{"id":"https://openalex.org/W1604193681","doi":"https://doi.org/10.1109/ecctd.2005.1523000","title":"A 1.5V 150MS/s current-mode sample-and-hold circuit","display_name":"A 1.5V 150MS/s current-mode sample-and-hold circuit","publication_year":2006,"publication_date":"2006-10-11","ids":{"openalex":"https://openalex.org/W1604193681","doi":"https://doi.org/10.1109/ecctd.2005.1523000","mag":"1604193681"},"language":"en","primary_location":{"id":"doi:10.1109/ecctd.2005.1523000","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2005.1523000","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058897428","display_name":"Behnam Sedighi","orcid":null},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"B. Sedighi","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006859738","display_name":"Omid Rajaee","orcid":null},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"O. Rajaee","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006710857","display_name":"Ali Jahanian","orcid":"https://orcid.org/0000-0003-2292-4135"},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"A. Jahanian","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013629641","display_name":"Mehrdad Sharif Bakhtiar","orcid":null},"institutions":[{"id":"https://openalex.org/I133529467","display_name":"Sharif University of Technology","ror":"https://ror.org/024c2fq17","country_code":"IR","type":"education","lineage":["https://openalex.org/I133529467"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"M.S. Bakhtiar","raw_affiliation_strings":["Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Sharif University of Technology, Tehran, IRAN","institution_ids":["https://openalex.org/I133529467"]},{"raw_affiliation_string":"Dept. of Electr. Eng., SHARIF Univ. of Technol., Tehran, Iran","institution_ids":["https://openalex.org/I133529467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5058897428"],"corresponding_institution_ids":["https://openalex.org/I133529467"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.05767504,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"91","last_page":"94"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sample-and-hold","display_name":"Sample and hold","score":0.7455688118934631},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.689568817615509},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5916863679885864},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5365512371063232},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.50743168592453},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5014536380767822},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.49563562870025635},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4911465346813202},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47435057163238525},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4577528238296509},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.4181276559829712},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41755974292755127},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27349746227264404},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.148068368434906},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10093900561332703}],"concepts":[{"id":"https://openalex.org/C206565188","wikidata":"https://www.wikidata.org/wiki/Q836482","display_name":"Sample and hold","level":3,"score":0.7455688118934631},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.689568817615509},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5916863679885864},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5365512371063232},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.50743168592453},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5014536380767822},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.49563562870025635},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4911465346813202},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47435057163238525},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4577528238296509},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.4181276559829712},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41755974292755127},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27349746227264404},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.148068368434906},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10093900561332703},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ecctd.2005.1523000","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecctd.2005.1523000","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1492817962","https://openalex.org/W1987168992","https://openalex.org/W2046112001","https://openalex.org/W2097420496","https://openalex.org/W2106965443","https://openalex.org/W2125639168"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2023858428","https://openalex.org/W2389800961","https://openalex.org/W1537242034","https://openalex.org/W1995389502","https://openalex.org/W2128958016","https://openalex.org/W1515994202","https://openalex.org/W1976886644","https://openalex.org/W4297192903","https://openalex.org/W2794273432"],"abstract_inverted_index":{"A":[0],"high-speed":[1],"current-mode":[2],"sample-and-hold":[3,21],"circuit":[4,8,22],"is":[5,39],"presented.":[6],"This":[7],"allows":[9],"for":[10,53],"high":[11,16],"sampling":[12,44,51],"speed":[13],"together":[14],"with":[15,34,43],"linearity":[17],"and":[18,26],"precision.":[19],"The":[20],"has":[23],"been":[24],"designed":[25],"simulated":[27],"in":[28],"standard":[29],"0.18/spl":[30],"mu/m":[31],"CMOS":[32],"technology":[33],"1.5V":[35],"supply":[36],"voltage.":[37],"It":[38],"capable":[40],"of":[41,46],"operation":[42],"frequency":[45],"150MHz":[47],"(300MHz":[48],"using":[49,56],"double":[50],"technique)":[52],"12-bit":[54],"accuracy":[55],"3.7mW":[57],"power.":[58]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}