{"id":"https://openalex.org/W1996109429","doi":"https://doi.org/10.1109/dsnw.2010.5542612","title":"Massive statistical process variations: A grand challenge for testing nanoelectronic circuits","display_name":"Massive statistical process variations: A grand challenge for testing nanoelectronic circuits","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W1996109429","doi":"https://doi.org/10.1109/dsnw.2010.5542612","mag":"1996109429"},"language":"en","primary_location":{"id":"doi:10.1109/dsnw.2010.5542612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsnw.2010.5542612","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Dependable Systems and Networks Workshops (DSN-W)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[{"id":"https://openalex.org/I161046081","display_name":"University of Freiburg","ror":"https://ror.org/0245cg223","country_code":"DE","type":"education","lineage":["https://openalex.org/I161046081"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Becker","raw_affiliation_strings":["University of Freiburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Freiburg, Germany","institution_ids":["https://openalex.org/I161046081"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051549317","display_name":"Sybille Hellebrand","orcid":"https://orcid.org/0000-0002-3717-3939"},"institutions":[{"id":"https://openalex.org/I206945453","display_name":"Paderborn University","ror":"https://ror.org/058kzsd48","country_code":"DE","type":"education","lineage":["https://openalex.org/I206945453"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"S. Hellebrand","raw_affiliation_strings":["University of Paderborn, Germany","[University of Paderborn., Germany]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Paderborn, Germany","institution_ids":["https://openalex.org/I206945453"]},{"raw_affiliation_string":"[University of Paderborn., Germany]","institution_ids":["https://openalex.org/I206945453"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027416202","display_name":"Ilia Polian","orcid":"https://orcid.org/0000-0002-6563-2725"},"institutions":[{"id":"https://openalex.org/I186354981","display_name":"University of Passau","ror":"https://ror.org/05ydjnb78","country_code":"DE","type":"education","lineage":["https://openalex.org/I186354981"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"I. Polian","raw_affiliation_strings":["University of Passau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Passau, Germany","institution_ids":["https://openalex.org/I186354981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023592285","display_name":"Bernd Straube","orcid":null},"institutions":[{"id":"https://openalex.org/I4210095661","display_name":"Fraunhofer Institute for Integrated Circuits IIS, Division Engineering of Adaptive Systems EAS","ror":"https://ror.org/00s5yp124","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210095661","https://openalex.org/I4210124274","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Straube","raw_affiliation_strings":["Fraunhofer IIS/EAS, Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer IIS/EAS, Dresden, Germany","institution_ids":["https://openalex.org/I4210095661"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032947853","display_name":"Wolfgang Vermeiren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210095661","display_name":"Fraunhofer Institute for Integrated Circuits IIS, Division Engineering of Adaptive Systems EAS","ror":"https://ror.org/00s5yp124","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210095661","https://openalex.org/I4210124274","https://openalex.org/I4923324"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Vermeiren","raw_affiliation_strings":["Fraunhofer IIS/EAS, Dresden, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fraunhofer IIS/EAS, Dresden, Germany","institution_ids":["https://openalex.org/I4210095661"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H.-J. Wunderlich","raw_affiliation_strings":["University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":null,"first_page":"95","last_page":"100"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8567430377006531},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.7629777193069458},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6217183470726013},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5634523034095764},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5157130360603333},{"id":"https://openalex.org/keywords/statistical-hypothesis-testing","display_name":"Statistical hypothesis