{"id":"https://openalex.org/W3190755650","doi":"https://doi.org/10.1109/dtis53253.2021.9505144","title":"Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation","display_name":"Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation","publication_year":2021,"publication_date":"2021-06-28","ids":{"openalex":"https://openalex.org/W3190755650","doi":"https://doi.org/10.1109/dtis53253.2021.9505144","mag":"3190755650"},"language":"en","primary_location":{"id":"doi:10.1109/dtis53253.2021.9505144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis53253.2021.9505144","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084435377","display_name":"Praise O. Farayola","orcid":"https://orcid.org/0000-0002-2853-4763"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Praise O. Farayola","raw_affiliation_strings":["Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017653134","display_name":"Isaac Bruce","orcid":"https://orcid.org/0000-0003-3959-1293"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Isaac Bruce","raw_affiliation_strings":["Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023673688","display_name":"Shravan K. Chaganti","orcid":"https://orcid.org/0000-0001-5930-5894"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shravan K. Chaganti","raw_affiliation_strings":["Texas Instruments Inc"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081596132","display_name":"Abalhassan Sheikh","orcid":"https://orcid.org/0000-0001-8106-4732"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abalhassan Sheikh","raw_affiliation_strings":["Texas Instruments Inc"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101754185","display_name":"Srivaths Ravi","orcid":"https://orcid.org/0000-0002-1306-2361"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srivaths Ravi","raw_affiliation_strings":["Texas Instruments Inc"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5084435377"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":1.612,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.82817924,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9846000075340271,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7069376111030579},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6765633225440979},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.5091254115104675},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.44851401448249817},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.44848665595054626},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.42716801166534424},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.34994807839393616},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.34531694650650024},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3083297610282898},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1939125955104828},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.17138352990150452},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08479800820350647}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7069376111030579},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6765633225440979},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.5091254115104675},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.44851401448249817},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.44848665595054626},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.42716801166534424},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.34994807839393616},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.34531694650650024},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3083297610282898},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1939125955104828},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.17138352990150452},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08479800820350647},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dtis53253.2021.9505144","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis53253.2021.9505144","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"No poverty","id":"https://metadata.un.org/sdg/1","score":0.6899999976158142}],"awards":[],"funders":[{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W647000994","https://openalex.org/W2049039038","https://openalex.org/W2050085107","https://openalex.org/W2052693625","https://openalex.org/W2118932352","https://openalex.org/W2130240759","https://openalex.org/W2160197181","https://openalex.org/W2329024626","https://openalex.org/W3033429261","https://openalex.org/W3119995633","https://openalex.org/W3175248285","https://openalex.org/W4254845134","https://openalex.org/W6797231628"],"related_works":["https://openalex.org/W2031235560","https://openalex.org/W2062239751","https://openalex.org/W2161335888","https://openalex.org/W2113725540","https://openalex.org/W2375192119","https://openalex.org/W3215142653","https://openalex.org/W2114773158","https://openalex.org/W2548106609","https://openalex.org/W1950483953","https://openalex.org/W1852277090"],"abstract_inverted_index":{"Massive":[0],"multisite":[1,67,90],"testing":[2],"significantly":[3],"reduces":[4],"test":[5,18,91,110],"cost":[6],"and":[7,31,80,125],"immensely":[8],"increases":[9],"production":[10],"throughput":[11],"by":[12,89],"simultaneously":[13],"screening":[14],"multiple":[15],"devices":[16],"under":[17],"(DUTs).":[19],"However,":[20],"non-trivial":[21],"variations":[22,55],"in":[23,65],"measurement":[24,126],"from":[25],"site":[26,28],"to":[27,40,59,84,105],"are":[29],"inevitable,":[30],"they":[32],"often":[33],"alter":[34],"the":[35,61,86,117,120],"actual":[36],"DUTs":[37,44,97],"specifications":[38],"leading":[39],"yield":[41],"loss":[42],"(good":[43],"rejected":[45],"as":[46],"bad)":[47],"or":[48],"necessitate":[49],"poorer":[50],"DUT":[51],"specifications.":[52],"These":[53],"site-induced":[54],"make":[56],"it":[57],"challenging":[58],"know":[60],"true":[62,98],"silicon":[63],"performance":[64,99],"a":[66],"probing":[68],"environment,":[69],"making":[70],"statistical":[71],"processing":[72],"control":[73],"difficult.":[74],"In":[75],"this":[76],"paper,":[77],"we":[78],"propose":[79],"compare":[81],"three":[82],"methods":[83,122],"remove":[85],"variability":[87],"introduced":[88],"hardware":[92],"for":[93,112],"accurate":[94],"estimation":[95],"of":[96,119],"distributions.":[100],"The":[101],"key":[102],"idea":[103],"is":[104],"select":[106],"high":[107],"confidence":[108],"good":[109],"sites":[111],"parametric":[113],"analysis.":[114],"We":[115],"demonstrate":[116],"accuracy":[118],"proposed":[121],"using":[123],"simulation":[124],"data.":[127]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}