{"id":"https://openalex.org/W2807591199","doi":"https://doi.org/10.1109/dtis.2018.8368549","title":"Analog fault simulation automation at schematic level with random sampling techniques","display_name":"Analog fault simulation automation at schematic level with random sampling techniques","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2807591199","doi":"https://doi.org/10.1109/dtis.2018.8368549","mag":"2807591199"},"language":"en","primary_location":{"id":"doi:10.1109/dtis.2018.8368549","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis.2018.8368549","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108954018","display_name":"Liang Wu","orcid":"https://orcid.org/0009-0009-1546-8144"},"institutions":[{"id":"https://openalex.org/I4210152224","display_name":"Heinz Nixdorf Stiftung","ror":"https://ror.org/04j2tkk21","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I4210152224"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Liang Wu","raw_affiliation_strings":["Heinz Nixdorf Institute, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heinz Nixdorf Institute, Paderborn, Germany","institution_ids":["https://openalex.org/I4210152224"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086956053","display_name":"Mohammad Khizer Hussain","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152224","display_name":"Heinz Nixdorf Stiftung","ror":"https://ror.org/04j2tkk21","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I4210152224"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mohammad Khizer Hussain","raw_affiliation_strings":["Heinz Nixdorf Institute, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heinz Nixdorf Institute, Paderborn, Germany","institution_ids":["https://openalex.org/I4210152224"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050662433","display_name":"Saed Abughannam","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152224","display_name":"Heinz Nixdorf Stiftung","ror":"https://ror.org/04j2tkk21","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I4210152224"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Saed Abughannam","raw_affiliation_strings":["Heinz Nixdorf Institute, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heinz Nixdorf Institute, Paderborn, Germany","institution_ids":["https://openalex.org/I4210152224"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060937863","display_name":"Wolfgang G. M\u00fcller","orcid":"https://orcid.org/0000-0002-4980-3512"},"institutions":[{"id":"https://openalex.org/I4210152224","display_name":"Heinz Nixdorf Stiftung","ror":"https://ror.org/04j2tkk21","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I4210152224"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Muller","raw_affiliation_strings":["Heinz Nixdorf Institute, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heinz Nixdorf Institute, Paderborn, Germany","institution_ids":["https://openalex.org/I4210152224"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042898125","display_name":"J. Christoph Scheytt","orcid":"https://orcid.org/0000-0002-5950-6618"},"institutions":[{"id":"https://openalex.org/I4210152224","display_name":"Heinz Nixdorf Stiftung","ror":"https://ror.org/04j2tkk21","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I4210152224"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Christoph Scheytt","raw_affiliation_strings":["Heinz Nixdorf Institute, Paderborn, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Heinz Nixdorf Institute, Paderborn, Germany","institution_ids":["https://openalex.org/I4210152224"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046956677","display_name":"Wolfgang Ecker","orcid":"https://orcid.org/0000-0002-9362-8096"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wolfgang Ecker","raw_affiliation_strings":["Infineon Technologies AG, Munich, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Munich, Germany","institution_ids":["https://openalex.org/I137594350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5108954018"],"corresponding_institution_ids":["https://openalex.org/I4210152224"],"apc_list":null,"apc_paid":null,"fwci":0.2375,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.50375072,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"27","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7277844548225403},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6802504062652588},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6280403137207031},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.60402512550354},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5743407011032104},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.5683837532997131},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5475576519966125},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.49583134055137634},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4926915764808655},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.45300567150115967},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4315757751464844},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3715420365333557},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3169291317462921},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.271477609872818},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1372682750225067},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11703643202781677},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.11661916971206665},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09349799156188965}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7277844548225403},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6802504062652588},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6280403137207031},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.60402512550354},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5743407011032104},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.5683837532997131},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5475576519966125},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.49583134055137634},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4926915764808655},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.45300567150115967},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4315757751464844},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3715420365333557},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3169291317462921},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.271477609872818},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1372682750225067},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11703643202781677},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.11661916971206665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09349799156188965},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dtis.2018.8368549","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis.2018.8368549","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1993765721","https://openalex.org/W2041090186","https://openalex.org/W2088797164","https://openalex.org/W2109172132","https://openalex.org/W2143842308","https://openalex.org/W2256048450"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W3148663848","https://openalex.org/W2024194466","https://openalex.org/W2185394135","https://openalex.org/W2742111403","https://openalex.org/W2082366402","https://openalex.org/W2566529656","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W4210447066"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"approach":[4],"for":[5,67,90],"analog":[6],"fault":[7,14,19,29,40,47,72,86,92],"effect":[8,93],"simulation":[9,32,87,94],"automation":[10],"based":[11,33],"on":[12,34],"random":[13,39],"selection":[15,41],"with":[16,56,77],"a":[17,57],"high":[18],"coverage":[20],"of":[21,28,45,49,62,70],"the":[22,43,46,54,68,71],"circuit":[23,55],"under":[24],"test":[25],"by":[26],"means":[27,89],"injection":[30],"and":[31,85],"advanced":[35],"sampling":[36],"techniques.":[37],"The":[38],"utilizes":[42],"likelihood":[44,83],"occurrence":[48],"different":[50,63],"electrical":[51],"components":[52],"in":[53],"confidence":[58],"level.":[59],"Defect":[60],"models":[61],"devices":[64],"are":[65],"analyzed":[66],"calculation":[69,84],"probability.":[73],"A":[74],"case":[75],"study":[76],"our":[78],"implemented":[79],"tool":[80],"demonstrates":[81],"that":[82],"provides":[88],"efficient":[91],"automation.":[95]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2026-04-29T09:16:38.111599","created_date":"2025-10-10T00:00:00"}