{"id":"https://openalex.org/W4405491355","doi":"https://doi.org/10.1109/embc53108.2024.10781663","title":"Analysis of Electrochemical Impedance Spectroscopy Data for Sputtered Iridium Oxide Electrodes","display_name":"Analysis of Electrochemical Impedance Spectroscopy Data for Sputtered Iridium Oxide Electrodes","publication_year":2024,"publication_date":"2024-07-15","ids":{"openalex":"https://openalex.org/W4405491355","doi":"https://doi.org/10.1109/embc53108.2024.10781663","pmid":"https://pubmed.ncbi.nlm.nih.gov/40039426"},"language":"en","primary_location":{"id":"doi:10.1109/embc53108.2024.10781663","is_oa":false,"landing_page_url":"https://doi.org/10.1109/embc53108.2024.10781663","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 46th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC12849238/","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089682590","display_name":"Henry M. Lutz","orcid":"https://orcid.org/0000-0002-9454-0248"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Henry M. Lutz","raw_affiliation_strings":["University of Florida,Department of Chemical Engineering,Gainesville,Florida,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Florida,Department of Chemical Engineering,Gainesville,Florida,USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063745811","display_name":"Yupeng Wu","orcid":"https://orcid.org/0009-0001-4717-5217"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yupeng Wu","raw_affiliation_strings":["The University of Texas at Dallas,Department of Material Science Engineering,Richardson,Texas,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"The University of Texas at Dallas,Department of Material Science Engineering,Richardson,Texas,USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5094187123","display_name":"Cynthia C. Eluagu","orcid":"https://orcid.org/0009-0006-3857-8336"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cynthia C. Eluagu","raw_affiliation_strings":["University of Florida,Department of Chemical Engineering,Gainesville,Florida,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Florida,Department of Chemical Engineering,Gainesville,Florida,USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051829003","display_name":"Stuart F. Cogan","orcid":"https://orcid.org/0000-0001-6316-3032"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stuart F. Cogan","raw_affiliation_strings":["University of Texas at Dallas,Department of Material Science Engineering,Richardson,Texas,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Texas at Dallas,Department of Material Science Engineering,Richardson,Texas,USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019075609","display_name":"Kevin J. Otto","orcid":"https://orcid.org/0000-0002-2317-6194"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kevin J. Otto","raw_affiliation_strings":["University of Florida,J. Crayton Pruitt Family Department of Biomedical Engineering,Gainesville,Florida,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Florida,J. Crayton Pruitt Family Department of Biomedical Engineering,Gainesville,Florida,USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085356105","display_name":"Mark E. Orazem","orcid":"https://orcid.org/0000-0003-3668-7767"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark E. Orazem","raw_affiliation_strings":["University of Florida,Department of Chemical Engineering,Gainesville,Florida,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Florida,Department of Chemical Engineering,Gainesville,Florida,USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.5106,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.91850594,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"2024","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10660","display_name":"Conducting polymers and applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric-spectroscopy","display_name":"Dielectric spectroscopy","score":0.7406214475631714},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.6525512933731079},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6338096261024475},{"id":"https://openalex.org/keywords/iridium","display_name":"Iridium","score":0.5960850715637207},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5474626421928406},{"id":"https://openalex.org/keywords/electrochemistry","display_name":"Electrochemistry","score":0.5106423497200012},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.4542369246482849},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4325111210346222},{"id":"https://openalex.org/keywords/spectroscopy","display_name":"Spectroscopy","score":0.4178485572338104},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.34515053033828735},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21392866969108582},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.18104207515716553},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.11607444286346436},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08576151728630066},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.060539454221725464}],"concepts":[{"id":"https://openalex.org/C7040849","wikidata":"https://www.wikidata.org/wiki/Q899580","display_name":"Dielectric