{"id":"https://openalex.org/W2219490574","doi":"https://doi.org/10.1109/emccompo.2015.7358344","title":"Near-field injection on a Safe System Basis Chip at silicon level","display_name":"Near-field injection on a Safe System Basis Chip at silicon level","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2219490574","doi":"https://doi.org/10.1109/emccompo.2015.7358344","mag":"2219490574"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo.2015.7358344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emccompo.2015.7358344","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110195842","display_name":"B. Vrignon","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B. Vrignon","raw_affiliation_strings":["Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086232892","display_name":"Adrien Doridant","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Doridant","raw_affiliation_strings":["Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082913547","display_name":"K. Abouda","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Abouda","raw_affiliation_strings":["Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002261943","display_name":"Yun Gao","orcid":"https://orcid.org/0000-0001-9416-1769"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Gao","raw_affiliation_strings":["Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085564290","display_name":"D. Pagnoux","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Pagnoux","raw_affiliation_strings":["Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054073828","display_name":"Tom\u00e1\u0161 Marek","orcid":"https://orcid.org/0000-0002-0288-2284"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Marek","raw_affiliation_strings":["Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog & Sensor Group, Freescale Semiconductor, Inc., Toulouse, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09826401,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"131","last_page":"136"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/near-and-far-field","display_name":"Near and far field","score":0.5770962238311768},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5462529063224792},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.49973297119140625},{"id":"https://openalex.org/keywords/electromagnetic-field","display_name":"Electromagnetic field","score":0.4833252429962158},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47797414660453796},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45529913902282715},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4163599908351898},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.4158351719379425},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36516550183296204},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29183298349380493},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.27328547835350037},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.19762283563613892},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.17327550053596497},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1538560688495636},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10914769768714905}],"concepts":[{"id":"https://openalex.org/C25227671","wikidata":"https://www.wikidata.org/wiki/Q13405516","display_name":"Near and far field","level":2,"score":0.5770962238311768},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5462529063224792},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.49973297119140625},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.4833252429962158},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47797414660453796},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45529913902282715},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4163599908351898},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.4158351719379425},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36516550183296204},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29183298349380493},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.27328547835350037},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.19762283563613892},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17327550053596497},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1538560688495636},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10914769768714905},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emccompo.2015.7358344","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emccompo.2015.7358344","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1564502360","https://openalex.org/W1975083678","https://openalex.org/W1997422266","https://openalex.org/W2019256144","https://openalex.org/W2076334307","https://openalex.org/W2293341893","https://openalex.org/W2623111721","https://openalex.org/W4298166821","https://openalex.org/W6644092466","https://openalex.org/W6738729033"],"related_works":["https://openalex.org/W3011831393","https://openalex.org/W2518845051","https://openalex.org/W2038256311","https://openalex.org/W2516241657","https://openalex.org/W2389680235","https://openalex.org/W2895059647","https://openalex.org/W2366625390","https://openalex.org/W2115046010","https://openalex.org/W2029264063","https://openalex.org/W3013631429"],"abstract_inverted_index":{"Near-field":[0],"injection":[1,49],"at":[2,31,56],"silicon":[3],"level":[4,33],"is":[5,74],"a":[6,51],"promising":[7],"method":[8],"for":[9],"various":[10],"areas":[11],"such":[12],"as":[13],"the":[14,25,36,39,66,77,85,91,102],"analysis":[15],"of":[16,38,47,65],"radiated":[17],"immunity":[18],"to":[19,23,35,75,82,100],"electromagnetic":[20],"disturbances.":[21],"Up":[22],"now,":[24],"research":[26],"has":[27],"been":[28],"mainly":[29],"focused":[30,62],"PCB":[32],"due":[34],"resolution":[37],"near-field":[40,48,95],"probe.":[41],"This":[42],"paper":[43],"presents":[44],"first":[45],"investigations":[46,60],"on":[50,63],"Safe":[52,87],"System":[53],"Basis":[54],"Chip":[55],"die":[57],"level.":[58],"The":[59,72],"are":[61],"one":[64],"regulators":[67],"included":[68],"in":[69],"this":[70],"IC.":[71],"goal":[73],"use":[76],"coupling":[78],"path":[79],"from":[80],"'ultra-high-radiation'":[81],"check":[83],"if":[84],"Fail":[86],"Machine":[88],"detects":[89],"correctly":[90],"regulator":[92],"failures":[93],"during":[94],"injection.":[96],"Moreover,":[97],"simulations":[98],"help":[99],"understand":[101],"failure":[103],"mechanism.":[104]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}