{"id":"https://openalex.org/W2537120176","doi":"https://doi.org/10.1109/emccompo.2013.6735186","title":"Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers","display_name":"Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollers","publication_year":2013,"publication_date":"2013-12-01","ids":{"openalex":"https://openalex.org/W2537120176","doi":"https://doi.org/10.1109/emccompo.2013.6735186","mag":"2537120176"},"language":"en","primary_location":{"id":"doi:10.1109/emccompo.2013.6735186","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emccompo.2013.6735186","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053058212","display_name":"Marco Cazzaniga","orcid":"https://orcid.org/0000-0002-8473-0574"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Marco Cazzaniga","raw_affiliation_strings":["Central CAD and Design Solutions, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"Central CAD and Design Solutions, Agrate Brianza, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036853622","display_name":"Patrice Joubert Doriol","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Patrice Joubert Doriol","raw_affiliation_strings":["Central CAD and Design Solutions, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"Central CAD and Design Solutions, Agrate Brianza, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051915262","display_name":"Aurora Sanna","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Aurora Sanna","raw_affiliation_strings":["Central CAD and Design Solutions, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"Central CAD and Design Solutions, Agrate Brianza, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110943279","display_name":"Emmanuel Blanc","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Emmanuel Blanc","raw_affiliation_strings":["Apache Design Inc., Grenoble, France"],"affiliations":[{"raw_affiliation_string":"Apache Design Inc., Grenoble, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104437581","display_name":"Valentino Liberali","orcid":"https://orcid.org/0000-0003-1333-6876"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Valentino Liberali","raw_affiliation_strings":["Dipartimento di Fisica, Universit\u00e0 degli Studi di Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Fisica, Universit\u00e0 degli Studi di Milano, Milano, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065985032","display_name":"Davide Pandini","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Davide Pandini","raw_affiliation_strings":["Central CAD and Design Solutions, Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"Central CAD and Design Solutions, Agrate Brianza, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5053058212"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7094,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.76630607,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"122","issue":null,"first_page":"129","last_page":"133"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.9001653790473938},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.7882497310638428},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.6504102349281311},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6443890333175659},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.6218986511230469},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5795514583587646},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.4968407452106476},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4911811053752899},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43469682335853577},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41679781675338745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38876375555992126},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3699023723602295},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3291286826133728},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3287457525730133},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07678419351577759}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.9001653790473938},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.7882497310638428},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.6504102349281311},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6443890333175659},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.6218986511230469},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5795514583587646},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.4968407452106476},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4911811053752899},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43469682335853577},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41679781675338745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38876375555992126},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3699023723602295},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3291286826133728},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3287457525730133},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07678419351577759},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/emccompo.2013.6735186","is_oa":false,"landing_page_url":"https://doi.org/10.1109/emccompo.2013.6735186","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1570177576","https://openalex.org/W2052122461","https://openalex.org/W2096912695","https://openalex.org/W2105423041","https://openalex.org/W2114756964","https://openalex.org/W2120082488","https://openalex.org/W2120155820","https://openalex.org/W2146229113","https://openalex.org/W2147374698","https://openalex.org/W2155590443","https://openalex.org/W2159758079","https://openalex.org/W2161691158","https://openalex.org/W3140285801","https://openalex.org/W6634326370"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W2018141764","https://openalex.org/W4385545073","https://openalex.org/W2163032211","https://openalex.org/W2947603830"],"abstract_inverted_index":{"Board-level":[0],"I/Os":[1,66,110],"signal":[2],"integrity":[3],"and":[4,15,18,24,41,111,143],"conducted":[5,55,136],"EMI":[6,56,137],"have":[7],"become":[8],"a":[9,19,164],"critical":[10],"concern":[11],"for":[12,33],"high-speed":[13],"circuit":[14],"package":[16],"designers,":[17],"major":[20],"element":[21],"of":[22,46,52,73,129,138,156],"performance":[23],"reliability":[25],"degradation":[26],"in":[27,31,163],"modern":[28],"electronic":[29],"systems,":[30],"particular":[32],"automotive":[34,141],"microcontrollers,":[35],"which":[36],"must":[37,86],"satisfy":[38],"stringent":[39],"low-EMI":[40],"noise":[42,61,83,99,131,149,162],"immunity":[43],"requirements.":[44],"One":[45],"the":[47,58,64,69,74,81,98,102,109,112,118,127,133,154,157],"most":[48],"detrimental":[49],"root":[50],"causes":[51],"I/O":[53,75,134],"signals":[54,135],"is":[57,79,97],"simultaneous":[59],"switching":[60,103],"generated":[62,100],"by":[63,101],"toggling":[65],"(SSO)":[67],"on":[68,132],"power":[70],"distribution":[71],"network":[72],"ring.":[76],"However,":[77],"this":[78,123],"not":[80],"only":[82],"source":[84],"that":[85,106],"be":[87],"considered.":[88],"In":[89,122],"fact,":[90],"an":[91,139],"often":[92],"overlooked":[93],"contributor":[94],"to":[95,108],"SSO":[96],"digital":[104],"core":[105],"propagates":[107],"noise-sensitive":[113],"on-chip":[114],"analog":[115],"circuitry":[116],"throughout":[117],"common":[119],"silicon":[120],"substrate.":[121],"work,":[124],"we":[125,144,152],"analyze":[126],"impact":[128],"substrate":[130,161],"industrial":[140],"microcontroller,":[142],"compare":[145],"it":[146],"against":[147,160],"other":[148],"sources.":[150],"Moreover,":[151],"demonstrate":[153],"effectiveness":[155],"technological":[158],"protections":[159],"leading-edge":[165],"technology.":[166]},"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}