{"id":"https://openalex.org/W4295431583","doi":"https://doi.org/10.1109/embc48229.2022.9871552","title":"Split electrodes for electrical-conductivity-based tissue discrimination","display_name":"Split electrodes for electrical-conductivity-based tissue discrimination","publication_year":2022,"publication_date":"2022-07-11","ids":{"openalex":"https://openalex.org/W4295431583","doi":"https://doi.org/10.1109/embc48229.2022.9871552","pmid":"https://pubmed.ncbi.nlm.nih.gov/36085975"},"language":"en","primary_location":{"id":"doi:10.1109/embc48229.2022.9871552","is_oa":false,"landing_page_url":"https://doi.org/10.1109/embc48229.2022.9871552","pdf_url":null,"source":{"id":"https://openalex.org/S4363607706","display_name":"2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083735683","display_name":"G\u00fcrkan Y\u0131lmaz","orcid":"https://orcid.org/0000-0001-6432-1143"},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Gurkan Yilmaz","raw_affiliation_strings":["CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002"],"affiliations":[{"raw_affiliation_string":"CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102753196","display_name":"Fabian Braun","orcid":"https://orcid.org/0000-0002-0864-2804"},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Fabian Braun","raw_affiliation_strings":["CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002"],"affiliations":[{"raw_affiliation_string":"CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045871735","display_name":"Andy Adler","orcid":"https://orcid.org/0000-0002-2312-5346"},"institutions":[{"id":"https://openalex.org/I67031392","display_name":"Carleton University","ror":"https://ror.org/02qtvee93","country_code":"CA","type":"education","lineage":["https://openalex.org/I67031392"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Andy Adler","raw_affiliation_strings":["Carleton University,Ottawa,Canada","Carleton University, Ottawa, Canada"],"affiliations":[{"raw_affiliation_string":"Carleton University,Ottawa,Canada","institution_ids":["https://openalex.org/I67031392"]},{"raw_affiliation_string":"Carleton University, Ottawa, Canada","institution_ids":["https://openalex.org/I67031392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000727598","display_name":"Antonio Moreira De Sousa","orcid":null},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Antonio Moreira De Sousa","raw_affiliation_strings":["CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002"],"affiliations":[{"raw_affiliation_string":"CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110949548","display_name":"Damien Ferrario","orcid":null},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Damien Ferrario","raw_affiliation_strings":["CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002"],"affiliations":[{"raw_affiliation_string":"CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005466925","display_name":"Mathieu Lemay","orcid":"https://orcid.org/0000-0001-8082-973X"},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Mathieu Lemay","raw_affiliation_strings":["CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002"],"affiliations":[{"raw_affiliation_string":"CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002","institution_ids":["https://openalex.org/I135218257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028177111","display_name":"Olivier Ch\u00e9telat","orcid":null},"institutions":[{"id":"https://openalex.org/I135218257","display_name":"Swiss Center for Electronics and Microtechnology (Switzerland)","ror":"https://ror.org/05nrrsx06","country_code":"CH","type":"company","lineage":["https://openalex.org/I135218257"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Olivier Chetelat","raw_affiliation_strings":["CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002"],"affiliations":[{"raw_affiliation_string":"CSEM, Centre Suisse d 'Electronique et de Microtechnique SA,Neuchatel,Switzerland,2002","institution_ids":["https://openalex.org/I135218257"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5083735683"],"corresponding_institution_ids":["https://openalex.org/I135218257"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11495006,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2022","issue":null,"first_page":"1266","last_page":"1269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11700","display_name":"Hemodynamic Monitoring and Therapy","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2746","display_name":"Surgery"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9800999760627747,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.8147184252738953},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.7454153895378113},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.660649299621582},{"id":"https://openalex.org/keywords/rotation","display_name":"Rotation (mathematics)","score":0.6418104767799377},{"id":"https://openalex.org/keywords/biomedical-engineering","display_name":"Biomedical engineering","score":0.552436888217926},{"id":"https://openalex.org/keywords/drilling","display_name":"Drilling","score":0.5464656352996826},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5057978630065918},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.4818171560764313},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4683600962162018},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4554048478603363},{"id":"https://openalex.org/keywords/trajectory","display_name":"Trajectory","score":0.4499991834163666},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.41611504554748535},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.38918715715408325},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3691629469394684},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.196507066488266},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15548014640808105},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1422160565853119},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12391585111618042},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.08761519193649292}],"concepts":[{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.8147184252738953},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.7454153895378113},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.660649299621582},{"id":"https://openalex.org/C74050887","wikidata":"https://www.wikidata.org/wiki/Q848368","display_name":"Rotation (mathematics)","level":2,"score":0.6418104767799377},{"id":"https://openalex.org/C136229726","wikidata":"https://www.wikidata.org/wiki/Q327092","display_name":"Biomedical engineering","level":1,"score":0.552436888217926},{"id":"https://openalex.org/C25197100","wikidata":"https://www.wikidata.org/wiki/Q890886","display_name":"Drilling","level":2,"score":0.5464656352996826},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5057978630065918},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.4818171560764313},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4683600962162018},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4554048478603363},{"id":"https://openalex.org/C13662910","wikidata":"https://www.wikidata.org/wiki/Q193139","display_name":"Trajectory","level":2,"score":0.4499991834163666},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.41611504554748535},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.38918715715408325},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3691629469394684},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.196507066488266},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15548014640808105},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1422160565853119},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12391585111618042},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.08761519193649292},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004553","descriptor_name":"Electric Conductivity","qualifier_ui":null,"qualifier_name":null,"is_major_topic":true},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D004566","descriptor_name":"Electrodes","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012399","descriptor_name":"Rotation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012399","descriptor_name":"Rotation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D012399","descriptor_name":"Rotation","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D017097","descriptor_name":"Electric Impedance","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false},{"descriptor_ui":"D019047","descriptor_name":"Phantoms, Imaging","qualifier_ui":null,"qualifier_name":null,"is_major_topic":false}],"locations_count":2,"locations":[{"id":"doi:10.1109/embc48229.2022.9871552","is_oa":false,"landing_page_url":"https://doi.org/10.1109/embc48229.2022.9871552","pdf_url":null,"source":{"id":"https://openalex.org/S4363607706","display_name":"2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)","raw_type":"proceedings-article"},{"id":"pmid:36085975","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/36085975","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annual International Conference of the IEEE Engineering in Medicine and Biology Society. IEEE Engineering in Medicine and Biology Society. Annual International Conference","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5199999809265137},{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.46000000834465027}],"awards":[{"id":"https://openalex.org/G2046151270","display_name":null,"funder_award_id":"40B2-0176498","funder_id":"https://openalex.org/F4320320924","funder_display_name":"Schweizerischer Nationalfonds zur F\u00f6rderung der Wissenschaftlichen Forschung"}],"funders":[{"id":"https://openalex.org/F4320320924","display_name":"Schweizerischer Nationalfonds zur F\u00f6rderung der Wissenschaftlichen Forschung","ror":"https://ror.org/00yjd3n13"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1972452248","https://openalex.org/W2041556066","https://openalex.org/W2080565775","https://openalex.org/W2092281875","https://openalex.org/W2120222668","https://openalex.org/W2164645326","https://openalex.org/W2490963924","https://openalex.org/W2607057921","https://openalex.org/W2782473091","https://openalex.org/W2799999822","https://openalex.org/W2904544959","https://openalex.org/W2908657763"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2944246511","https://openalex.org/W4285180073","https://openalex.org/W4235437594","https://openalex.org/W2362037466","https://openalex.org/W2752613076","https://openalex.org/W4282829188"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,81,109,118,132],"method":[4],"to":[5,26,29,36,50,140,154],"minimize":[6,155],"the":[7,40,52,57,89,113,121,127,142,156],"inadvertent":[8,157],"cutting":[9,158],"of":[10,76,83,88,129,134,159],"tissues":[11,160],"in":[12,120,161],"surgeries":[13,162],"involving":[14,163],"bone":[15,164],"drilling.":[16,165],"We":[17],"present":[18],"electrical":[19],"impedance":[20,43,78,130],"measurements":[21,44],"as":[22,80,131],"an":[23,69],"assistive":[24],"technology":[25],"image-guided":[27],"surgery":[28],"achieve":[30],"online":[31],"guidance.":[32],"Proposed":[33],"concept":[34],"is":[35,92],"identify":[37],"and":[38,45,106],"localize":[39,141],"landmarks":[41],"via":[42],"then":[46],"use":[47],"this":[48,65],"information":[49],"superimpose":[51],"estimated":[53],"drilling":[54],"trajectory":[55],"on":[56],"offline":[58],"maps":[59],"obtained":[60],"by":[61,117],"pre-operative":[62],"imaging.":[63],"To":[64],"end.,":[66],"we":[67,123],"propose":[68],"asymmetric":[70],"electrode":[71],"geometry.,":[72],"split":[73],"electrodes.,":[74],"capable":[75],"distinguishing":[77],"variations":[79],"function":[82,133],"rotation":[84,135],"angle.":[85],"The":[86],"feasibility":[87],"proposed":[90],"approach":[91,150],"verified":[93],"with":[94,99,108,144],"numerical":[95],"analysis.":[96],"A":[97],"probe":[98],"stainless":[100],"steel":[101],"electrodes":[102],"has":[103],"been":[104],"fabricated":[105],"tested":[107],"technical":[110],"phantom.":[111],"Although":[112],"results":[114],"are":[115],"impacted":[116],"non-ideality":[119],"phantom.,":[122],"could":[124],"show":[125],"that":[126],"variation":[128],"angle":[136],"can":[137],"be":[138,152],"used":[139,153],"regions":[143],"different":[145],"impedivities.":[146],"Clinical":[147],"Relevance-":[148],"Presented":[149],"may":[151]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}