{"id":"https://openalex.org/W1970189834","doi":"https://doi.org/10.1109/dtis.2014.6850663","title":"Stuck-at fault diagnosis in scan chains","display_name":"Stuck-at fault diagnosis in scan chains","publication_year":2014,"publication_date":"2014-05-01","ids":{"openalex":"https://openalex.org/W1970189834","doi":"https://doi.org/10.1109/dtis.2014.6850663","mag":"1970189834"},"language":"en","primary_location":{"id":"doi:10.1109/dtis.2014.6850663","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis.2014.6850663","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004659863","display_name":"Helen-Maria Dounavi","orcid":"https://orcid.org/0000-0002-6293-9860"},"institutions":[{"id":"https://openalex.org/I194019607","display_name":"University of Ioannina","ror":"https://ror.org/01qg3j183","country_code":"GR","type":"education","lineage":["https://openalex.org/I194019607"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"Helen-Maria Dounavi","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Ioannina, Greece","Dept. of Computer Science and Engineering, University of Ioannina, Ioannina, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Ioannina, Greece","institution_ids":["https://openalex.org/I194019607"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, University of Ioannina, Ioannina, Greece","institution_ids":["https://openalex.org/I194019607"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036684985","display_name":"Yiorgos Tsiatouhas","orcid":"https://orcid.org/0000-0001-8408-6929"},"institutions":[{"id":"https://openalex.org/I194019607","display_name":"University of Ioannina","ror":"https://ror.org/01qg3j183","country_code":"GR","type":"education","lineage":["https://openalex.org/I194019607"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Yiorgos Tsiatouhas","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Ioannina, Greece","Dept. of Computer Science and Engineering, University of Ioannina, Ioannina, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Ioannina, Greece","institution_ids":["https://openalex.org/I194019607"]},{"raw_affiliation_string":"Dept. of Computer Science and Engineering, University of Ioannina, Ioannina, Greece","institution_ids":["https://openalex.org/I194019607"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5004659863"],"corresponding_institution_ids":["https://openalex.org/I194019607"],"apc_list":null,"apc_paid":null,"fwci":0.8315441,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.74744661,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.9070243835449219},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5849330425262451},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5319481492042542},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.5298837423324585},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5260978937149048},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.49947476387023926},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.45698195695877075},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.43677783012390137},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4297768771648407},{"id":"https://openalex.org/keywords/chain","display_name":"Chain (unit)","score":0.42477360367774963},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.375455766916275},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.35907503962516785},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.33730095624923706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24581217765808105},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2003854215145111},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.17083075642585754},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.15256932377815247},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09701251983642578}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.9070243835449219},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5849330425262451},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5319481492042542},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5298837423324585},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5260978937149048},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.49947476387023926},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.45698195695877075},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.43677783012390137},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4297768771648407},{"id":"https://openalex.org/C199185054","wikidata":"https://www.wikidata.org/wiki/Q552299","display_name":"Chain (unit)","level":2,"score":0.42477360367774963},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.375455766916275},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.35907503962516785},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.33730095624923706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24581217765808105},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2003854215145111},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.17083075642585754},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.15256932377815247},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09701251983642578},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dtis.2014.6850663","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dtis.2014.6850663","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1835662651","https://openalex.org/W2078241810","https://openalex.org/W2102485710","https://openalex.org/W2106686637","https://openalex.org/W2108361034","https://openalex.org/W2110731889","https://openalex.org/W2113382110","https://openalex.org/W2119521982","https://openalex.org/W2139664386","https://openalex.org/W2142044095","https://openalex.org/W2143236598","https://openalex.org/W2149546205","https://openalex.org/W2153853156","https://openalex.org/W2157200201","https://openalex.org/W2168662307","https://openalex.org/W2170538292","https://openalex.org/W3014325818","https://openalex.org/W4244295872","https://openalex.org/W6675422323","https://openalex.org/W6681170928","https://openalex.org/W6681421431","https://openalex.org/W6685022266"],"related_works":["https://openalex.org/W2117171289","https://openalex.org/W1852363244","https://openalex.org/W2127184179","https://openalex.org/W2364150359","https://openalex.org/W1974621628","https://openalex.org/W2075356617","https://openalex.org/W1501621551","https://openalex.org/W2118952760","https://openalex.org/W2157726388","https://openalex.org/W2543176856"],"abstract_inverted_index":{"Scan":[0],"chain":[1,36],"diagnosis":[2,43,56],"turns":[3],"out":[4],"to":[5,18],"be":[6],"an":[7],"important":[8],"yield":[9],"enhancement":[10],"factor":[11],"in":[12],"modern":[13],"nanometer":[14],"technologies.":[15],"An":[16],"easy":[17],"implement":[19],"and":[20,38,58],"cost":[21],"effective":[22],"design-for-diagnosis":[23],"technique":[24,29],"is":[25,30],"presented.":[26],"The":[27],"proposed":[28],"compatible":[31],"with":[32],"the":[33,46,67,70],"standard":[34],"scan":[35,71],"architecture":[37],"provides":[39],"fast":[40],"stuck-at":[41],"fault":[42],"capabilities,":[44],"at":[45,66],"maximum":[47],"resolution,":[48],"through":[49],"simple":[50],"operations,":[51],"using":[52],"only":[53],"four":[54],"predefined":[55],"vectors":[57],"independently":[59],"of":[60,69],"any":[61],"test":[62],"response":[63],"compaction":[64],"circuitry":[65],"outputs":[68],"chains.":[72]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}