{"id":"https://openalex.org/W2130319483","doi":"https://doi.org/10.1109/ecctd.2009.5275061","title":"Faults classification in analog electronic circuits with use of the SVM algorithm","display_name":"Faults classification in analog electronic circuits with use of the SVM algorithm","publication_year":2009,"publication_date":"2009-08-01","ids":{"openalex":"https://openalex.org/W2130319483","doi":"https://doi.org/10.1109/ecctd.2009.5275061","mag":"2130319483"},"language":"en","primary_location":{"id":"doi:10.1109/ecctd.2009.5275061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2009.5275061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 European Conference on Circuit Theory and Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045068722","display_name":"Damian Grzechca","orcid":"https://orcid.org/0000-0003-1391-8809"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":true,"raw_author_name":"Damian Grzechca","raw_affiliation_strings":["Institute of Electronics, Silesian University of Technology, Gliwice, Poland","Institute of Electronics, Silesian University of Technology, Gliwice, POLAND"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics, Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Institute of Electronics, Silesian University of Technology, Gliwice, POLAND","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017027106","display_name":"Slawomir Czeczotka","orcid":null},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Slawomir Czeczotka","raw_affiliation_strings":["Institute of Electronics, Silesian University of Technology, Gliwice, Poland","Institute of Electronics, Silesian University of Technology, Gliwice, POLAND"],"affiliations":[{"raw_affiliation_string":"Institute of Electronics, Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Institute of Electronics, Silesian University of Technology, Gliwice, POLAND","institution_ids":["https://openalex.org/I119004910"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5045068722"],"corresponding_institution_ids":["https://openalex.org/I119004910"],"apc_list":null,"apc_paid":null,"fwci":0.5276,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.68515047,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"659","last_page":"662"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.7964138984680176},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7341424226760864},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6919024586677551},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6622298955917358},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6478560566902161},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5501258969306946},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5130749940872192},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.5099693536758423},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.48109978437423706},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4759368896484375},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.47462236881256104},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42780566215515137},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.38013315200805664},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3579733371734619},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3548281490802765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20826321840286255},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1381121277809143}],"concepts":[{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.7964138984680176},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7341424226760864},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6919024586677551},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6622298955917358},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6478560566902161},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5501258969306946},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5130749940872192},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.5099693536758423},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.48109978437423706},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4759368896484375},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.47462236881256104},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42780566215515137},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.38013315200805664},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3579733371734619},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3548281490802765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20826321840286255},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1381121277809143},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ecctd.2009.5275061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2009.5275061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 European Conference on Circuit Theory and Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W121424617","https://openalex.org/W1529683127","https://openalex.org/W1629394991","https://openalex.org/W1869391892","https://openalex.org/W2139212933"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W2745001401","https://openalex.org/W4321353415","https://openalex.org/W2130974462","https://openalex.org/W972276598","https://openalex.org/W2028665553","https://openalex.org/W2086519370","https://openalex.org/W2087343574","https://openalex.org/W4246352526","https://openalex.org/W2375192119"],"abstract_inverted_index":{"In":[0],"the":[1,3,6,35,42,68,91,98],"paper":[2],"application":[4],"of":[5,19,74,97],"SVM":[7,82,99],"(support":[8],"vector":[9],"machine)":[10],"algorithm":[11],"has":[12,78,87],"been":[13,79,88],"used":[14],"for":[15],"diagnosis":[16],"and":[17,50,90],"test":[18,32,44,70],"analog":[20],"electronic":[21],"circuits":[22],"in":[23],"time":[24],"domain.":[25],"Procedure":[26],"designed":[27,80],"belongs":[28],"to":[29],"simulation":[30],"before":[31,43],"technique,":[33],"where":[34],"fault":[36,56],"models":[37,57],"should":[38],"be":[39],"assumed":[40],"at":[41,67],"stage":[45,71],"(prototype":[46],"stage).":[47],"Both,":[48],"parametric":[49],"catastrophic":[51],"faults":[52],"based":[53],"on":[54],"standard":[55],"are":[58,65],"considered.":[59],"Selected":[60],"features":[61],"from":[62],"transient":[63],"domain":[64],"classified":[66],"after":[69],"with":[72],"use":[73],"decision":[75],"function,":[76],"which":[77],"by":[81],"algorithm.":[83],"An":[84],"exemplary":[85],"benchmark":[86],"tested":[89],"results":[92],"prove":[93],"high":[94],"classification":[95],"ability":[96],"application.":[100]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}