{"id":"https://openalex.org/W4404102790","doi":"https://doi.org/10.1109/emccompo61192.2024.10742046","title":"Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform","display_name":"Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform","publication_year":2024,"publication_date":"2024-10-07","ids":{"openalex":"https://openalex.org/W4404102790","doi":"https://doi.org/10.1109/emccompo61192.2024.10742046"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo61192.2024.10742046","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111053880","display_name":"Antoine Duguet","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Antoine Duguet","raw_affiliation_strings":["Univ. Bordeaux, CNRS, Bordeaux INP, IMS UMR 5218,Talence,France,F-33400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, CNRS, Bordeaux INP, IMS UMR 5218,Talence,France,F-33400","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082951822","display_name":"Tristan Dubois","orcid":"https://orcid.org/0000-0002-2495-2976"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Tristan Dubois","raw_affiliation_strings":["Univ. Bordeaux, CNRS, Bordeaux INP, IMS UMR 5218,Talence,France,F-33400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, CNRS, Bordeaux INP, IMS UMR 5218,Talence,France,F-33400","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105758844","display_name":"Genevi\u00e8ve Duchamp","orcid":"https://orcid.org/0000-0003-4717-6508"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Genevi\u00e8ve Duchamp","raw_affiliation_strings":["Univ. Bordeaux, CNRS, Bordeaux INP, IMS UMR 5218,Talence,France,F-33400"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Bordeaux, CNRS, Bordeaux INP, IMS UMR 5218,Talence,France,F-33400","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012730585","display_name":"D. A. Hardy","orcid":"https://orcid.org/0000-0001-7782-2414"},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Hardy","raw_affiliation_strings":["Thales SIX GTS France SAS,Gennevilliers,France,92230"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales SIX GTS France SAS,Gennevilliers,France,92230","institution_ids":["https://openalex.org/I4210140930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5093032629","display_name":"Franck Salvador","orcid":null},"institutions":[{"id":"https://openalex.org/I4210140930","display_name":"Thales (France)","ror":"https://ror.org/04emwm605","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210140930"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Franck Salvador","raw_affiliation_strings":["Thales SIX GTS France SAS,Labège,France,31670"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Thales SIX GTS France SAS,Labège,France,31670","institution_ids":["https://openalex.org/I4210140930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5111053880"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I15057530","https://openalex.org/I4210160189"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21683062,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.8360000252723694,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.8360000252723694,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.7734000086784363,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.7134000062942505,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.7967606782913208},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5159026384353638},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.45595812797546387},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43935641646385193},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.4129073917865753},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4056563675403595},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3786325454711914},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3512304425239563},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3389977812767029},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22417235374450684},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0799599289894104}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.7967606782913208},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5159026384353638},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.45595812797546387},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43935641646385193},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.4129073917865753},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4056563675403595},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3786325454711914},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3512304425239563},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3389977812767029},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22417235374450684},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0799599289894104},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/emccompo61192.2024.10742046","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742046","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-05008882v1","is_oa":false,"landing_page_url":"https://hal.science/hal-05008882","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Oct 2024, Torino, Italy. ⟨10.1109/EMCCompo61192.2024.10742046⟩","raw_type":"Conference papers"},{"id":"pmh:oai:oskar-bordeaux.fr:20.500.12278/205724","is_oa":false,"landing_page_url":"https://oskar-bordeaux.fr/handle/20.500.12278/205724","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Communication dans un congr\u00e8s"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6800000071525574}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W50935046","https://openalex.org/W2009457240","https://openalex.org/W2152099125","https://openalex.org/W2770609544","https://openalex.org/W2770900658","https://openalex.org/W2896339549","https://openalex.org/W2913715209","https://openalex.org/W2943711806","https://openalex.org/W3152200530","https://openalex.org/W4220941499","https://openalex.org/W4287884196","https://openalex.org/W4302013972","https://openalex.org/W4387475319"],"related_works":["https://openalex.org/W1974895211","https://openalex.org/W2129841057","https://openalex.org/W3040712279","https://openalex.org/W2176409448","https://openalex.org/W2364769705","https://openalex.org/W2056136368","https://openalex.org/W2374664672","https://openalex.org/W4367555392","https://openalex.org/W2538520412","https://openalex.org/W2516623936"],"abstract_inverted_index":{"This":[0],"contribution":[1],"deals":[2],"with":[3],"the":[4,13,21],"electromagnetic":[5],"susceptibility":[6,14,19,32,46],"of":[7,15,20],"an":[8],"electronic":[9,22],"function":[10,23,35],"based":[11],"on":[12],"its":[16,30,45],"components.":[17],"The":[18,34],"has":[24,36],"been":[25,37],"measured":[26],"and":[27,48],"modeled":[28],"from":[29],"components\u2019":[31],"characterizations.":[33],"subjected":[38],"to":[39,43],"some":[40],"modulated":[41],"interferences":[42],"observe":[44],"behaviors":[47],"vulnerabilities.":[49]},"counts_by_year":[],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}