{"id":"https://openalex.org/W2000229178","doi":"https://doi.org/10.1109/dsnw.2010.5542611","title":"Verification of soft error detection mechanism through fault injection on hardware emulation platform","display_name":"Verification of soft error detection mechanism through fault injection on hardware emulation platform","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W2000229178","doi":"https://doi.org/10.1109/dsnw.2010.5542611","mag":"2000229178"},"language":"en","primary_location":{"id":"doi:10.1109/dsnw.2010.5542611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsnw.2010.5542611","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Dependable Systems and Networks Workshops (DSN-W)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077039031","display_name":"Oscar Bailan","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Oscar Bailan","raw_affiliation_strings":["STMicroelectronics, Crolles, FR","STMicroelectronics Via Olivetti 2, 20041 Agrate Brianza (MI), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, FR","institution_ids":[]},{"raw_affiliation_string":"STMicroelectronics Via Olivetti 2, 20041 Agrate Brianza (MI), Italy","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003492426","display_name":"U. Rossi","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"Umberto Rossi","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza, MI, Italy","STMicroelectronics Via Olivetti 2, 20041 Agrate Brianza (MI), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza, MI, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics Via Olivetti 2, 20041 Agrate Brianza (MI), Italy","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006539790","display_name":"Anne Wantens","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Anne Wantens","raw_affiliation_strings":["STMicroelectronics, Grenoble, France","STMicroelectronics, 12 Rue Jules Horowitz, BP217, F-38019, Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Grenoble, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, 12 Rue Jules Horowitz, BP217, F-38019, Grenoble, France","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113426457","display_name":"Jean-Marc Daveau","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Jean-Marc Daveau","raw_affiliation_strings":["STMicroelectronics, Crolles, France","STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles (France)","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058481534","display_name":"Salvatore Nappi","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"Salvatore Nappi","raw_affiliation_strings":["STMicroelectronics, Arzano, NA, Italy","STMicroelectronics, Via Remo De Feo 1, 80022 Arzano, NA, Italy#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Arzano, NA, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Via Remo De Feo 1, 80022 Arzano, NA, Italy#TAB#","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111893673","display_name":"Philippe Roch\u00e9","orcid":null},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CH","FR"],"is_corresponding":false,"raw_author_name":"Philippe Roche","raw_affiliation_strings":["STMicroelectronics, Crolles, France","STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles (France)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, 850 rue Jean Monnet, F-38926 Crolles (France)","institution_ids":["https://openalex.org/I131827901"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8828,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.76396537,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"113","last_page":"118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8961533308029175},{"id":"https://openalex.org/keywords/emulation","display_name":"Emulation","score":0.8330413103103638},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.768226146697998},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7487418055534363},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7242771983146667},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.6708788871765137},{"id":"https://openalex.org/keywords/hardware-emulation","display_name":"Hardware emulation","score":0.49416735768318176},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.48535099625587463},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.4590439200401306},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4497883915901184},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33769309520721436},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.1824471354484558},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.15222769975662231},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1479252576828003},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.129917711019516},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12959599494934082}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8961533308029175},{"id":"https://openalex.org/C149810388","wikidata":"https://www.wikidata.org/wiki/Q5374873","display_name":"Emulation","level":2,"score":0.8330413103103638},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.768226146697998},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7487418055534363},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7242771983146667},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6708788871765137},{"id":"https://openalex.org/C94115699","wikidata":"https://www.wikidata.org/wiki/Q5656406","display_name":"Hardware emulation","level":3,"score":0.49416735768318176},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.48535099625587463},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.4590439200401306},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4497883915901184},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33769309520721436},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.1824471354484558},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.15222769975662231},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1479252576828003},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.129917711019516},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12959599494934082},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dsnw.2010.5542611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsnw.2010.5542611","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 International Conference on Dependable Systems and Networks Workshops (DSN-W)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1511368807","https://openalex.org/W1583619271","https://openalex.org/W2043980216","https://openalex.org/W2096927458","https://openalex.org/W2113810691","https://openalex.org/W2129221221","https://openalex.org/W2168650271","https://openalex.org/W2169213530","https://openalex.org/W2180180647","https://openalex.org/W2751555667","https://openalex.org/W3149134903","https://openalex.org/W4285719527","https://openalex.org/W6679652618","https://openalex.org/W6684499457","https://openalex.org/W7020061393"],"related_works":["https://openalex.org/W627911969","https://openalex.org/W2895000685","https://openalex.org/W2171823768","https://openalex.org/W2158426656","https://openalex.org/W1553526993","https://openalex.org/W3000684636","https://openalex.org/W2783794963","https://openalex.org/W140071659","https://openalex.org/W2175282463","https://openalex.org/W2018865800"],"abstract_inverted_index":{"In":[0,66],"this":[1,67],"paper":[2],"we":[3,69,137],"describe":[4],"one":[5,34],"of":[6,26,33,35,39,48,54,58,73,86,103,117,124,131,151],"the":[7,23,31,36,40,46,55,59,71,74,79,84,92,101,111,122,129,140,152],"verification":[8],"activities":[9],"performed":[10],"on":[11,156,159],"a":[12,27,125,132,157],"dual":[13],"core":[14],"32-bit":[15],"System-on-Chip":[16],"designed":[17,62],"for":[18,63],"Automotive":[19],"Safety":[20,43],"applications":[21],"and":[22],"consequent":[24],"implementation":[25],"methodology":[28,126,142],"to":[29,51,78,99,127,134,147],"verify":[30,128],"functionality":[32],"safety":[37],"mechanisms":[38],"device.":[41],"The":[42,114],"standards":[44],"recommend":[45],"usage":[47,85],"fault-injection":[49],"techniques":[50],"give":[52],"evidence":[53],"failure":[56],"robustness":[57,72,130],"electronic":[60],"devices":[61],"Functional":[64],"Safety.":[65],"case":[68],"verified":[70],"SoC":[75,133],"processing":[76],"subsystem":[77],"Single":[80],"Event":[81],"Upset":[82],"through":[83],"some":[87],"hardware":[88],"emulation":[89],"platforms":[90],"where":[91],"device":[93],"RTL":[94],"was":[95],"mapped,":[96],"properly":[97],"instrumented":[98],"allow":[100],"modification":[102],"Flip-Flop":[104],"status":[105],"during":[106],"application":[107],"runtime,":[108],"thus":[109],"modeling":[110],"SEUs":[112],"effects.":[113],"main":[115],"novelty":[116],"our":[118],"work":[119],"is":[120],"therefore":[121],"definition":[123],"SEUs;":[135],"additionally":[136],"show":[138],"that":[139],"same":[141],"can":[143],"be":[144],"used":[145],"also":[146],"perform":[148],"thorough":[149],"measurements":[150],"SER":[153],"masking":[154],"effect":[155],"System":[158],"Chip.":[160]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}