{"id":"https://openalex.org/W2112648765","doi":"https://doi.org/10.1109/dsn.2008.4630067","title":"Trace-based microarchitecture-level diagnosis of permanent hardware faults","display_name":"Trace-based microarchitecture-level diagnosis of permanent hardware faults","publication_year":2008,"publication_date":"2008-01-01","ids":{"openalex":"https://openalex.org/W2112648765","doi":"https://doi.org/10.1109/dsn.2008.4630067","mag":"2112648765"},"language":"en","primary_location":{"id":"doi:10.1109/dsn.2008.4630067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2008.4630067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087543093","display_name":"Man-Lap Li","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Man-Lap Li","raw_affiliation_strings":["Department of Computer Science, University of Illinois at Urbana-Champaign, USA","Dept. of Comput. Sci., Illinois Univ., Champaign, IL"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois at Urbana-Champaign, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Illinois Univ., Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101419530","display_name":"Pradeep Ramachandran","orcid":"https://orcid.org/0000-0002-1844-609X"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pradeep Ramachandran","raw_affiliation_strings":["Department of Computer Science, University of Illinois at Urbana-Champaign","Dept. of Comput. Sci., Illinois Univ., Champaign, IL"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois at Urbana-Champaign","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Illinois Univ., Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108703515","display_name":"Swarup Kumar Sahoo","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Swarup K. Sahoo","raw_affiliation_strings":["Department of Computer Science, University of Illinois at Urbana-Champaign, USA","Dept. of Comput. Sci., Illinois Univ., Champaign, IL"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois at Urbana-Champaign, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Illinois Univ., Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086111967","display_name":"Sarita V. Adve","orcid":"https://orcid.org/0000-0002-3403-5119"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sarita V. Adve","raw_affiliation_strings":["Department of Computer Science, University of Illinois at Urbana-Champaign, USA","Dept. of Comput. Sci., Illinois Univ., Champaign, IL"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois at Urbana-Champaign, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Illinois Univ., Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059017058","display_name":"Vikram Adve","orcid":"https://orcid.org/0000-0002-0760-9690"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vikram S. Adve","raw_affiliation_strings":["Department of Computer Science, University of Illinois at Urbana-Champaign, USA","Dept. of Comput. Sci., Illinois Univ., Champaign, IL"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois at Urbana-Champaign, USA","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Illinois Univ., Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044337890","display_name":"Yuanyuan Zhou","orcid":"https://orcid.org/0000-0002-8703-219X"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuanyuan Zhou","raw_affiliation_strings":["Department of Computer Science, University of Illinois at Urbana-Champaign","Dept. of Comput. Sci., Illinois Univ., Champaign, IL"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, University of Illinois at Urbana-Champaign","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Illinois Univ., Champaign, IL","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5087543093"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":5.763,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.96136176,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"22","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7835252285003662},{"id":"https://openalex.org/keywords/trace","display_name":"TRACE (psycholinguistics)","score":0.7035604119300842},{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.7022784948348999},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6922615766525269},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6021127700805664},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5920335650444031},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4762956202030182},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4210626184940338},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08624303340911865},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.0831390917301178}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7835252285003662},{"id":"https://openalex.org/C75291252","wikidata":"https://www.wikidata.org/wiki/Q1315756","display_name":"TRACE (psycholinguistics)","level":2,"score":0.7035604119300842},{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.7022784948348999},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6922615766525269},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6021127700805664},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5920335650444031},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4762956202030182},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4210626184940338},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08624303340911865},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0831390917301178},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/dsn.2008.4630067","is_oa":false,"landing_page_url":"https://doi.org/10.1109/dsn.2008.4630067","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Conference on Dependable Systems and Networks With FTCS and DCC (DSN)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.146.5227","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.146.5227","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://rsim.cs.uiuc.edu/Pubs/08DSN-Li.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1891950198","https://openalex.org/W1965439782","https://openalex.org/W2088250010","https://openalex.org/W2100866260","https://openalex.org/W2101580666","https://openalex.org/W2105372251","https://openalex.org/W2108806129","https://openalex.org/W2115081151","https://openalex.org/W2119160628","https://openalex.org/W2128941141","https://openalex.org/W2129663982","https://openalex.org/W2130111591","https://openalex.org/W2139727248","https://openalex.org/W2147280888","https://openalex.org/W2147435261","https://openalex.org/W2151845324","https://openalex.org/W2155581886","https://openalex.org/W2156204788","https://openalex.org/W2162351670","https://openalex.org/W2163890539","https://openalex.org/W2164264749","https://openalex.org/W2758694497","https://openalex.org/W4240648505","https://openalex.org/W4246906397","https://openalex.org/W4248445118","https://openalex.org/W4248492382","https://openalex.org/W4249853476","https://openalex.org/W4252551062"],"related_works":["https://openalex.org/W2005635288","https://openalex.org/W1592982659","https://openalex.org/W2138574009","https://openalex.org/W2534461193","https://openalex.org/W2009873484","https://openalex.org/W2061122711","https://openalex.org/W4389500485","https://openalex.org/W2578404781","https://openalex.org/W2065965834","https://openalex.org/W2147932236"],"abstract_inverted_index":{"As":[0,16],"devices":[1],"continue":[2],"to":[3,12,30,45,134],"scale,":[4],"future":[5],"shipped":[6],"hardware":[7,14,19],"will":[8,26],"likely":[9],"fail":[10],"due":[11],"in-the-field":[13],"faults.":[15,163],"traditional":[17],"redundancy-based":[18],"reliability":[20,40],"solutions":[21],"that":[22,51,73,142],"tackle":[23],"these":[24],"faults":[25,76,150],"be":[27,31],"too":[28],"expensive":[29],"broadly":[32],"deployable,":[33],"recent":[34],"research":[35],"has":[36],"focused":[37],"on":[38,118],"low-overhead":[39,47],"solutions.":[41],"One":[42],"approach":[43,144],"is":[44,90,95,153],"employ":[46],"(\u201calways-on\u201d)":[48],"detection":[49],"techniques":[50],"catch":[52],"high-level":[53],"symptoms":[54],"and":[55,98,109,152,157],"pay":[56],"a":[57,70,88,101,105,124,154],"higher":[58],"overhead":[59],"for":[60,160],"(rarely":[61],"invoked)":[62],"diagnosis.":[63],"This":[64],"paper":[65],"presents":[66],"trace-based":[67],"fault":[68,89],"diagnosis,":[69],"diagnosis":[71,116],"strategy":[72],"identifies":[74],"permanent":[75,162],"in":[77],"microarchitectural":[78],"units":[79],"by":[80],"analyzing":[81],"the":[82,92,111,131,136,149],"faulty":[83,93,106,132,137],"core\u2019s":[84],"instruction":[85,107],"trace.":[86],"Once":[87],"detected,":[91],"core":[94,121],"rolled":[96],"back":[97],"re-executes":[99],"from":[100],"previous":[102],"checkpoint,":[103],"generating":[104],"trace":[108,126,133],"recording":[110],"microarchitecture-level":[112],"resource":[113],"usage.":[114],"A":[115],"process":[117],"another":[119],"fault-free":[120,125],"then":[122],"generates":[123],"which":[127],"it":[128],"compares":[129],"with":[130],"identify":[135],"unit.":[138],"Our":[139],"result":[140],"shows":[141],"this":[143],"successfully":[145],"diagnoses":[146],"98%":[147],"of":[148],"studied":[151],"highly":[155],"robust":[156],"flexible":[158],"way":[159],"diagnosing":[161]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":5}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}