{"id":"https://openalex.org/W4404102132","doi":"https://doi.org/10.1109/emccompo61192.2024.10742025","title":"Research and Application Progress on Electromagnetic Reliability of Integrated Circuits in the Past Decade","display_name":"Research and Application Progress on Electromagnetic Reliability of Integrated Circuits in the Past Decade","publication_year":2024,"publication_date":"2024-10-07","ids":{"openalex":"https://openalex.org/W4404102132","doi":"https://doi.org/10.1109/emccompo61192.2024.10742025"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo61192.2024.10742025","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062776373","display_name":"Ledong Chen","orcid":"https://orcid.org/0000-0002-9298-2675"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ledong Chen","raw_affiliation_strings":["National University of Defense Technology,College of Electronic Science,Changsha,China"],"affiliations":[{"raw_affiliation_string":"National University of Defense Technology,College of Electronic Science,Changsha,China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105792814","display_name":"Jianfei Wu","orcid":"https://orcid.org/0009-0006-4191-3000"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianfei Wu","raw_affiliation_strings":["National University of Defense Technology,College of Electronic Science,Changsha,China"],"affiliations":[{"raw_affiliation_string":"National University of Defense Technology,College of Electronic Science,Changsha,China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028328197","display_name":"Changlin Han","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changlin Han","raw_affiliation_strings":["National University of Defense Technology,College of Electronic Science,Changsha,China"],"affiliations":[{"raw_affiliation_string":"National University of Defense Technology,College of Electronic Science,Changsha,China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085867312","display_name":"Honghai Liu","orcid":"https://orcid.org/0000-0002-2880-4698"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honghai Liu","raw_affiliation_strings":["National University of Defense Technology,College of Electronic Science,Changsha,China"],"affiliations":[{"raw_affiliation_string":"National University of Defense Technology,College of Electronic Science,Changsha,China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108064895","display_name":"Xuesong Wang","orcid":"https://orcid.org/0000-0002-5327-1088"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuesong Wang","raw_affiliation_strings":["National University of Defense Technology,College of Electronic Science,Changsha,China"],"affiliations":[{"raw_affiliation_string":"National University of Defense Technology,College of Electronic Science,Changsha,China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011919524","display_name":"Jibin Liu","orcid":"https://orcid.org/0000-0003-0595-3962"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jibin Liu","raw_affiliation_strings":["National University of Defense Technology,College of Electronic Science,Changsha,China"],"affiliations":[{"raw_affiliation_string":"National University of Defense Technology,College of Electronic Science,Changsha,China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5062776373"],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17772234,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.37560001015663147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.37560001015663147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6226885318756104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5446914434432983},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5090734362602234},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4674457311630249},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.42337632179260254},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40916869044303894},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40295571088790894},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33346229791641235},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2679261565208435},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11004450917243958}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6226885318756104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5446914434432983},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5090734362602234},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4674457311630249},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.42337632179260254},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40916869044303894},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40295571088790894},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33346229791641235},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2679261565208435},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11004450917243958},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emccompo61192.2024.10742025","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/emccompo61192.2024.10742025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.47999998927116394,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1970005626","https://openalex.org/W2035883040","https://openalex.org/W2112774177","https://openalex.org/W2365858435","https://openalex.org/W2896838799","https://openalex.org/W2897039132","https://openalex.org/W2970963565","https://openalex.org/W3047146014","https://openalex.org/W3047709903","https://openalex.org/W3048902956","https://openalex.org/W3095711704","https://openalex.org/W3191549253","https://openalex.org/W3194510261","https://openalex.org/W3206019052","https://openalex.org/W3211082524","https://openalex.org/W4220991069","https://openalex.org/W4285230289","https://openalex.org/W4293029326","https://openalex.org/W4295037232","https://openalex.org/W4296914486","https://openalex.org/W4297802373","https://openalex.org/W4297984631","https://openalex.org/W4302014070","https://openalex.org/W4304468729","https://openalex.org/W4322577368","https://openalex.org/W4322706793","https://openalex.org/W4327643793","https://openalex.org/W4375947509","https://openalex.org/W4387753021","https://openalex.org/W4387918073"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Based":[0],"on":[1],"the":[2,11,17,37],"research":[3,23,45],"of":[4,25,42],"electromagnetic":[5],"reliability":[6],"(EMR)":[7],"related":[8],"articles":[9],"in":[10],"past":[12],"decade,":[13],"this":[14],"paper":[15],"reviews":[16],"influencing":[18],"factors,":[19],"evaluation":[20],"methods,":[21],"and":[22,27,33,39],"progress":[24],"EMR,":[26],"explores":[28],"possible":[29],"future":[30,40],"technological":[31],"applications":[32],"development":[34],"trends.":[35],"Finally,":[36],"challenges":[38],"prospects":[41],"current":[43],"EMR":[44],"were":[46],"analyzed.":[47]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}