957102060318},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40812748670578003},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34726816415786743},{"id":"https://openalex.org/keywords/mineralogy","display_name":"Mineralogy","score":0.32494083046913147},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.23845252394676208},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.22905290126800537},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.15713757276535034},{"id":"https://openalex.org/keywords/chromatography","display_name":"Chromatography","score":0.09212008118629456},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.09162604808807373},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06194370985031128}],"concepts":[{"id":"https://openalex.org/C191952053","wikidata":"https://www.wikidata.org/wiki/Q15119237","display_name":"Dopant","level":3,"score":0.746951699256897},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6912755370140076},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.6816489696502686},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.6323504447937012},{"id":"https://openalex.org/C132186339","wikidata":"https://www.wikidata.org/wiki/Q781139","display_name":"Ball mill","level":2,"score":0.5389412641525269},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4888271689414978},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.45668211579322815},{"id":"https://openalex.org/C58289394","wikidata":"https://www.wikidata.org/wiki/Q465115","display_name":"Varistor","level":3,"score":0.4545324444770813},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.412957102060318},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40812748670578003},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34726816415786743},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.32494083046913147},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23845252394676208},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.22905290126800537},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.15713757276535034},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.09212008118629456},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.09162604808807373},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06194370985031128},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emeit.2011.6023148","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emeit.2011.6023148","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of 2011 International Conference on Electronic & Mechanical Engineering and Information Technology","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1972718805","https://openalex.org/W1995836307","https://openalex.org/W2006766312","https://openalex.org/W2025976649","https://openalex.org/W2035779356","https://openalex.org/W2046560159","https://openalex.org/W2047317531","https://openalex.org/W2056847828","https://openalex.org/W2059167554","https://openalex.org/W2073993010","https://openalex.org/W2084938535","https://openalex.org/W2091020672","https://openalex.org/W2132237743","https://openalex.org/W2247711528"],"related_works":["https://openalex.org/W331242945","https://openalex.org/W4386380654","https://openalex.org/W2150802956","https://openalex.org/W2356988259","https://openalex.org/W2007394239","https://openalex.org/W2888278177","https://openalex.org/W2089279496","https://openalex.org/W2070705592","https://openalex.org/W2391938493","https://openalex.org/W2046139496"],"abstract_inverted_index":{"The":[0,20,48],"microstructure":[1],"and":[2,28,45,69],"electrical":[3,36,50],"properties":[4],"of":[5,15],"ZnO-Bi2O3-based":[6],"varistor":[7,21],"ceramics":[8,22],"prepared":[9],"by":[10,26,34],"direct":[11],"high-energy":[12],"ball":[13],"milling":[14],"the":[16,40,59],"dopants":[17],"were":[18,24,52],"studied.":[19],"samples":[23],"characterized":[25],"XRD":[27],"SEM":[29],"analysis,":[30],"as":[31,33,39],"well":[32],"dc":[35],"measurements,":[37],"such":[38],"nonlinearity":[41],"coefficients,":[42],"leakage":[43,70],"current":[44,71],"threshold":[46,60],"voltage.":[47],"best":[49],"characteristics":[51],"found":[53],"in":[54],"sample":[55],"P2,":[56],"which":[57],"exhibited":[58],"voltage":[61],"was":[62,67,72],"347":[63],"V/mm,":[64],"nonlinear":[65],"coefficient":[66],"39.2":[68],"0.18":[73],"\u03bcA.":[74]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}