{"id":"https://openalex.org/W1992262471","doi":"https://doi.org/10.1109/ecctd.2011.6043836","title":"A power grid optimization algorithm considering via reliability","display_name":"A power grid optimization algorithm considering via reliability","publication_year":2011,"publication_date":"2011-08-01","ids":{"openalex":"https://openalex.org/W1992262471","doi":"https://doi.org/10.1109/ecctd.2011.6043836","mag":"1992262471"},"language":"en","primary_location":{"id":"doi:10.1109/ecctd.2011.6043836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2011.6043836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103013379","display_name":"Masahiro Fukui","orcid":null},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masahiro Fukui","raw_affiliation_strings":["Department of VLSI System Design, Ritsumeikan University, Kusatsu, Japan"],"affiliations":[{"raw_affiliation_string":"Department of VLSI System Design, Ritsumeikan University, Kusatsu, Japan","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109517214","display_name":"Haruo Miki","orcid":null},"institutions":[{"id":"https://openalex.org/I135768898","display_name":"Ritsumeikan University","ror":"https://ror.org/0197nmd03","country_code":"JP","type":"education","lineage":["https://openalex.org/I135768898","https://openalex.org/I4390039241"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Miki","raw_affiliation_strings":["Department of VLSI System Design, Ritsumeikan University, Kusatsu, Japan"],"affiliations":[{"raw_affiliation_string":"Department of VLSI System Design, Ritsumeikan University, Kusatsu, Japan","institution_ids":["https://openalex.org/I135768898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102076246","display_name":"Masaya Yoshikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I96636082","display_name":"Meijo University","ror":"https://ror.org/04h42fc75","country_code":"JP","type":"education","lineage":["https://openalex.org/I96636082"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaya Yoshikawa","raw_affiliation_strings":["Department of Information Engineering, Meijo University, Nagoya, Aichi, Japan","[Department of Information Engineering, Meijo University, Nagoya, Aichi, Japan]"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Meijo University, Nagoya, Aichi, Japan","institution_ids":["https://openalex.org/I96636082"]},{"raw_affiliation_string":"[Department of Information Engineering, Meijo University, Nagoya, Aichi, Japan]","institution_ids":["https://openalex.org/I96636082"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108626659","display_name":"Shuji Tsukiyama","orcid":null},"institutions":[{"id":"https://openalex.org/I96679780","display_name":"Chuo University","ror":"https://ror.org/03qvqb743","country_code":"JP","type":"education","lineage":["https://openalex.org/I96679780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shuji Tsukiyama","raw_affiliation_strings":["Department of Electrical, Electronic and Communication Engineering, Chuo University Tokyo, Tokyo, Japan","Dept. of Electrical, Electronic and Comm. Eng., Chuo University, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical, Electronic and Communication Engineering, Chuo University Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I96679780"]},{"raw_affiliation_string":"Dept. of Electrical, Electronic and Comm. Eng., Chuo University, Tokyo, Japan","institution_ids":["https://openalex.org/I96679780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103013379"],"corresponding_institution_ids":["https://openalex.org/I135768898"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06481152,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"809","last_page":"812"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8071484565734863},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6110236644744873},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.5766146183013916},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.521450936794281},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49575528502464294},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45466864109039307},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4297446310520172},{"id":"https://openalex.org/keywords/power-density","display_name":"Power density","score":0.41662049293518066},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3393455743789673},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3150233328342438},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1781989336013794}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8071484565734863},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6110236644744873},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.5766146183013916},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.521450936794281},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49575528502464294},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45466864109039307},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4297446310520172},{"id":"https://openalex.org/C21881925","wikidata":"https://www.wikidata.org/wiki/Q3503313","display_name":"Power density","level":3,"score":0.41662049293518066},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3393455743789673},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3150233328342438},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1781989336013794},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ecctd.2011.6043836","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2011.6043836","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1982002042","https://openalex.org/W2044431355","https://openalex.org/W2053737126","https://openalex.org/W2103762121","https://openalex.org/W2124089733","https://openalex.org/W2156208504","https://openalex.org/W2161205070","https://openalex.org/W2162135665","https://openalex.org/W2162840580","https://openalex.org/W4236655153","https://openalex.org/W4251291421","https://openalex.org/W6682706876","https://openalex.org/W6683779809"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489"],"abstract_inverted_index":{"Recently,":[0],"fine-pattern":[1],"process":[2],"approaching":[3],"to":[4,123],"physical":[5],"limit":[6],"and":[7,44,71,111],"the":[8,40,49,57,63,84,117,125],"rise":[9],"of":[10,16,19,34,39,42,82,86,95,127],"heat":[11,43],"density":[12,46],"become":[13],"major":[14],"factors":[15],"reliability":[17,22,55,126],"degradation":[18],"LSIs.":[20],"Especially":[21],"problems":[23],"in":[24,30,37,93],"power":[25,89],"grids":[26],"occur":[27],"more":[28,87],"notably":[29],"vias.":[31],"The":[32],"optimization":[33],"via":[35,54,121],"design":[36,69,76],"consideration":[38,94],"influence":[41],"current":[45],"is":[47],"increasing":[48],"importance.":[50],"This":[51],"paper":[52],"formulates":[53],"with":[56,99],"mean":[58,65],"life":[59,66],"time.":[60],"It":[61,114],"gives":[62],"minimum":[64],"time":[67],"as":[68,104],"restrictions,":[70,77],"it":[72,131],"not":[73],"only":[74],"fills":[75],"but":[78],"proposes":[79],"a":[80,96,105],"technique":[81],"obtaining":[83],"solution":[85],"reliable":[88],"supply":[90],"wiring":[91,106,133],"synthetically":[92],"trade-off":[97],"relation":[98],"other":[100],"optimized":[101],"indices,":[102],"such":[103],"congestion":[107],"degree,":[108],"IR":[109],"drops,":[110],"electro":[112],"migration.":[113],"also":[115],"includes":[116],"function":[118],"which":[119],"increases":[120,132],"area":[122],"improve":[124],"via,":[128],"even":[129],"if":[130],"congestion.":[134]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}