{"id":"https://openalex.org/W3193283973","doi":"https://doi.org/10.1109/ecai52376.2021.9515015","title":"On the Availability and Downtime of Safety-Critical Networked Control Systems","display_name":"On the Availability and Downtime of Safety-Critical Networked Control Systems","publication_year":2021,"publication_date":"2021-07-01","ids":{"openalex":"https://openalex.org/W3193283973","doi":"https://doi.org/10.1109/ecai52376.2021.9515015","mag":"3193283973"},"language":"en","primary_location":{"id":"doi:10.1109/ecai52376.2021.9515015","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecai52376.2021.9515015","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 13th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074949252","display_name":"Bishoy Salama","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Bishoy Salama","raw_affiliation_strings":["Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089100441","display_name":"Omar A. Elayat","orcid":"https://orcid.org/0009-0007-6581-5357"},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Omar A. Elayat","raw_affiliation_strings":["Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028507355","display_name":"Ghada H. Ahmed","orcid":"https://orcid.org/0000-0003-1709-8692"},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ghada Ahmed","raw_affiliation_strings":["Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014597515","display_name":"Salma K. Elsokkary","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]},{"id":"https://openalex.org/I107720978","display_name":"Ain Shams University","ror":"https://ror.org/00cb9w016","country_code":"EG","type":"education","lineage":["https://openalex.org/I107720978"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Salma K. Elsokkary","raw_affiliation_strings":["Computer and Systems Engineering Department, Ain Shams University, Cairo, Egypt","Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Computer and Systems Engineering Department, Ain Shams University, Cairo, Egypt","institution_ids":["https://openalex.org/I107720978"]},{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110743704","display_name":"Ram\u00e8z M. Daoud","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Ramez M. Daoud","raw_affiliation_strings":["Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109553881","display_name":"Hassanein H. Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hassanein H. Amer","raw_affiliation_strings":["Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics and Communication Engineering Department, The American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080987266","display_name":"Hassan M. F. El-Menier","orcid":null},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Hassan M.F. El-Menier","raw_affiliation_strings":["Electronics and Communications Engineering Department, Cairo University, Giza, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics and Communications Engineering Department, Cairo University, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5074949252"],"corresponding_institution_ids":["https://openalex.org/I80693520"],"apc_list":null,"apc_paid":null,"fwci":0.1674,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4829693,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11125","display_name":"Petri Nets in System Modeling","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/downtime","display_name":"Downtime","score":0.9753646850585938},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.8354798555374146},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7742300033569336},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7645865678787231},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.68916916847229},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5882355570793152},{"id":"https://openalex.org/keywords/scope","display_name":"Scope (computer science)","score":0.5206581950187683},{"id":"https://openalex.org/keywords/system-safety","display_name":"System safety","score":0.5043259859085083},{"id":"https://openalex.org/keywords/high-availability","display_name":"High availability","score":0.48271510004997253},{"id":"https://openalex.org/keywords/unavailability","display_name":"Unavailability","score":0.47645333409309387},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4471384882926941},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.434995174407959},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3112460970878601},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27089011669158936},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.13836601376533508}],"concepts":[{"id":"https://openalex.org/C180591934","wikidata":"https://www.wikidata.org/wiki/Q1253369","display_name":"Downtime","level":2,"score":0.9753646850585938},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.8354798555374146},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7742300033569336},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7645865678787231},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.68916916847229},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5882355570793152},{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.5206581950187683},{"id":"https://openalex.org/C132835097","wikidata":"https://www.wikidata.org/wiki/Q7663745","display_name":"System safety","level":2,"score":0.5043259859085083},{"id":"https://openalex.org/C65813073","wikidata":"https://www.wikidata.org/wiki/Q1622420","display_name":"High availability","level":2,"score":0.48271510004997253},{"id":"https://openalex.org/C2780505938","wikidata":"https://www.wikidata.org/wiki/Q17093282","display_name":"Unavailability","level":2,"score":0.47645333409309387},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4471384882926941},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.434995174407959},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3112460970878601},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27089011669158936},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.13836601376533508},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ecai52376.2021.9515015","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ecai52376.2021.9515015","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 13th International Conference on Electronics, Computers and Artificial Intelligence (ECAI)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1482750539","https://openalex.org/W1535980460","https://openalex.org/W1566296806","https://openalex.org/W2539932020","https://openalex.org/W2743635440","https://openalex.org/W2787177496","https://openalex.org/W2878471950","https://openalex.org/W2896202174","https://openalex.org/W2969848622","https://openalex.org/W3019510577","https://openalex.org/W3027030870","https://openalex.org/W3104335111","https://openalex.org/W4231340621","https://openalex.org/W4238097735","https://openalex.org/W6755105203"],"related_works":["https://openalex.org/W2519114609","https://openalex.org/W2891676548","https://openalex.org/W2479186422","https://openalex.org/W3184570916","https://openalex.org/W1706194612","https://openalex.org/W1972470276","https://openalex.org/W2165182153","https://openalex.org/W158422015","https://openalex.org/W2067951990","https://openalex.org/W1998227034"],"abstract_inverted_index":{"The":[0],"scope":[1],"of":[2,44,133],"this":[3,17],"paper":[4,18],"is":[5,47,73,108,126],"safety-critical":[6],"Networked":[7],"Control":[8],"Systems":[9],"(NCSs).":[10],"These":[11],"systems":[12],"use":[13],"fault-tolerant":[14,55],"architectures.":[15],"Furthermore,":[16,62],"studies":[19],"situations":[20,63],"where":[21,66],"repair":[22,105],"times":[23],"may":[24],"be":[25],"relatively":[26],"long":[27,104],"compared":[28],"to":[29,34,50,59,76,95,128],"the":[30,52,81,130],"components\u2019":[31],"mean":[32],"time":[33],"failure.":[35],"Using":[36],"Markov":[37],"models":[38],"and":[39,71,102],"for":[40,90],"a":[41,118,124],"pre-determined":[42],"level":[43],"redundancy,":[45],"it":[46,72,107],"shown":[48,74,109],"how":[49,75],"determine":[51],"most":[53,82],"appropriate":[54],"architecture":[56],"in":[57,80,97],"order":[58],"reduce":[60,78,129],"downtime.":[61,122],"are":[64,69,93],"studied":[65],"safety":[67,87],"requirements":[68],"relaxed":[70],"further":[77],"downtime":[79],"efficient":[83],"way":[84],"while":[85],"minimizing":[86],"hazards.":[88],"Next,":[89],"factories":[91],"which":[92],"reluctant":[94],"invest":[96],"on":[98,121],"site":[99],"spare":[100,114,135],"parts":[101],"have":[103,117],"times,":[106],"that":[110],"storing":[111],"just":[112],"one":[113],"part":[115],"can":[116],"drastic":[119],"effect":[120],"Finally,":[123],"scheme":[125],"suggested":[127],"administrative":[131],"cost":[132],"importing":[134],"parts.":[136]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}