{"id":"https://openalex.org/W2148644350","doi":"https://doi.org/10.1109/dsn.2010.5544276","title":"Transient fault models and AVF estimation revisited","display_name":"Transient fault models and AVF estimation revisited","publication_year":2010,"publication_date":"2010-06-01","ids":{"openalex":"https://openalex.org/W2148644350","doi":"https://doi.org/10.1109/dsn.2010.5544276","mag":"2148644350"},"language":"en","primary_location":{"id":"doi:10.1109/dsn.2010.5544276","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2010.5544276","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076677895","display_name":"Nisha George","orcid":"https://orcid.org/0000-0003-2929-7197"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Nisha George","raw_affiliation_strings":["Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA"],"affiliations":[{"raw_affiliation_string":"Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA","institution_ids":["https://openalex.org/I51556381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013018807","display_name":"Carl Elks","orcid":"https://orcid.org/0000-0001-5315-2698"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carl R. Elks","raw_affiliation_strings":["Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA"],"affiliations":[{"raw_affiliation_string":"Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA","institution_ids":["https://openalex.org/I51556381"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047081697","display_name":"B.W. Johnson","orcid":"https://orcid.org/0000-0003-2849-2126"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Barry W. Johnson","raw_affiliation_strings":["Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA"],"affiliations":[{"raw_affiliation_string":"Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA","institution_ids":["https://openalex.org/I51556381"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079544668","display_name":"John Lach","orcid":"https://orcid.org/0000-0002-7105-9996"},"institutions":[{"id":"https://openalex.org/I51556381","display_name":"University of Virginia","ror":"https://ror.org/0153tk833","country_code":"US","type":"education","lineage":["https://openalex.org/I51556381"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John Lach","raw_affiliation_strings":["Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA"],"affiliations":[{"raw_affiliation_string":"Charles L. Brown Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA, USA","institution_ids":["https://openalex.org/I51556381"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5076677895"],"corresponding_institution_ids":["https://openalex.org/I51556381"],"apc_list":null,"apc_paid":null,"fwci":3.7523,"has_fulltext":false,"cited_by_count":75,"citation_normalized_percentile":{"value":0.93635954,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7856977581977844},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7572940587997437},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6774045825004578},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.617905855178833},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6174114942550659},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.575215220451355},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5622297525405884},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5490317344665527},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.4724721610546112},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4657265543937683},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.456174373626709},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3748132884502411},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30254805088043213},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28580915927886963},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.20151183009147644},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13171181082725525},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.10111254453659058},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07576236128807068},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07341831922531128}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7856977581977844},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7572940587997437},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6774045825004578},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.617905855178833},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6174114942550659},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.575215220451355},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5622297525405884},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5490317344665527},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.4724721610546112},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4657265543937683},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.456174373626709},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3748132884502411},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30254805088043213},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28580915927886963},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.20151183009147644},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13171181082725525},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.10111254453659058},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07576236128807068},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07341831922531128},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/dsn.2010.5544276","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2010.5544276","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1978783977","https://openalex.org/W2007925061","https://openalex.org/W2026329473","https://openalex.org/W2085924338","https://openalex.org/W2109341366","https://openalex.org/W2113167168","https://openalex.org/W2119599601","https://openalex.org/W2127745296","https://openalex.org/W2147343854","https://openalex.org/W2167435539","https://openalex.org/W2171065098","https://openalex.org/W2546044294","https://openalex.org/W4232751114","https://openalex.org/W4232837724","https://openalex.org/W4244652158","https://openalex.org/W4249144718","https://openalex.org/W6684475336"],"related_works":["https://openalex.org/W1500230652","https://openalex.org/W4290647047","https://openalex.org/W2044069930","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256","https://openalex.org/W4386933833"],"abstract_inverted_index":{"Transient":[0],"faults":[1],"(also":[2],"known":[3],"as":[4,16],"soft-errors)":[5],"resulting":[6,51],"from":[7,52],"high-energy":[8],"particle":[9,54],"strikes":[10],"on":[11,35],"silicon":[12],"are":[13,61],"typically":[14],"modeled":[15],"single":[17,53],"bit-flips":[18],"in":[19,113],"memory":[20,39],"arrays.":[21],"Most":[22],"Architectural":[23],"Vulnerability":[24],"Factor":[25],"(AVF)":[26],"analyses":[27],"assume":[28],"this":[29,57,75],"model.":[30,119],"However,":[31],"accelerated":[32],"radiation":[33],"tests":[34],"static":[36],"random":[37],"access":[38],"(SRAM)":[40],"arrays":[41,85],"built":[42],"using":[43,99],"modern":[44],"technologies":[45],"show":[46],"evidence":[47],"of":[48,70,83,115,131],"clustered":[49],"upsets":[50],"strikes.":[55],"In":[56],"paper,":[58],"these":[59],"observations":[60],"used":[62,108,125],"to":[63,86,109,126,137],"define":[64],"a":[65,77,100],"scalable":[66],"fault":[67,72,88,96,118,122],"model":[68],"capable":[69],"representing":[71],"multiplicities.":[73],"Applying":[74],"model,":[76],"probabilistic":[78],"framework":[79],"for":[80,139],"incorporating":[81],"vulnerability":[82,111,135],"SRAM":[84],"different":[87],"multiplicities":[89],"into":[90],"AVF":[91,132],"is":[92,124],"proposed.":[93],"An":[94],"experimental":[95],"injection":[97,123],"setup":[98],"detailed":[101],"microarchitecture":[102],"simulation":[103],"running":[104],"generic":[105],"benchmarks":[106],"was":[107],"demonstrate":[110,127],"characterization":[112],"light":[114],"the":[116],"new":[117],"Further,":[120],"rigorous":[121],"that":[128],"conventional":[129],"methods":[130],"estimation":[133],"overestimate":[134],"up":[136],"7\u00d7":[138],"some":[140],"structures.":[141]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":6},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":9},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}