{"id":"https://openalex.org/W2139272093","doi":"https://doi.org/10.1109/ecctd.2007.4529727","title":"A common-sense based approach to the automated test-point selection in fault diagnosis","display_name":"A common-sense based approach to the automated test-point selection in fault diagnosis","publication_year":2007,"publication_date":"2007-08-01","ids":{"openalex":"https://openalex.org/W2139272093","doi":"https://doi.org/10.1109/ecctd.2007.4529727","mag":"2139272093"},"language":"en","primary_location":{"id":"doi:10.1109/ecctd.2007.4529727","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2007.4529727","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 18th European Conference on Circuit Theory and Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039488441","display_name":"Andrzej Pu\u0142ka","orcid":"https://orcid.org/0000-0001-6853-3610"},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Andrzej Pulka","raw_affiliation_strings":["Institute of Electronics, Silesian University of Technology, Gliwice, Poland","Inst. of Electron., Silesian Univ. of Technol. Gliwice, Gliwice, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Inst. of Electron., Silesian Univ. of Technol. Gliwice, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041953192","display_name":"Jerzy Rutkowski","orcid":null},"institutions":[{"id":"https://openalex.org/I119004910","display_name":"Silesian University of Technology","ror":"https://ror.org/02dyjk442","country_code":"PL","type":"education","lineage":["https://openalex.org/I119004910"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jerzy Rutkowski","raw_affiliation_strings":["Institute of Electronics, Silesian University of Technology, Gliwice, Poland","Inst. of Electron., Silesian Univ. of Technol. Gliwice, Gliwice, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Electronics, Silesian University of Technology, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]},{"raw_affiliation_string":"Inst. of Electron., Silesian Univ. of Technol. Gliwice, Gliwice, Poland","institution_ids":["https://openalex.org/I119004910"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8791,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.8177242,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":null,"first_page":"838","last_page":"841"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10571","display_name":"Robotic Mechanisms and Dynamics","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10571","display_name":"Robotic Mechanisms and Dynamics","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.742299497127533},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7226749658584595},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.6801018714904785},{"id":"https://openalex.org/keywords/prolog","display_name":"Prolog","score":0.6138346195220947},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.6101281642913818},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.6056740283966064},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5924538373947144},{"id":"https://openalex.org/keywords/expert-system","display_name":"Expert system","score":0.526057243347168},{"id":"https://openalex.org/keywords/extension","display_name":"Extension (predicate logic)","score":0.5184959173202515},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5150213241577148},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.45514044165611267},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4261900782585144},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.38265499472618103},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35279580950737},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3418298661708832},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3246408998966217},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3051770031452179},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1782279908657074},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15446355938911438},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12965694069862366},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09707272052764893}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.742299497127533},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7226749658584595},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.6801018714904785},{"id":"https://openalex.org/C81721847","wikidata":"https://www.wikidata.org/wiki/Q163468","display_name":"Prolog","level":2,"score":0.6138346195220947},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.6101281642913818},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.6056740283966064},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5924538373947144},{"id":"https://openalex.org/C58328972","wikidata":"https://www.wikidata.org/wiki/Q184609","display_name":"Expert system","level":2,"score":0.526057243347168},{"id":"https://openalex.org/C2778029271","wikidata":"https://www.wikidata.org/wiki/Q5421931","display_name":"Extension (predicate logic)","level":2,"score":0.5184959173202515},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5150213241577148},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.45514044165611267},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4261900782585144},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.38265499472618103},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35279580950737},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3418298661708832},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3246408998966217},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3051770031452179},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1782279908657074},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15446355938911438},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12965694069862366},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09707272052764893},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ecctd.2007.4529727","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2007.4529727","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 18th European Conference on Circuit Theory and Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/4","display_name":"Quality Education","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1518629814","https://openalex.org/W1582651131","https://openalex.org/W1924227955","https://openalex.org/W1990633974","https://openalex.org/W2008903358","https://openalex.org/W2050699786","https://openalex.org/W2088576840","https://openalex.org/W2094897492","https://openalex.org/W2096280374","https://openalex.org/W2099684000","https://openalex.org/W2119900476","https://openalex.org/W2134028782","https://openalex.org/W2155322595","https://openalex.org/W2170598229","https://openalex.org/W2181751480","https://openalex.org/W6685875351"],"related_works":["https://openalex.org/W4327863099","https://openalex.org/W4313330514","https://openalex.org/W2163047760","https://openalex.org/W2136503711","https://openalex.org/W1592696310","https://openalex.org/W2955439067","https://openalex.org/W2102054439","https://openalex.org/W2139492631","https://openalex.org/W1519923721","https://openalex.org/W3147676363"],"abstract_inverted_index":{"The":[0,21,43,52,76,97],"presented":[1,56],"work":[2],"deals":[3],"with":[4],"the":[5,13,28,36,58,61,65,68,81,85,95,100],"problem":[6],"of":[7,15,18,30,50,60,67,80,99],"electronic":[8],"analog":[9],"devices":[10],"testing":[11],"-":[12],"selection":[14],"optimal":[16],"set":[17],"measuring":[19],"points.":[20],"paper":[22],"discusses":[23],"various":[24],"optimization":[25],"techniques":[26],"in":[27,78],"field":[29],"test":[31,86],"point":[32,87],"selection,":[33],"known":[34],"from":[35],"literature":[37],"and":[38,46,92,105],"gives":[39],"some":[40],"new":[41],"ideas.":[42],"proposed":[44],"modifications":[45],"improvements":[47],"have":[48,102],"form":[49],"algorithms.":[51],"searching":[53],"procedure":[54],"is":[55,74,89],"on":[57],"example":[59],"benchmark":[62],"circuit.":[63],"Then":[64],"extension":[66],"methodology":[69],"for":[70],"complex":[71],"fault":[72],"dictionaries":[73],"discussed.":[75],"implementation":[77],"Prolog":[79],"expert":[82],"system":[83],"optimizing":[84],"sets":[88],"presented.":[90],"Results":[91],"conclusions":[93],"summarize":[94],"work.":[96],"benefits":[98],"approach":[101],"been":[103],"emphasized":[104],"further":[106],"research":[107],"pointed.":[108]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}