{"id":"https://openalex.org/W4404101727","doi":"https://doi.org/10.1109/emccompo61192.2024.10742044","title":"Evaluation of the Electromagnetic Emission of ICs Using Different Spread Spectrum Approaches","display_name":"Evaluation of the Electromagnetic Emission of ICs Using Different Spread Spectrum Approaches","publication_year":2024,"publication_date":"2024-10-07","ids":{"openalex":"https://openalex.org/W4404101727","doi":"https://doi.org/10.1109/emccompo61192.2024.10742044"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo61192.2024.10742044","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742044","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Marco Pfeifer","orcid":null},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Marco Pfeifer","raw_affiliation_strings":["Graz University of Technology,Institute of Electronics,Graz,Austria"],"affiliations":[{"raw_affiliation_string":"Graz University of Technology,Institute of Electronics,Graz,Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041759378","display_name":"Ko Odreitz","orcid":"https://orcid.org/0000-0002-1678-8061"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Ko Odreitz","raw_affiliation_strings":["Graz University of Technology,Institute of Electronics,Graz,Austria"],"affiliations":[{"raw_affiliation_string":"Graz University of Technology,Institute of Electronics,Graz,Austria","institution_ids":["https://openalex.org/I4092182"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047104236","display_name":"Bernd Deutschmann","orcid":"https://orcid.org/0000-0001-7973-6835"},"institutions":[{"id":"https://openalex.org/I4092182","display_name":"Graz University of Technology","ror":"https://ror.org/00d7xrm67","country_code":"AT","type":"education","lineage":["https://openalex.org/I4092182"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Bernd Deutschmann","raw_affiliation_strings":["Graz University of Technology,Institute of Electronics,Graz,Austria"],"affiliations":[{"raw_affiliation_string":"Graz University of Technology,Institute of Electronics,Graz,Austria","institution_ids":["https://openalex.org/I4092182"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4092182"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17119444,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"106","last_page":"110"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-spectrum","display_name":"Electromagnetic spectrum","score":0.5091142058372498},{"id":"https://openalex.org/keywords/spectrum","display_name":"Spectrum (functional analysis)","score":0.48149287700653076},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.4581621289253235},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.454912930727005},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4193817973136902},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3380630612373352},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3230275511741638},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27357912063598633},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1408425271511078}],"concepts":[{"id":"https://openalex.org/C155761240","wikidata":"https://www.wikidata.org/wiki/Q133139","display_name":"Electromagnetic spectrum","level":2,"score":0.5091142058372498},{"id":"https://openalex.org/C156778621","wikidata":"https://www.wikidata.org/wiki/Q1365748","display_name":"Spectrum (functional analysis)","level":2,"score":0.48149287700653076},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4581621289253235},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.454912930727005},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4193817973136902},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3380630612373352},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3230275511741638},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27357912063598633},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1408425271511078},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emccompo61192.2024.10742044","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742044","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4099999964237213}],"awards":[],"funders":[{"id":"https://openalex.org/F4320318209","display_name":"Silicon Austria Labs","ror":"https://ror.org/03b1qgn79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2006630962","https://openalex.org/W2124598373","https://openalex.org/W2138383709","https://openalex.org/W2248007009","https://openalex.org/W2541067084","https://openalex.org/W2744667522","https://openalex.org/W2779828498","https://openalex.org/W2987360085","https://openalex.org/W4312828490","https://openalex.org/W4387486171"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1632426050","https://openalex.org/W2375034536","https://openalex.org/W2115844176","https://openalex.org/W2327989369","https://openalex.org/W1589192924","https://openalex.org/W2374053153","https://openalex.org/W2519636358","https://openalex.org/W2154168811","https://openalex.org/W278880431"],"abstract_inverted_index":{"This":[0],"paper":[1],"examines":[2],"the":[3,12,18,37,52,58,68,105,108],"use":[4],"of":[5,23,40,60,99],"spread":[6,62],"spectrum":[7,63],"clocking":[8],"approaches":[9],"to":[10,29,50,85],"reduce":[11,51],"increasing":[13],"electromagnetic":[14],"emissions":[15,32],"caused":[16],"by":[17],"constantly":[19],"rising":[20],"switching":[21],"frequencies":[22],"modern":[24],"electronic":[25],"systems.":[26],"The":[27],"approach":[28],"reducing":[30],"these":[31],"is":[33],"based":[34,66],"on":[35,67,107],"spreading":[36],"spectral":[38],"power":[39],"a":[41,45,61,78],"narrowband":[42],"signal":[43,81],"over":[44],"certain":[46],"bandwidth":[47],"in":[48],"order":[49],"peak":[53],"amplitude.":[54],"We":[55],"will":[56,91],"compare":[57,104],"performance":[59],"clock":[64],"generator":[65],"random":[69],"method":[70],"with":[71,77,96],"one":[72],"using":[73],"simple":[74],"frequency":[75],"modulation":[76,80],"triangular":[79],"and":[82,103],"relate":[83],"it":[84],"their":[86],"theoretical":[87],"behavior.":[88],"Furthermore,":[89],"we":[90],"perform":[92],"CISPR-compliant":[93],"emission":[94],"measurements":[95],"different":[97],"detectors":[98],"an":[100],"EMI":[101],"receiver":[102],"influence":[106],"measurement":[109],"results.":[110]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}