{"id":"https://openalex.org/W2131536036","doi":"https://doi.org/10.1109/ecctd.2011.6043815","title":"Testing of first and second order delta-sigma converters for catastrophic faults","display_name":"Testing of first and second order delta-sigma converters for catastrophic faults","publication_year":2011,"publication_date":"2011-08-01","ids":{"openalex":"https://openalex.org/W2131536036","doi":"https://doi.org/10.1109/ecctd.2011.6043815","mag":"2131536036"},"language":"en","primary_location":{"id":"doi:10.1109/ecctd.2011.6043815","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2011.6043815","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046264812","display_name":"Mohammed A. Amin","orcid":"https://orcid.org/0000-0001-5091-0641"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M.H. Amin","raw_affiliation_strings":["Faculty of Engineering, Cairo University, Giza, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Cairo University, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006235823","display_name":"M. B. Abdelhalim","orcid":"https://orcid.org/0000-0002-1803-6349"},"institutions":[{"id":"https://openalex.org/I59272784","display_name":"Arab Academy for Science, Technology, and Maritime Transport","ror":"https://ror.org/0004vyj87","country_code":"EG","type":"education","lineage":["https://openalex.org/I59272784"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M.B. Abdelhalim","raw_affiliation_strings":["College of Computing & IT, AASTMT, Cairo, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computing & IT, AASTMT, Cairo, Egypt","institution_ids":["https://openalex.org/I59272784"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109553881","display_name":"Hassanein H. Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"H.H. Amer","raw_affiliation_strings":["Electronics Engineering Department, American University in Cairo, Cairo, Egypt","[Electronics Engineering Department, American University in Cairo, Egypt]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]},{"raw_affiliation_string":"[Electronics Engineering Department, American University in Cairo, Egypt]","institution_ids":["https://openalex.org/I80693520"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6471,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72016268,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"76","issue":null,"first_page":"889","last_page":"892"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.861106276512146},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.6914224624633789},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.6854035258293152},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.51829594373703},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5004010200500488},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4545648396015167},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.41362959146499634},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3861753046512604},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3345707654953003},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11223125457763672},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10885980725288391},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08158916234970093}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.861106276512146},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.6914224624633789},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.6854035258293152},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.51829594373703},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5004010200500488},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4545648396015167},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.41362959146499634},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3861753046512604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3345707654953003},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11223125457763672},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10885980725288391},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08158916234970093},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ecctd.2011.6043815","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2011.6043815","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 20th European Conference on Circuit Theory and Design (ECCTD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1562719176","https://openalex.org/W1794947714","https://openalex.org/W1971294617","https://openalex.org/W2067323993","https://openalex.org/W2090014759","https://openalex.org/W2097832094","https://openalex.org/W4253502382","https://openalex.org/W6643218205"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W2103861456","https://openalex.org/W1541346708","https://openalex.org/W3183433566","https://openalex.org/W4240663242","https://openalex.org/W4233608695"],"abstract_inverted_index":{"Delta-Sigma":[0],"analog":[1],"to":[2],"digital":[3,47,81],"converters":[4,16],"are":[5,36,110],"vital":[6],"components":[7,42],"for":[8],"mixed-signal":[9],"systems.":[10],"So,":[11],"testing":[12,25],"this":[13],"type":[14],"of":[15,26,58,73,77,101],"is":[17,50,83,87,105],"extremely":[18],"important.":[19],"This":[20],"paper":[21],"studies":[22],"the":[23,53,67,80,90,99,108],"low-cost":[24],"first-order":[27],"and":[28,43,85,113],"second-order":[29],"delta-sigma":[30],"ADCs.":[31],"Moreover;":[32],"only":[33,59],"catastrophic":[34],"faults":[35,45,65],"considered":[37],"such":[38],"as":[39],"open/short":[40],"passive":[41,102],"stuck-at":[44],"in":[46,66,79],"components.":[48],"It":[49],"proven":[51,112],"that":[52,62,89],"minimal":[54],"test":[55,92],"set":[56,93],"consists":[57],"two":[60],"values":[61],"detect":[63],"all":[64,96],"assumed":[68],"fault":[69],"set.":[70],"The":[71],"effect":[72,100],"using":[74],"different":[75],"types":[76],"counters":[78],"subcircuit":[82],"investigated":[84],"it":[86],"found":[88],"two-value":[91],"still":[94],"detects":[95],"faults.":[97],"Finally,":[98],"component":[103],"tolerances":[104],"analyzed.":[106],"All":[107],"results":[109],"analytically":[111],"verified":[114],"by":[115],"simulations.":[116]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}