{"id":"https://openalex.org/W2105058680","doi":"https://doi.org/10.1109/dsn.2010.5544916","title":"WearMon: Reliability monitoring using adaptive critical path testing","display_name":"WearMon: Reliability monitoring using adaptive critical path testing","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W2105058680","doi":"https://doi.org/10.1109/dsn.2010.5544916","mag":"2105058680"},"language":"en","primary_location":{"id":"doi:10.1109/dsn.2010.5544916","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2010.5544916","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016919162","display_name":"Bardia Zandian","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Bardia Zandian","raw_affiliation_strings":["Electrical Engineering Department, University of Southern California, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004073554","display_name":"Waleed Dweik","orcid":"https://orcid.org/0000-0002-6109-7366"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Waleed Dweik","raw_affiliation_strings":["Electrical Engineering Department, University of Southern California, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113660801","display_name":"Suk Hun Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suk Hun Kang","raw_affiliation_strings":["Electrical Engineering Department, University of Southern California, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005682641","display_name":"Thomas Punihaole","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas Punihaole","raw_affiliation_strings":["Electrical Engineering Department, University of Southern California, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018033573","display_name":"Murali Annavaram","orcid":"https://orcid.org/0000-0002-4633-6867"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Murali Annavaram","raw_affiliation_strings":["Electrical Engineering Department, University of Southern California, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, University of Southern California, USA","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5016919162"],"corresponding_institution_ids":["https://openalex.org/I1174212"],"apc_list":null,"apc_paid":null,"fwci":2.0215,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.87815087,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"28","issue":null,"first_page":"151","last_page":"160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7256134748458862},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.5893194079399109},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5699461698532104},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5060328841209412},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.5000360012054443},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.484454870223999},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.45517662167549133},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4547925591468811},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43850433826446533},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.42559078335762024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16250330209732056},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1391613483428955}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7256134748458862},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.5893194079399109},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5699461698532104},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5060328841209412},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.5000360012054443},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.484454870223999},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.45517662167549133},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4547925591468811},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43850433826446533},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.42559078335762024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16250330209732056},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1391613483428955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dsn.2010.5544916","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2010.5544916","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W147650083","https://openalex.org/W1973248777","https://openalex.org/W1991891926","https://openalex.org/W2091207883","https://openalex.org/W2098540801","https://openalex.org/W2102727118","https://openalex.org/W2104114347","https://openalex.org/W2104225326","https://openalex.org/W2104677471","https://openalex.org/W2114172921","https://openalex.org/W2117648153","https://openalex.org/W2121319784","https://openalex.org/W2125169487","https://openalex.org/W2127036509","https://openalex.org/W2135123845","https://openalex.org/W2139423216","https://openalex.org/W2141565132","https://openalex.org/W2143555489","https://openalex.org/W2151845324","https://openalex.org/W2154857344","https://openalex.org/W2155581886","https://openalex.org/W2159889776","https://openalex.org/W2164004001","https://openalex.org/W2165071510","https://openalex.org/W2167678606","https://openalex.org/W4231523873","https://openalex.org/W4236432903","https://openalex.org/W4239012550","https://openalex.org/W4248445118","https://openalex.org/W6605987033","https://openalex.org/W6643513670","https://openalex.org/W6674231407"],"related_works":["https://openalex.org/W4287963496","https://openalex.org/W4212997197","https://openalex.org/W3083648202","https://openalex.org/W4311875539","https://openalex.org/W2348667266","https://openalex.org/W2387129944","https://openalex.org/W2082942625","https://openalex.org/W2115873477","https://openalex.org/W2097054871","https://openalex.org/W2396089989"],"abstract_inverted_index":{"As":[0],"processor":[1],"reliability":[2,18],"becomes":[3],"a":[4,13,45,132],"first":[5],"order":[6],"design":[7],"constraint,":[8],"this":[9],"research":[10],"argues":[11],"for":[12],"need":[14],"to":[15,125],"provide":[16],"continuous":[17],"monitoring.":[19,100],"We":[20],"present":[21],"WearMon,":[22],"an":[23],"adaptive":[24],"critical":[25,48],"path":[26],"monitoring":[27,79,111],"architecture":[28,80],"which":[29,94],"provides":[30],"accurate":[31],"and":[32,58,85,97],"real-time":[33],"measure":[34],"of":[35,47,65,75,90,99],"the":[36,51,55,66,109],"processor's":[37],"timing":[38,73],"margin":[39,74],"degradation.":[40],"Special":[41],"test":[42,69,92],"patterns":[43],"check":[44],"set":[46],"paths":[49,60],"in":[50,62],"circuit-under-test.":[52],"By":[53],"activating":[54],"actual":[56],"devices":[57],"signal":[59],"used":[61],"normal":[63],"operation":[64],"chip,":[67],"each":[68],"will":[70],"capture":[71],"up-to-date":[72],"these":[76],"paths.":[77],"The":[78],"dynamically":[81],"adapts":[82],"testing":[83],"interval":[84],"complexity":[86],"based":[87,103],"on":[88,104],"analysis":[89],"prior":[91],"results,":[93],"increases":[95],"efficiency":[96],"accuracy":[98],"Experimental":[101],"results":[102],"FPGA":[105],"implementation":[106],"show":[107],"that":[108],"proposed":[110],"unit":[112,133],"can":[113,122],"be":[114,123],"easily":[115],"integrated":[116],"into":[117],"existing":[118],"designs.":[119],"Monitoring":[120],"overhead":[121],"reduced":[124],"zero":[126],"by":[127],"scheduling":[128],"tests":[129],"only":[130],"when":[131],"is":[134],"idle.":[135]},"counts_by_year":[{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}