spectroscopy","level":4,"score":0.7406214475631714},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.6525512933731079},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6338096261024475},{"id":"https://openalex.org/C528581852","wikidata":"https://www.wikidata.org/wiki/Q877","display_name":"Iridium","level":3,"score":0.5960850715637207},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5474626421928406},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.5106423497200012},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.4542369246482849},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4325111210346222},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.4178485572338104},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.34515053033828735},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21392866969108582},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.18104207515716553},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.11607444286346436},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08576151728630066},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.060539454221725464},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C161790260","wikidata":"https://www.wikidata.org/wiki/Q82264","display_name":"Catalysis","level":2,"score":0.0}],"mesh":[{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004867","descriptor_name":"Equipment Design","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D007495","descriptor_name":"Iridium","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D007495","descriptor_name":"Iridium","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D007495","descriptor_name":"Iridium","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D007495","descriptor_name":"Iridium","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D007495","descriptor_name":"Iridium","qualifier_ui":"Q000737","qualifier_name":"chemistry","is_major_topic":true},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000295","qualifier_name":"instrumentation","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true},{"descriptor_ui":"D058266","descriptor_name":"Dielectric Spectroscopy","qualifier_ui":"Q000379","qualifier_name":"methods","is_major_topic":true}],"locations_count":3,"locations":[{"id":"doi:10.1109/embc53108.2024.10781663","is_oa":false,"landing_page_url":"https://doi.org/10.1109/embc53108.2024.10781663","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 46th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)","raw_type":"proceedings-article"},{"id":"pmid:40039426","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/40039426","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE Engineering in Medicine and Biology Society. Annual International Conference","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:12849238","is_oa":true,"landing_page_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC12849238/","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Annu Int Conf IEEE Eng Med Biol Soc","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:pubmedcentral.nih.gov:12849238","is_oa":true,"landing_page_url":"https://pmc.ncbi.nlm.nih.gov/articles/PMC12849238/","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Annu Int Conf IEEE Eng Med Biol Soc","raw_type":"Text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1238691423","display_name":null,"funder_award_id":"U01 NS126052","funder_id":"https://openalex.org/F4320337359","funder_display_name":"National Institute of Neurological Disorders and Stroke"}],"funders":[{"id":"https://openalex.org/F4320337359","display_name":"National Institute of Neurological Disorders and Stroke","ror":"https://ror.org/01s5ya894"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W208403361","https://openalex.org/W2076300497","https://openalex.org/W2113090582","https://openalex.org/W2117874209","https://openalex.org/W2164072937","https://openalex.org/W2965735997","https://openalex.org/W2982587194","https://openalex.org/W3041372930","https://openalex.org/W4220764462","https://openalex.org/W4224939003","https://openalex.org/W4229458577","https://openalex.org/W4299392305","https://openalex.org/W4302377383","https://openalex.org/W4381884352"],"related_works":["https://openalex.org/W2525658103","https://openalex.org/W2110546888","https://openalex.org/W2914669799","https://openalex.org/W2486993578","https://openalex.org/W1817159635","https://openalex.org/W1577134444","https://openalex.org/W2068623945","https://openalex.org/W4243773385","https://openalex.org/W2050511751","https://openalex.org/W3209857138"],"abstract_inverted_index":{"The":[0,33,92,101],"measurement":[1],"model":[2,65,88,94],"program":[3],"from":[4,27,109],"Watson":[5],"and":[6,76,121],"Orazem":[7],"was":[8,40,66],"used":[9,36],"to":[10,29,43,114],"analyze":[11],"electrochemical":[12],"impedance":[13,57,71],"spectroscopy":[14],"(EIS)":[15],"data":[16,60],"for":[17,37],"sputtered":[18],"iridium":[19],"oxide":[20],"film":[21],"(SIROF)":[22],"micro-electrodes":[23],"at":[24,53],"potentials":[25],"ranging":[26],"-0.4":[28,112],"0.6":[30],"V":[31,113],"(Ag/AgCl).":[32],"frequency":[34],"range":[35],"the":[38,47,55,59,70,73,77,85,105],"analysis":[39],"that":[41,68],"determined":[42],"be":[44],"consistent":[45],"with":[46],"Kramers\u2013Kronig":[48],"relations.":[49],"In":[50],"addition,":[51],"frequencies":[52],"which":[54],"ohmic":[56],"influenced":[58],"were":[61],"truncated.":[62],"An":[63],"interpretation":[64],"developed":[67],"considered":[69],"of":[72,79,89,104,117],"bare":[74],"surface":[75],"contribution":[78],"a":[80,115],"porous":[81,90],"component,":[82],"based":[83],"on":[84],"de":[86],"Levie":[87],"electrodes.":[91],"proposed":[93],"fit":[95],"all":[96],"36":[97],"EIS":[98],"spectra":[99],"well.":[100],"effective":[102],"capacitance":[103],"SIROF":[106],"system":[107],"ranged":[108],"17,000":[110],"\u03bcF/cm2at":[111,119],"maximum":[116],"30,000":[118],"0.2":[120],"0.4":[122],"V.":[123]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2025-10-10T00:00:00"}