{"id":"https://openalex.org/W4404101745","doi":"https://doi.org/10.1109/emccompo61192.2024.10742061","title":"Comprehensive Study of EMI Effects on Wireline Transceiver Systems: A review of silicon-proven techniques","display_name":"Comprehensive Study of EMI Effects on Wireline Transceiver Systems: A review of silicon-proven techniques","publication_year":2024,"publication_date":"2024-10-07","ids":{"openalex":"https://openalex.org/W4404101745","doi":"https://doi.org/10.1109/emccompo61192.2024.10742061"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo61192.2024.10742061","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"review","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021652779","display_name":"Mohit Singh Choudhary","orcid":"https://orcid.org/0000-0001-7269-8872"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Mohit Singh Choudhary","raw_affiliation_strings":["Indian Institute of Technology, Bombay,Department of Electrical Engineering,Mumbai,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Bombay,Department of Electrical Engineering,Mumbai,India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027098050","display_name":"Jean\u2010Michel Redout\u00e9","orcid":"https://orcid.org/0000-0001-9612-4312"},"institutions":[{"id":"https://openalex.org/I157674565","display_name":"University of Li\u00e8ge","ror":"https://ror.org/00afp2z80","country_code":"BE","type":"education","lineage":["https://openalex.org/I157674565"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jean Michel Redoute","raw_affiliation_strings":["University of Liége,Department of Electrical Engineering and Computer Science,Liége,Belgium"],"affiliations":[{"raw_affiliation_string":"University of Liége,Department of Electrical Engineering and Computer Science,Liége,Belgium","institution_ids":["https://openalex.org/I157674565"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029767607","display_name":"Maryam Shojaei Baghini","orcid":"https://orcid.org/0000-0001-6568-3736"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Maryam Shojaei Baghini","raw_affiliation_strings":["Indian Institute of Technology, Bombay,Department of Electrical Engineering,Mumbai,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology, Bombay,Department of Electrical Engineering,Mumbai,India","institution_ids":["https://openalex.org/I162827531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5021652779"],"corresponding_institution_ids":["https://openalex.org/I162827531"],"apc_list":null,"apc_paid":null,"fwci":0.2225,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.54858734,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"100","last_page":"105"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wireline","display_name":"Wireline","score":0.9908984303474426},{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.9324467182159424},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.7922025322914124},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.6383719444274902},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4715319275856018},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4526391923427582},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4462606906890869},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39762750267982483},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38437986373901367},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.25473088026046753},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1817604899406433},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.18076810240745544},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.08829724788665771},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.05479174852371216}],"concepts":[{"id":"https://openalex.org/C2776951270","wikidata":"https://www.wikidata.org/wiki/Q8026910","display_name":"Wireline","level":3,"score":0.9908984303474426},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.9324467182159424},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.7922025322914124},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.6383719444274902},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4715319275856018},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4526391923427582},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4462606906890869},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39762750267982483},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38437986373901367},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.25473088026046753},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1817604899406433},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.18076810240745544},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.08829724788665771},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.05479174852371216}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/emccompo61192.2024.10742061","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},{"id":"pmh:oai:orbi.ulg.ac.be:2268/329570","is_oa":false,"landing_page_url":"https://orbi.uliege.be/handle/2268/329570","pdf_url":null,"source":{"id":"https://openalex.org/S4306400651","display_name":"Open Repository and Bibliography (University of Li\u00e8ge)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I157674565","host_organization_name":"University of Li\u00e8ge","host_organization_lineage":["https://openalex.org/I157674565"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024 (2024); 2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Torino, Ita [Ita], 07-10-2024 => 09-10-2024","raw_type":"peer reviewed"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W595070222","https://openalex.org/W2094610271","https://openalex.org/W2096497332","https://openalex.org/W2120947873","https://openalex.org/W2166475192","https://openalex.org/W2291645509","https://openalex.org/W2555970619","https://openalex.org/W2562417671","https://openalex.org/W2614649841","https://openalex.org/W2768278868","https://openalex.org/W3033179812","https://openalex.org/W3033900407","https://openalex.org/W3164162644","https://openalex.org/W3200219099","https://openalex.org/W4250936563","https://openalex.org/W4376851456","https://openalex.org/W6945905208"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W2041511579","https://openalex.org/W1986241886","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W2018141764","https://openalex.org/W4385545073","https://openalex.org/W2005020230","https://openalex.org/W4391237117"],"abstract_inverted_index":{"This":[0],"research":[1],"paper":[2,29],"provides":[3],"an":[4],"extensive":[5],"examination":[6],"of":[7,47,73],"electromagnetic":[8,23],"interference":[9],"(EMI)":[10],"in":[11,25],"wireline":[12,51,75],"transceiver":[13,16,60],"systems.":[14,61,77],"Wireline":[15],"circuits":[17],"are":[18],"particularly":[19],"susceptible":[20],"to":[21,65],"undesired":[22],"waves":[24],"their":[26],"environment.":[27],"The":[28,62],"delves":[30],"into":[31,38],"a":[32],"mathematical":[33],"approach":[34],"for":[35],"incorporating":[36],"EMI":[37,48,69],"circuit":[39],"simulation":[40],"tools.":[41],"Additionally,":[42],"it":[43],"explores":[44],"the":[45,71],"impact":[46],"on":[49],"different":[50],"communication":[52,76],"systems,":[53],"such":[54],"as":[55],"LVDS,":[56],"CML,":[57],"and":[58],"PAM-4":[59],"goal":[63],"is":[64],"comprehensively":[66],"understand":[67],"how":[68],"affects":[70],"performance":[72],"these":[74]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}