{"id":"https://openalex.org/W4405362056","doi":"https://doi.org/10.1109/dttis62212.2024.10780417","title":"IJTAG-compatible Symptom-based SEU Monitors for FPGA DNN Accelerators","display_name":"IJTAG-compatible Symptom-based SEU Monitors for FPGA DNN Accelerators","publication_year":2024,"publication_date":"2024-10-14","ids":{"openalex":"https://openalex.org/W4405362056","doi":"https://doi.org/10.1109/dttis62212.2024.10780417"},"language":"en","primary_location":{"id":"doi:10.1109/dttis62212.2024.10780417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dttis62212.2024.10780417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070103343","display_name":"Natalia Cherezova","orcid":"https://orcid.org/0000-0001-9181-5544"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Natalia Cherezova","raw_affiliation_strings":["Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059391257","display_name":"Maksim Jenihhin","orcid":"https://orcid.org/0000-0001-8165-9592"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Maksim Jenihhin","raw_affiliation_strings":["Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059021602","display_name":"Artur Jutman","orcid":"https://orcid.org/0000-0002-2018-5589"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Artur Jutman","raw_affiliation_strings":["Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology,Department of Computer Systems,Tallinn,Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.33865332,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9790999889373779,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9778000116348267,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8191285133361816},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6765896081924438},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5234445929527283},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3930782973766327}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8191285133361816},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6765896081924438},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5234445929527283},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3930782973766327}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dttis62212.2024.10780417","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dttis62212.2024.10780417","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1984145458","https://openalex.org/W2112796928","https://openalex.org/W2491634882","https://openalex.org/W2756242979","https://openalex.org/W2794239932","https://openalex.org/W2891946740","https://openalex.org/W2903175372","https://openalex.org/W3013700197","https://openalex.org/W3015330768","https://openalex.org/W3024621361","https://openalex.org/W3036979375","https://openalex.org/W3048270805","https://openalex.org/W3091833323","https://openalex.org/W3118867694","https://openalex.org/W3121542217","https://openalex.org/W3122788859","https://openalex.org/W3133638088","https://openalex.org/W3149134903","https://openalex.org/W3161596461","https://openalex.org/W3187862527","https://openalex.org/W4206119771","https://openalex.org/W4285282790","https://openalex.org/W4297337482","https://openalex.org/W4384009460","https://openalex.org/W4385832274","https://openalex.org/W4388674566","https://openalex.org/W6745889759"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841","https://openalex.org/W1967938402","https://openalex.org/W2386041993","https://openalex.org/W1608572506"],"abstract_inverted_index":{"The":[0,98,119],"increase":[1],"in":[2,53,104,130,137],"complexity":[3],"of":[4,59,89,126],"Machine":[5],"Learning":[6],"(ML)":[7],"algorithms,":[8],"specifically":[9],"Deep":[10],"Neural":[11],"Networks":[12],"(DNN),":[13],"and":[14,92,107,110,135],"the":[15,64,90,105,127],"high":[16],"demand":[17],"to":[18,37,63,94,124],"deploy":[19],"them":[20],"on":[21],"resource-constrained":[22],"edge":[23],"devices":[24],"require":[25],"specialized":[26],"hardware":[27],"accelerators,":[28],"such":[29],"as":[30,44],"FPGA-based":[31],"ones.":[32],"However,":[33],"FPGAs":[34],"are":[35,111],"susceptible":[36],"radiation-induced":[38],"soft":[39,102],"errors":[40,103,129],"that":[41,85],"can":[42,100],"manifest":[43],"an":[45,114,138],"incorrect":[46],"classification.":[47],"As":[48],"ML":[49],"is":[50],"used":[51],"increasingly":[52],"safety-and":[54],"mission-critical":[55],"applications,":[56],"fault":[57,71,116],"tolerance":[58,72],"DNN":[60,76],"accelerators":[61,77],"comes":[62],"front.":[65],"This":[66],"paper":[67],"presents":[68],"a":[69,131],"cost-efficient":[70],"solution":[73],"for":[74,82],"FPGA":[75],"using":[78],"online":[79],"symptom-based":[80],"monitors":[81,99],"multipliers":[83],"(DSPs)":[84],"observe":[86],"higher-order":[87],"bits":[88],"inputs":[91],"outputs":[93],"detect":[95,101],"out-of-range":[96],"values.":[97],"datapath":[106],"parameter":[108],"buffers":[109],"compatible":[112],"with":[113],"IJTAG-based":[115],"management":[117],"infrastructure.":[118],"proposed":[120],"method":[121],"covers":[122],"up":[123],"99%":[125],"classification":[128],"16-bit":[132],"case-study":[133],"network":[134],"53%":[136],"8-bit":[139],"network.":[140]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}