testing","score":0.43692609667778015},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.35546284914016724},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3479195833206177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19305303692817688},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14130744338035583},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13138526678085327},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09856435656547546}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8567430377006531},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.7629777193069458},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6217183470726013},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5634523034095764},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5157130360603333},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.43692609667778015},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.35546284914016724},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3479195833206177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19305303692817688},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14130744338035583},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13138526678085327},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09856435656547546},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/dsnw.2010.5542612","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsnw.2010.5542612","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Dependable Systems and Networks Workshops (DSN-W)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.177.7650","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.177.7650","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ra.informatik.uni-stuttgart.de/research/publications/papers/conferences/2010/WDSN_BeckerHPSVW2010.pdf","raw_type":"text"},{"id":"pmh:oai:fraunhofer.de:N-140763","is_oa":false,"landing_page_url":"http://publica.fraunhofer.de/documents/N-140763.html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400801","display_name":"Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Fraunhofer EAS","raw_type":"Conference Paper"},{"id":"pmh:oai:informatik.uni-stuttgart.de:INPROC-2010-88","is_oa":false,"landing_page_url":"http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=INPROC-2010-88&engl=1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401306","display_name":"Fachbereich Informatik (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"\\n In: IEEE Computer Society, IFIP (ed.): 4th Workshop on Dependable\\n and Secure Nanocomputing (WDSN10), Chicago, IL, USA, June 28 - July\\n 01, 2010, pp. 95-100\\n","raw_type":"Text"},{"id":"pmh:oai:publica.fraunhofer.de:publica/366970","is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/366970","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"conference paper"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W612784192","https://openalex.org/W1539326816","https://openalex.org/W1549605189","https://openalex.org/W1906369229","https://openalex.org/W1937706874","https://openalex.org/W1990971075","https://openalex.org/W2005319125","https://openalex.org/W2019046117","https://openalex.org/W2035194793","https://openalex.org/W2043318181","https://openalex.org/W2087360016","https://openalex.org/W2098695358","https://openalex.org/W2105053010","https://openalex.org/W2112892895","https://openalex.org/W2125169487","https://openalex.org/W2128456472","https://openalex.org/W2145124910","https://openalex.org/W2146056662","https://openalex.org/W2151628041","https://openalex.org/W2152652532","https://openalex.org/W2156640787","https://openalex.org/W2156749158","https://openalex.org/W2159006760","https://openalex.org/W2160168386","https://openalex.org/W2163094833","https://openalex.org/W2169468177","https://openalex.org/W2171106257","https://openalex.org/W3147093959","https://openalex.org/W4299639710","https://openalex.org/W6651787432","https://openalex.org/W7045374924"],"related_works":["https://openalex.org/W2770593030","https://openalex.org/W3154990682","https://openalex.org/W2560201613","https://openalex.org/W2171975302","https://openalex.org/W2022352247","https://openalex.org/W4312219546","https://openalex.org/W2377538627","https://openalex.org/W2107220315","https://openalex.org/W2154044472","https://openalex.org/W4210772589"],"abstract_inverted_index":{"Increasing":[0],"parameter":[1,59],"variations,":[2],"high":[3],"defect":[4],"densities":[5],"and":[6,39,42,119,126],"a":[7,19,77],"growing":[8],"susceptibility":[9],"to":[10,18,63,123],"external":[11],"noise":[12],"in":[13,22,88,104],"nanoscale":[14],"technologies":[15],"have":[16,33,46],"led":[17],"paradigm":[20],"shift":[21],"design.":[23],"Classical":[24],"design":[25],"strategies":[26],"based":[27],"on":[28],"worst-case":[29],"or":[30,67],"average":[31],"assumptions":[32],"been":[34,47],"replaced":[35],"by":[36],"statistical":[37,117],"design,":[38],"new":[40],"robust":[41,75],"variation":[43],"tolerant":[44],"architectures":[45],"developed.":[48],"At":[49],"the":[50,69,85,89,97,108],"same":[51],"time":[52],"testing":[53,101,118],"has":[54],"become":[55],"extremely":[56],"challenging,":[57],"as":[58],"variations":[60],"may":[61],"lead":[62],"an":[64],"unacceptable":[65],"behavior":[66],"change":[68],"impact":[70],"of":[71,91,110],"defects.":[72,93],"Furthermore,":[73],"for":[74,100,116],"designs":[76],"precise":[78],"quality":[79,127],"assessment":[80],"is":[81],"required":[82],"particularly":[83],"showing":[84],"remaining":[86],"robustness":[87,124],"presence":[90],"manufacturing":[92],"The":[94],"paper":[95],"pinpoints":[96],"key":[98],"challenges":[99],"nanoelectronic":[102],"circuits":[103],"more":[105],"detail,":[106],"covering":[107],"range":[109],"variation-aware":[111],"fault":[112],"modeling":[113],"via":[114],"methods":[115],"their":[120],"algorithmic":[121],"foundations":[122],"analysis":[125],"binning.":[128]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-19T07:52:34.831488","created_date":"2025-10-10T00:00:00"}