{"id":"https://openalex.org/W1640217056","doi":"https://doi.org/10.1109/eit.2015.7293359","title":"Design and evaluation of reconfigurable ultrasonic testing system","display_name":"Design and evaluation of reconfigurable ultrasonic testing system","publication_year":2015,"publication_date":"2015-05-01","ids":{"openalex":"https://openalex.org/W1640217056","doi":"https://doi.org/10.1109/eit.2015.7293359","mag":"1640217056"},"language":"en","primary_location":{"id":"doi:10.1109/eit.2015.7293359","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eit.2015.7293359","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Electro/Information Technology (EIT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019363409","display_name":"Vidya Vasudevan","orcid":null},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vidya Vasudevan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100725035","display_name":"Boyang Wang","orcid":"https://orcid.org/0000-0001-8973-2328"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Boyang Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044268585","display_name":"Pramod Govindan","orcid":"https://orcid.org/0009-0006-8881-0615"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pramod Govindan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A","institution_ids":["https://openalex.org/I180949307"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018536803","display_name":"Jafar Saniie","orcid":"https://orcid.org/0000-0002-2655-6950"},"institutions":[{"id":"https://openalex.org/I180949307","display_name":"Illinois Institute of Technology","ror":"https://ror.org/037t3ry66","country_code":"US","type":"education","lineage":["https://openalex.org/I180949307"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jafar Saniie","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S.A","institution_ids":["https://openalex.org/I180949307"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, Illinois, U.S. A","institution_ids":["https://openalex.org/I180949307"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.03946459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"7","issue":null,"first_page":"310","last_page":"313"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ultrasonic-sensor","display_name":"Ultrasonic sensor","score":0.7420867681503296},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.64680016040802},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5830304026603699},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5552446842193604},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.509161651134491},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5016403198242188},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4809971749782562},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4785345494747162},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.43546003103256226},{"id":"https://openalex.org/keywords/ultrasonic-testing","display_name":"Ultrasonic testing","score":0.4351418912410736},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.3442038297653198}],"concepts":[{"id":"https://openalex.org/C81288441","wikidata":"https://www.wikidata.org/wiki/Q20736125","display_name":"Ultrasonic sensor","level":2,"score":0.7420867681503296},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.64680016040802},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5830304026603699},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5552446842193604},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.509161651134491},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5016403198242188},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4809971749782562},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4785345494747162},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.43546003103256226},{"id":"https://openalex.org/C139730468","wikidata":"https://www.wikidata.org/wiki/Q1779355","display_name":"Ultrasonic testing","level":3,"score":0.4351418912410736},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.3442038297653198},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/eit.2015.7293359","is_oa":false,"landing_page_url":"https://doi.org/10.1109/eit.2015.7293359","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Electro/Information Technology (EIT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1998290808","https://openalex.org/W2085663832","https://openalex.org/W2122002376","https://openalex.org/W2534069875"],"related_works":["https://openalex.org/W4210376836","https://openalex.org/W4210925376","https://openalex.org/W1633995705","https://openalex.org/W2596211269","https://openalex.org/W2360384790","https://openalex.org/W4232397253","https://openalex.org/W4235913033","https://openalex.org/W2109284253","https://openalex.org/W2039966832","https://openalex.org/W2359819289"],"abstract_inverted_index":{"Ultrasonic":[0],"data":[1,61,104],"acquisition":[2],"systems":[3],"used":[4],"in":[5,16],"the":[6],"medical":[7],"imaging":[8],"and":[9,23,63,117],"nondestructive":[10],"testing":[11,36],"applications":[12],"have":[13],"critical":[14],"requirements":[15],"order":[17],"to":[18,91],"be":[19],"capable":[20],"of":[21,43,51],"evaluating":[22],"prototyping":[24],"ultrasound":[25,114],"applications.":[26],"In":[27],"this":[28],"paper,":[29],"a":[30,52,64,108],"system-on-chip":[31],"(SoC)":[32],"based":[33],"reconfigurable":[34,54],"ultrasonic":[35,45,75,103],"system":[37,99,115],"(RUTS)":[38],"is":[39,100],"developed":[40],"for":[41,59,69,94,102,112],"implementation":[42,106],"high-speed":[44],"signal":[46,76],"processing":[47,77],"algorithms.":[48],"RUTS":[49],"comprises":[50],"fully":[53],"analog":[55],"front-end":[56],"(AFE)":[57],"sub-system":[58],"efficient":[60],"acquisition,":[62],"Xilinx":[65],"Zynq":[66,82],"SoC":[67,83],"module":[68],"dynamic":[70],"feature":[71],"control.":[72],"Computationally":[73],"intensive":[74],"algorithms":[78],"are":[79],"implemented":[80],"on":[81],"using":[84],"hardware-software":[85],"co-design":[86],"methodologies.":[87],"AFE":[88],"supports":[89],"up":[90],"8":[92],"transducers":[93],"phased-array":[95],"implementation.":[96],"This":[97],"Linux-based":[98],"analyzed":[101],"compression":[105],"providing":[107],"very":[109],"versatile":[110],"environment":[111],"further":[113],"development":[116],"research":[118],"work.":[119]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}