{"id":"https://openalex.org/W2207616985","doi":"https://doi.org/10.1109/emccompo.2015.7358345","title":"Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz","display_name":"Experimental validation of the generalized accurate modelling method for system-level bulk current injection setups up to 1 GHz","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2207616985","doi":"https://doi.org/10.1109/emccompo.2015.7358345","mag":"2207616985"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo.2015.7358345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emccompo.2015.7358345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075437359","display_name":"Sergey Miropolsky","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Sergey Miropolsky","raw_affiliation_strings":["Infineon Technologies AG M\u00fcnchen, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040241920","display_name":"Stefan Jahn","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Jahn","raw_affiliation_strings":["Infineon Technologies AG M\u00fcnchen, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031042832","display_name":"Frank Klotz","orcid":"https://orcid.org/0000-0003-3316-3087"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Frank Klotz","raw_affiliation_strings":["Infineon Technologies AG M\u00fcnchen, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG M\u00fcnchen, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004106847","display_name":"Stephan Frei","orcid":"https://orcid.org/0000-0002-8917-3914"},"institutions":[{"id":"https://openalex.org/I200332995","display_name":"TU Dortmund University","ror":"https://ror.org/01k97gp34","country_code":"DE","type":"education","lineage":["https://openalex.org/I200332995"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stephan Frei","raw_affiliation_strings":["University of Technology Dortmund, Dortmund, Germany"],"affiliations":[{"raw_affiliation_string":"University of Technology Dortmund, Dortmund, Germany","institution_ids":["https://openalex.org/I200332995"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5075437359"],"corresponding_institution_ids":["https://openalex.org/I137594350"],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.6781186,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"49","issue":null,"first_page":"137","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5639854669570923},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5627120733261108},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5376800894737244},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47446638345718384},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4235888719558716},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.4186442196369171},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32118839025497437},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2759220004081726},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.24968227744102478},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13251718878746033}],"concepts":[{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5639854669570923},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5627120733261108},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5376800894737244},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47446638345718384},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4235888719558716},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.4186442196369171},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32118839025497437},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2759220004081726},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.24968227744102478},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13251718878746033},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emccompo.2015.7358345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emccompo.2015.7358345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1512679175","https://openalex.org/W1528809117","https://openalex.org/W1544032295","https://openalex.org/W1721244224","https://openalex.org/W2003552876","https://openalex.org/W2066609272","https://openalex.org/W2123745214","https://openalex.org/W2125080123","https://openalex.org/W2138634691","https://openalex.org/W2138925938","https://openalex.org/W2171353752","https://openalex.org/W2540368104","https://openalex.org/W2546812064","https://openalex.org/W2768936449","https://openalex.org/W6678760332"],"related_works":["https://openalex.org/W1982412832","https://openalex.org/W4244464241","https://openalex.org/W2384573129","https://openalex.org/W2351224547","https://openalex.org/W2358945257","https://openalex.org/W4318692582","https://openalex.org/W4368618351","https://openalex.org/W2542439796","https://openalex.org/W2006863447","https://openalex.org/W1632022671"],"abstract_inverted_index":{"A":[0],"small-signal":[1,71],"model":[2],"of":[3,59,73,91],"an":[4,37,52,65],"automotive":[5],"system-level":[6],"bulk":[7],"current":[8],"injection":[9],"(BCI)":[10],"setup":[11,94],"developed":[12],"with":[13,29],"a":[14,26,30,49,70],"generalized":[15],"accurate":[16],"method":[17],"shown":[18],"in":[19],"the":[20,43,60,92,96],"previous":[21],"publication":[22],"is":[23,83],"verified":[24],"on":[25],"case":[27],"study":[28],"demonstrator":[31],"EUT":[32,46,78],"module.":[33],"The":[34,56],"work":[35],"utilizes":[36],"equivalent":[38],"circuit":[39],"modelling":[40],"approach":[41],"for":[42,51],"floating":[44,77],"ungrounded":[45],"board":[47],"and":[48,69,89,109],"macromodel":[50],"active":[53],"DUT":[54],"IC.":[55],"simulation-based":[57],"prediction":[58,97],"BCI":[61,81,93],"test":[62],"results":[63],"using":[64],"IC":[66],"failure":[67],"threshold":[68],"simulation":[72],"RF":[74],"levels":[75],"at":[76],"module":[79],"under":[80],"tests":[82],"shown.":[84],"Due":[85],"to":[86,103,112],"high":[87],"accuracy":[88],"detail":[90],"model,":[95],"also":[98],"shows":[99],"very":[100],"good":[101],"correlation":[102],"real":[104],"measurement":[105],"data,":[106],"both":[107],"qualitatively":[108],"quantitatively,":[110],"up":[111],"1":[113],"GHz.":[114]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}