{"id":"https://openalex.org/W1580932775","doi":"https://doi.org/10.1109/dtis.2015.7127361","title":"Supply voltage variation impact on Anderson PUF quality","display_name":"Supply voltage variation impact on Anderson PUF quality","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1580932775","doi":"https://doi.org/10.1109/dtis.2015.7127361","mag":"1580932775"},"language":"en","primary_location":{"id":"doi:10.1109/dtis.2015.7127361","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis.2015.7127361","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040622270","display_name":"Mario Barbareschi","orcid":"https://orcid.org/0000-0002-1417-6328"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mario Barbareschi","raw_affiliation_strings":["DIETI-Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","DIETI - Department of Electrical Engineering and Information Technology, University of Naples 'Federico II', Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIETI-Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"DIETI - Department of Electrical Engineering and Information Technology, University of Naples 'Federico II', Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070192008","display_name":"Pierpaolo Bagnasco","orcid":null},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Pierpaolo Bagnasco","raw_affiliation_strings":["DIETI-Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","DIETI - Department of Electrical Engineering and Information Technology, University of Naples 'Federico II', Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIETI-Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"DIETI - Department of Electrical Engineering and Information Technology, University of Naples 'Federico II', Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088599156","display_name":"Antonino Mazzeo","orcid":"https://orcid.org/0000-0002-4404-7738"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonino Mazzeo","raw_affiliation_strings":["DIETI-Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","DIETI - Department of Electrical Engineering and Information Technology, University of Naples 'Federico II', Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"DIETI-Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"DIETI - Department of Electrical Engineering and Information Technology, University of Naples 'Federico II', Italy","institution_ids":["https://openalex.org/I71267560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I71267560"],"apc_list":null,"apc_paid":null,"fwci":1.4287,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.79679562,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"17","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12859","display_name":"Cell Image Analysis Techniques","score":0.9424999952316284,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.8689752817153931},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7526552677154541},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6523451805114746},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5763238072395325},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5626304149627686},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5600113272666931},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.5435812473297119},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5317351222038269},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45333510637283325},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.42104238271713257},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39673560857772827},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3943779468536377},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3436357080936432},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.298763632774353},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.2977107763290405},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2861277759075165},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.23365172743797302},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12009537220001221},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10828477144241333},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.09818831086158752}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.8689752817153931},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7526552677154541},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6523451805114746},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5763238072395325},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5626304149627686},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5600113272666931},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.5435812473297119},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5317351222038269},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45333510637283325},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42104238271713257},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39673560857772827},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3943779468536377},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3436357080936432},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.298763632774353},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.2977107763290405},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2861277759075165},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.23365172743797302},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12009537220001221},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10828477144241333},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.09818831086158752},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dtis.2015.7127361","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis.2015.7127361","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W42545666","https://openalex.org/W1607844737","https://openalex.org/W1983082199","https://openalex.org/W1990512559","https://openalex.org/W1993415821","https://openalex.org/W1995871244","https://openalex.org/W2000171858","https://openalex.org/W2016333076","https://openalex.org/W2084106057","https://openalex.org/W2088630761","https://openalex.org/W2106409910","https://openalex.org/W2112995947","https://openalex.org/W2116374153","https://openalex.org/W2123482651","https://openalex.org/W2130351941","https://openalex.org/W2144021107","https://openalex.org/W2148330234","https://openalex.org/W2151759197","https://openalex.org/W2169212403","https://openalex.org/W2570008916","https://openalex.org/W3145722221","https://openalex.org/W6675797392","https://openalex.org/W6676995458"],"related_works":["https://openalex.org/W4292862360","https://openalex.org/W3094096662","https://openalex.org/W3083074270","https://openalex.org/W2896245892","https://openalex.org/W2910831494","https://openalex.org/W3081452067","https://openalex.org/W4386278306","https://openalex.org/W2325849214","https://openalex.org/W2056383781","https://openalex.org/W2144973015"],"abstract_inverted_index":{"Physically":[0],"Unclonable":[1],"Function":[2],"(PUF)":[3],"is":[4,33,71,97,149],"a":[5,18,69,72],"promising":[6],"technique":[7],"to":[8,46,63,99,151],"enhance":[9],"the":[10,28,66,89,100,121,124,128,133,145,154],"security":[11],"of":[12,27,78,123,156],"Integrated":[13],"Circuits":[14],"(ICs)":[15],"by":[16],"providing":[17],"challenge/response":[19],"pairs":[20],"(CRPs)":[21],"set,":[22],"generated":[23],"from":[24],"physical":[25],"properties":[26],"device":[29],"in":[30,116],"which":[31,74,110],"it":[32],"embedded.":[34],"Indeed":[35],"PUFs":[36,57,93,101],"exploit":[37],"small":[38],"random":[39],"manufacturing":[40],"process":[41,73],"variations,":[42],"mainly":[43],"measuring":[44],"delays,":[45],"extract":[47],"responses,":[48],"such":[49,81],"that":[50,144],"they":[51],"are":[52,58],"unique":[53],"and":[54,84],"unclonable.":[55],"Since":[56],"not":[59],"deterministic":[60],"circuits":[61],"until":[62],"their":[64],"realization,":[65],"test":[67],"for":[68,92],"PUF":[70,158],"involves":[75],"statistical":[76],"evaluation":[77],"some":[79],"features,":[80],"as":[82],"uniformity":[83],"reliability.":[85],"The":[86,95],"former":[87],"measures":[88],"bits":[90],"biasing":[91],"responses.":[94,159],"latter":[96],"related":[98],"robustness":[102],"against":[103],"external":[104],"uncontrolled":[105],"disturbances":[106],"(e.g.":[107],"voltage":[108,125,147],"variations),":[109],"could":[111],"affect":[112],"responses":[113],"stability.":[114],"Therefore,":[115],"this":[117],"paper,":[118],"we":[119,142],"demonstrate":[120],"impact":[122],"variation":[126],"on":[127,132],"Anderson":[129,157],"PUF,":[130],"implemented":[131],"Xilinx":[134],"Spartan-3E":[135],"family.":[136],"In":[137],"particular,":[138],"through":[139],"experimental":[140],"results,":[141],"show":[143],"supplied":[146],"value":[148],"able":[150],"dramatically":[152],"change":[153],"quality":[155]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}